Optical probe system for the electron microscope
An optical probe system and a microscope system. The optical probe system includes an optical probe with an optical probe shaft configured to extend at least partially into a vacuum chamber of a charged particle beam microscope. A first and second optical channel can extend through the optical probe shaft. The first optical channel accommodates a portion of a segmented optical axis, and the second optical channel accommodates an unsegmented optical axis. The segmented optical axis includes at least a first segment that substantially parallel to the unsegmented optical axis and at least a second segment that is not substantially parallel to the unsegmented optical axis, and the first segment of the segmented optical axis and the unsegmented optical axis are positioned within the optical probe shaft to permit the first optical channel and the second optical channel to simultaneously address a sample within the vacuum chamber.
1 . An optical probe system comprising:
an optical probe configured to be mounted to a charged particle beam microscope to permit an optical probe shaft of the optical probe to extend at least partially into a vacuum chamber of the charged particle beam microscope;
a first optical channel extending through the optical probe shaft, wherein the first optical channel accommodates a portion of a segmented optical axis extending between a distal end of the probe and an optical chassis providing a high magnification view of a sample; and
a second optical channel extending through the optical probe shaft, wherein the second optical channel accommodates an unsegmented optical axis extending between the distal end of the probe and an eyepiece or camera that provides a low magnification view of the sample, and wherein:
the segmented optical axis includes at least a first segment that is substantially parallel to the unsegmented optical axis and at least a second segment that is not substantially parallel to the unsegmented optical axis,
the first segment of the segmented optical axis and the unsegmented optical axis are positioned within the optical probe shaft to permit the first optical channel and the second optical channel to simultaneously address a sample mounted within the vacuum chamber,
the first optical channel is configured to transmit and receive light, and
the second optical channel is configured to transmit and receive light,
wherein the first optical channel and second optical channel are separate optical channels.
2 . The optical probe system of claim 1 , further comprising a periscope optically coupled to the first optical channel, wherein:
the segmented optical axis includes a third segment that is joined to the first segment by the second segment,
the periscope is configured to displace the third segment from the first segment, and
the second segment is housed within the periscope.
3 . The optical probe system of claim 1 , wherein the second optical channel is defined by a borescope tube.
4 . The optical probe system of claim 3 , wherein the first optical channel is defined by an optical beam tube that is arranged substantially parallel to the borescope tube.
5 . The optical probe system of claim 4 , further comprising a spacer engaged with the borescope tube and the optical beam tube to maintain the substantially parallel arrangement.
6 . The optical probe system of claim 5 , wherein the spacer is fixedly engaged with the optical beam tube and slidably engaged with the borescope tube.
7 . The optical probe system of claim 6 , further comprising a spring assembly that biases the borescope tube towards a distal end of the optical probe shaft.
8 . The optical probe system of claim 1 , further comprising a nanomanipulator coupled to the optical probe, wherein the nanomanipulator is configured to translate the optical probe shaft in three dimensions within the vacuum chamber.
9 . The optical probe system of claim 1 , further comprising a vacuum bellows connected between an exterior wall of the charged particle beam microscope and a mount of the optical probe, wherein:
the optical probe shaft extends through the vacuum bellows, and
the internal surface of the vacuum bellows is exposed to a vacuum from the vacuum chamber.
10 . The optical probe system of claim 1 , wherein the segmented optical axis includes a third segment that is joined to the first segment by the second segment, wherein the optical probe system further comprises an optics chassis that houses at least a portion of the third segment, and wherein:
the optics chassis includes a light transmitter configured to transmit light along the segmented optical axis to the vacuum chamber, and
the optics chassis includes a light receiver configured to receive light transmitted along the segmented optical axis from the vacuum chamber.
11 . The optical probe system of claim 1 , further comprising a stationary optics tube housing at least a portion of the optical probe shaft, wherein:
the stationary optics tube extends into the vacuum chamber, and
the stationary optics tube insulates the optical probe shaft from a vacuum maintained within the vacuum chamber.
12 . The optical probe system of claim 1 , wherein the second optical channel provides a lower magnification field of view relative to a higher magnification field of view provided by the first optical channel.
13 . A microscope system comprising:
a charged particle beam microscope that includes a vacuum chamber; and
an optical probe system comprising:
an optical probe configured to be mounted to the charged particle beam microscope to permit an optical probe shaft of the optical probe to extend at least partially into the vacuum chamber of the charged particle beam microscope;
a first optical channel extending through the optical probe shaft, wherein the first optical channel accommodates a portion of a segmented optical axis extending between a distal end of the probe and an optical chassis providing a high magnification view of a sample; and
a second optical channel extending through the optical probe shaft, wherein the second optical channel accommodates an unsegmented optical axis extending between the distal end of the probe and an eyepiece or camera that provides a low magnification view of the sample, and wherein:
the segmented optical axis includes at least a first segment that substantially parallel to the unsegmented optical axis and at least a second segment that is not substantially parallel to the unsegmented optical axis,
the first segment of the segmented optical axis and the unsegmented optical axis are positioned within the optical probe shaft to permit the first optical channel and the second optical channel to simultaneously address a sample mounted within the vacuum chamber,
the first optical channel is configured to transmit and receive light, and
the second optical channel is configured to transmit and receive light,
wherein the first optical channel and second optical channel are separate optical channels.
14 . The microscope system of claim 13 , further comprising a periscope optically coupled to the first optical channel, wherein:
the segmented optical axis includes a third segment that is joined to the first segment by the second segment,
the periscope is configured to displace the third segment from the first segment, and
the second segment is housed within the periscope.
15 . The microscope system of claim 13 , wherein the second optical channel is defined by a borescope tube.
16 . The microscope system of claim 15 , wherein the first optical channel is defined by an optical beam tube that is arranged substantially parallel to the borescope tube.
17 . The microscope system of claim 16 , further comprising a spacer engaged with the borescope tube and the optical beam tube to maintain the substantially parallel arrangement.
18 . The microscope system of claim 17 , wherein the spacer is fixedly engaged with the optical beam tube and slidably engaged with the borescope tube.
19 . The microscope system of claim 18 , further comprising a spring assembly that biases the borescope tube towards a distal end of the optical probe shaft.
20 . The microscope system of claim 13 , further comprising a nanomanipulator coupled to the optical probe, wherein the nanomanipulator is configured to translate the optical probe shaft in three dimensions within the vacuum chamber.
21 . The microscope system of claim 13 , further comprising a vacuum bellows connected between an exterior wall of the charged particle beam microscope and a mount of the optical probe, wherein:
the optical probe shaft extends through the vacuum bellows, and
the internal surface of the vacuum bellows is exposed to a vacuum from the vacuum chamber.
22 . The microscope system of claim 13 , wherein the segmented optical axis includes a third segment that is joined to the first segment by the second segment, wherein the optical probe system further comprises an optics chassis that houses at least a portion of the third segment, and wherein:
the optics chassis includes a light transmitter configured to transmit light along the segmented optical axis to the vacuum chamber, and
the optics chassis includes a light receiver configured to receive light transmitted along the segmented optical axis from the vacuum chamber.
23 . The microscope system of claim 13 , further comprising a stationary optics tube housing at least a portion of the optical probe shaft, wherein:
the stationary optics tube extends into the vacuum chamber, and
the stationary optics tube insulates the optical probe shaft from a vacuum maintained within the vacuum chamber.
24 . The microscope system of claim 13 , wherein the second optical channel provides a lower magnification field of view relative to a higher magnification field of view provided by the first optical channel.
25 . The optical probe system of claim 1 , wherein the optical probe shaft extends at least partially outside of the vacuum chamber.