IP Library Granted Patent US 12,676,577
Granted Patent B2
US 12,676,577 · App. 19/330,951 · Granted Jul 7, 2026

Non-contact electroluminescence defect detection method

Inventor: Zijing Xu (Suzhou, CN)
H02S50/15G01N21/8851G01N2021/8864G01N2021/8887
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Quick Facts
Patent No.
US 12,676,577
App. No.
19/330,951
Granted
Jul 7, 2026
Kind
B2
Abstract

A non-contact electroluminescence defect detection method, including: acquiring a center photoluminescence image, left and right electroluminescence images of a moving solar cell. Performing a fusion processing on the images to identify overlapping boundary regions, and determining a boundary distortion, and then locating initial defect position coordinates. Measuring left and right diffusion distances using images to generate a diffusion asymmetry degree, and determining a defect shift direction to generate accurate defect position coordinates. Extracting a center luminescence intensity and an edge luminescence intensity from the images, and forming a luminescence gradient curve based on the intensities to identify intensity jumping points. Adopting the intensity jumping points as dividing points to segment and establishing an energy distribution index, to identify energy conversion defects. Finally, a spatial positioning map containing defect location, type, and influence range is generated, enabling non-destructive detection and precise localization of various defect types in solar cell.

Claims (45)

1 . A non-contact electroluminescence defect detection method, comprising:

irradiating a moving solar cell with a laser to obtain an irradiation area, and simultaneously acquiring a center photoluminescence image, and a left electroluminescence image and a right electroluminescence image based on the irradiation area;

performing a fusion processing on the center photoluminescence image, the left electroluminescence image, and the right electroluminescence image to identify overlapping boundary regions, and conducting a shape analysis on the overlapping boundary regions to determine a boundary distortion, and locating initial defect position coordinates based on the boundary distortion;

measuring a left diffusion distance and a right diffusion distance based on the left electroluminescence image, and the right electroluminescence image, generating a diffusion asymmetry degree based on the left diffusion distance and the right diffusion distance, and determining a defect shift direction based on the asymmetry degree, and correcting the initial defect position coordinates based on the defect shift direction to generate accurate defect position coordinates;

extracting a center luminescence intensity from the center photoluminescence image, and extracting an edge luminescence intensity from the left electroluminescence image, and the right electroluminescence image, and forming a luminescence gradient curve based on the center luminescence intensity and the edge luminescence intensity, and identifying intensity jumping points through the luminescence gradient curve;

adopting the intensity jumping points as dividing points to segment a luminescence response interval, establishing an energy distribution index based on the luminescence response interval, identifying energy conversion defects at the accurate defect position coordinates based on the energy distribution index;

conducting a conduction path analysis based on the accurate defect position coordinates and the energy conversion defects to determine a defect coupling coefficient; identifying defect types based on the defect coupling coefficient, and outputting a spatial positioning map based on the defect types, completing the non-contact electroluminescence defect detection.

2 . The non-contact electroluminescence defect detection method according to claim 1 , wherein acquiring center photoluminescence image and left electroluminescence image, and the right electroluminescence image based on the irradiation area comprises:

establishing a light signal timestamp mapping relationship within the irradiation area;

collecting complementary signals of center photoluminescence single, left electroluminescence signal, and right electroluminescence signal based on the timestamp mapping relationship to generate complementary signal pairs;

performing spatiotemporal cross validation on the complementary signal pairs to form a verification matrix;

forming the center photoluminescence image based on the verification matrix, and the left electroluminescence image, and the right electroluminescence image.

3 . The non-contact electroluminescence defect detection method according claim 1 , wherein performing a fusion processing on the center photoluminescence image, the left electroluminescence image, and the right electroluminescence image to identify overlapping boundary regions comprises:

extracting boundary cross-section shapes from the center photoluminescence image, the left electroluminescence image, and the right electroluminescence image;

performing a multi-angle projection analysis based on the boundary cross-section shapes to generate projection contour sets;

performing a cross-overlay processing on the projection contour sets to form an overlay map;

identifying boundary overlap regions based on the overlay map.

4 . The non-contact electroluminescence defect detection method according to claim 1 , wherein generating a diffusion asymmetry degree based on the left diffusion distance and the right diffusion distance comprises:

forming diffusion trajectories based on the left diffusion distance and the right diffusion distance;

identifying diffusion acceleration segments and diffusion deceleration segments from the diffusion trajectories;

conducting a duration comparison analysis on the diffusion acceleration segments and the diffusion deceleration segments to generate a duration difference value;

generating the diffusion asymmetry degree based on the duration difference value.

5 . The non-contact electroluminescence defect detection method according to claim 1 , wherein forming a luminescence gradient curve based on the center luminescence intensity and the edge luminescence intensity comprises:

establishing an intensity difference sequence based on the center luminescence intensity and the edge luminescence intensity;

performing a gradient stratification on the intensity difference sequence to generate steep gradient layers, gradual gradient layers, and gentle gradient layers;

extracting mutation features from the steep gradient layers, and extracting transition features from the gradual gradient layers, and extracting steady-state features from the gentle gradient layers;

modulating and reconstructing the mutation features, the transition features, and the steady-state features to generate the luminescence gradient curve.

6 . The non-contact electroluminescence defect detection method according to claim 1 , wherein establishing an energy distribution index based on the luminescence response interval comprises:

identifying energy-dense segments and energy-sparse segments within the luminescence response interval;

calculating concentration indices based on the energy-dense segments, and calculating dispersion indices based on the energy-sparse segments;

performing an energy balance evaluation based on the concentration indices and the dispersion indices to generate balance parameters;

generating the energy distribution index based on the balance parameters.

7 . The non-contact electroluminescence defect detection method according to claim 1 , wherein conducting a conduction path analysis based on the accurate defect position coordinates and the energy conversion defects to determine a defect coupling coefficient comprises:

establishing defect impact boundaries based on the accurate defect position coordinates;

tracking a conduction path of the energy conversion defects within the defect influence boundaries, to identify a conduction enhancement path and a conduction attenuation path;

determining the defect coupling coefficient based on a length ratio of the conduction enhancement path and the conduction attenuation path.

8 . The non-contact electroluminescence defect detection method according to claim 3 , wherein performing a multi-angle projection analysis based on the boundary cross-section shapes to generate a projection contour sets comprises:

evaluating a projection complexity of the boundary cross-section shapes to determine a projection strategy, the projection complexity comprises a boundary curvature, a defect distribution density, and a boundary continuity;

setting a multi-angle projection scanning sequence based on the projection strategy;

performing a profile extraction for each of angles in the multi-angle projection scanning sequence to generate a projection contour sets.

9 . The non-contact electroluminescence defect detection method according to claim 5 , wherein modulating and reconstructing the mutation features, the transition features, and the steady-state features to generate the luminescence gradient curve comprises:

conducting polarity identification on the mutation features, the transition features, and the steady-state features to generate a positive polarity feature group and a negative polarity feature group;

neutralizing the negative polarity feature group based on the positive polarity feature group to form balanced features;

modulating and encoding the balanced features to generate a feature modulation signal;

demodulating and reconstructing the feature modulation signal to generate the luminescence gradient curve.