Analog-to-digital converter setting common mode voltage
An analog-to-digital converter is provided. An analog-to-digital converter comprises an interleaver receiving and processing an input signal that is an analog signal and a plurality of sub-ADCs, wherein the interleaver includes a reference circuit outputting a second voltage based on a first voltage, a high-pass filter receiving the second voltage and outputting a first signal obtained by changing a common mode voltage of the input signal to the second voltage, a sampling circuit generating a second signal obtained by sampling an alternate current component of the first signal, and a buffer outputting a third signal obtained by buffering the second signal by using a buffering circuit, and the sub-ADC converts the third signal into a digital signal by using the first voltage.
1 . An analog-to-digital converter (ADC) comprising:
an interleaver configured to receive and process an analog input signal; and
at least one sub-ADC,
wherein the interleaver includes
a reference circuit configured to use a replica circuit to output a second voltage based on a first voltage,
a high-pass filter configured to receive the second voltage and to output a first signal obtained by changing a common mode voltage of the analog input signal to the second voltage,
a sampling circuit configured to generate a second signal obtained by sampling an alternate current component of the first signal, and
a buffer configured to output a third signal obtained by buffering the second signal by using a buffering circuit,
wherein the at least one sub-ADC is configured to convert the third signal into a digital output signal using the first voltage, and
wherein the replica circuit replicates the buffering circuit.
2 . The analog-to-digital converter of claim 1 , wherein
the reference circuit includes the replica circuit, and
the buffer includes the buffering circuit.
3 . The analog-to-digital converter of claim 2 , wherein
the buffering circuit includes a second transistor and a third transistor, which are connected in series between a driving voltage of the buffering circuit and a ground,
the second transistor is positioned between the driving voltage of the buffering circuit and an output terminal of the buffering circuit, and
the third transistor is configured to be gated by the second signal.
4 . The analog-to-digital converter of claim 3 , wherein
the reference circuit further includes a first operational amplifier, and
an input terminal of the replica circuit is connected to an output terminal of the first operational amplifier, and an output terminal of the replica circuit is connected to a first input terminal of the first operational amplifier.
5 . The analog-to-digital converter of claim 4 , wherein the reference circuit is configured such that the first voltage is provided to a second input terminal of the first operational amplifier different from the first input terminal of the first operational amplifier.
6 . The analog-to-digital converter of claim 1 , wherein
the buffering circuit includes a first transistor and a current source, and
the first transistor is configured to be gated by the second signal and positioned between a ground and an output terminal of the buffer.
7 . The analog-to-digital converter of claim 6 , wherein
the reference circuit further includes a first operational amplifier,
an input terminal of the replica circuit is connected to an output terminal of the first operational amplifier, and
an output terminal of the replica circuit is connected to a first input terminal of the first operational amplifier.
8 . The analog-to-digital converter of claim 7 , wherein the reference circuit is configured such that the first voltage is provided to a second input terminal of the first operational amplifier different from the first input terminal of the first operational amplifier.
9 . The analog-to-digital converter of claim 1 , wherein the reference circuit is configured to output the second voltage, which is lower than the first voltage by as much as a predetermined voltage.
10 . The analog-to-digital converter of claim 9 , wherein
the reference circuit includes a transistor, and
the predetermined voltage is such that the second voltage is lower than the first voltage as much as a threshold voltage of the transistor.
11 . The analog-to-digital converter of claim 1 , wherein a common mode voltage of the third signal is the same as the first voltage.
12 . The analog-to-digital converter of claim 1 , wherein the reference circuit includes a first operational amplifier including a first input terminal and a second input terminal, and the first operational amplifier is configured to receive the first voltage at the first input terminal and the second input terminal is connected to an output terminal.
13 . An analog-to-digital converter (ADC) comprising:
a reference circuit configured to receive a first voltage from outside of the ADC and to output a second voltage based on the first voltage;
a high-pass filter configured to receive the second voltage and to output a first signal obtained by changing a common mode voltage of an analog input signal to the second voltage;
a sampling circuit configured to generate a second signal obtained by sampling an alternating current component of the first signal;
a buffer configured to output a third signal obtained by buffering the second signal by using a buffering circuit; and
a plurality of sub-ADCs configured to convert the third signal into a digital output signal,
wherein the reference circuit is configured to output the second voltage using a replica circuit that replicates the buffering circuit of the buffer.
14 . The analog-to-digital converter of claim 13 , wherein the reference circuit includes a first operational amplifier in which a first input terminal is connected to the replica circuit and the first voltage is provided to a second input terminal.
15 . The analog-to-digital converter of claim 14 , wherein
the first input terminal is connected to an output terminal of the replica circuit, and
an output terminal of the first operational amplifier is connected to an input terminal of the replica circuit.
16 . The analog-to-digital converter of claim 15 , wherein
the replica circuit includes a first transistor and a current source, and
the first transistor configured to be gated by the second signal and positioned between a ground and the output terminal of the replica circuit.
17 . The analog-to-digital converter of claim 15 , wherein
the replica circuit includes a second transistor and a third transistor,
the second transistor positioned between a driving voltage of the replica circuit and the output terminal of the replica circuit, and
the third transistor configured to be gated by the second signal.
18 . The analog-to-digital converter of claim 13 , wherein a common mode voltage of the third signal is the same as the first voltage.
19 . The analog-to-digital converter of claim 13 , wherein
the high-pass filter includes a first capacitor and a first resistor,
the first capacitor configured to receive an input signal at one end,
another end of the first capacitor is connected to one end of the first resistor, and
another end of the first resistor is connected to an output terminal of the reference circuit to receive the second voltage from the reference circuit.
20 . An analog-to-digital converter (ADC) comprising:
a reference circuit including a replica circuit, which includes a first transistor and a current source, and a first operational amplifier in which a first input terminal of the first operational amplifier is connected to the replica circuit and configured to provide a first voltage to a second input terminal of the first operational amplifier;
a high-pass filter including a first capacitor and a first resistor, the high-pass filter configured such that one end of the first capacitor is configured to receive an input signal and one end of the first resistor is connected to an output terminal of the reference circuit;
a sampling circuit including a first switch and a second capacitor, one end of the first switch connected to an output terminal of the high-pass filter and another end of the first switch being connected to the second capacitor;
a buffer configured to receive an output of the sampling circuit and including the same circuit as the replica circuit; and
a plurality of sub-ADCs configured to convert an output signal of the buffer into a digital signal.