IP Library Granted Patent US 12677597
Granted Patent B2
US 12677597 · App. 17/894,863 · Granted Jul 7, 2026

Piezoelectric laminate and piezoelectric element

Inventors: Seigo Nakamura (Kanagawa, JP); Hiroyuki Kobayashi (Kanagawa, JP)
Assignee: FUJIFILM Corporation
H10N30/877H10N30/708H10N30/8554
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Quick Facts
Patent No.
US 12677597
App. No.
17/894,863
Granted
Jul 7, 2026
Kind
B2
Abstract

A piezoelectric laminate and a piezoelectric element have, on a substrate in the following order, a lower electrode layer and a piezoelectric film containing a perovskite-type oxide. The lower electrode layer includes a second layer arranged in a state of being in contact with the piezoelectric film and includes a first layer arranged on a side of the second layer from the substrate, where the first layer contains one or more of W, Mo, Nb, and Ta, as a main component, and the second layer contains Ir as a main component, where the thickness of the second layer is 50 nm or less.

Claims (34)

1 . A piezoelectric laminate comprising, on a substrate in the following order:

a lower electrode layer; and

a piezoelectric film containing a perovskite-type oxide,

wherein the lower electrode layer includes a second layer arranged in a state of being in contact with the piezoelectric film and includes a first layer arranged on a side of the substrate than the second layer,

the first layer contains one or more of W, Mo, Nb, and Ta, as a main component, and

the second layer contains Ir as a main component, and a thickness of the second layer is 50 nm or less.

2 . The piezoelectric laminate according to claim 1 ,

wherein the thickness of the second layer is 45 nm or less.

3 . The piezoelectric laminate according to claim 1 , further comprising:

a first intimate attachment layer that improves adhesiveness between the substrate and the first layer, between the substrate and the first layer.

4 . The piezoelectric laminate according to claim 3 ,

wherein the first intimate attachment layer is a TiW layer.

5 . The piezoelectric laminate according to claim 1 , further comprising:

a second intimate attachment layer that improves adhesiveness between the first layer and the second layer, between the first layer and the second layer.

6 . The piezoelectric laminate according to claim 5 ,

wherein the second intimate attachment layer is a TiW layer.

7 . The piezoelectric laminate according to claim 1 ,

wherein the first layer is a W layer.

8 . The piezoelectric laminate according to claim 1 ,

wherein the perovskite-type oxide is a compound represented by General Formula (1),

Pb{(Zr x Ti 1−x ) 1−y B1 y }O 3   (1)

0<x<1, 0<y<0.4, and

B1 is one or more elements selected from V, Nb, Ta, Sb, Mo, and W.

9 . The piezoelectric laminate according to claim 1 ,

wherein a half width at half maximum of an X-ray diffraction peak from a (111) plane of the Ir of the second layer is 0.3° or more.

10 . The piezoelectric laminate according to claim 1 ,

wherein the second layer is a uniaxial alignment film in which the Ir is aligned in a (111) plane, and

the (111) plane has an inclination of 1° or more with respect to a thickness direction.

11 . The piezoelectric laminate according to claim 1 ,

wherein a pyrochlore phase is included at an interface between the lower electrode layer and the piezoelectric film, and

a thickness of the pyrochlore phase is 20 nm or less.

12 . A piezoelectric element comprising:

the piezoelectric laminate according to claim 1 ; and

an upper electrode layer provided on the piezoelectric film of the piezoelectric laminate.