Semiconductor device including a substrate to which a lead is fixed
A semiconductor device, includes: a substrate having an obverse surface facing in a thickness direction; a first lead having a loading surface facing a side same as a side the obverse surface faces as to the thickness direction and being fixed on the obverse surface; and a first semiconductor element arranged on the loading surface. A dimension of the substrate in a first direction orthogonal to the thickness direction is larger than a dimension of the substrate in a second direction orthogonal to the thickness direction and the first direction. The first lead includes a first region overlapped with the first semiconductor element as viewed in the thickness direction and a second region separated from the first semiconductor element as viewed in the thickness direction, and at least a part of the second region extends along the second direction.
1 . A semiconductor device, comprising:
a substrate having an obverse surface facing in a thickness direction;
a first lead having a loading surface facing a side same as a side the obverse surface faces as to the thickness direction and being fixed on the obverse surface; and
a first semiconductor element arranged on the loading surface,
wherein a dimension of the substrate in a first direction orthogonal to the thickness direction is larger than a dimension of the substrate in a second direction orthogonal to the thickness direction and the first direction,
the first lead comprises a first region overlapped with the first semiconductor element as viewed in the thickness direction and a second region separated from the first semiconductor element as viewed in the thickness direction, and at least a part of the second region extends along the second direction,
a dimension of the second region in the first direction is smaller than a dimension of the first region in the first direction,
the first semiconductor element comprises a plurality of first semiconductor elements arranged in the first region, and
the plurality of first semiconductor elements are arranged on the first lead so that their positions in the second direction are different from one another.
2 . The semiconductor device according to claim 1 , wherein one end of the second region as to the second direction reaches a peripheral edge of the first lead.
3 . The semiconductor device according to claim 1 ,
wherein the first semiconductor element has a first peripheral edge extending along the second direction as viewed in the thickness direction, and
the first peripheral edge is adjacent to the second region in the first direction as viewed in the thickness direction.
4 . The semiconductor device according to claim 3 , further comprising two additional semiconductor elements separated from each other in the second direction,
wherein the second region has a gap portion located between the two additional semiconductor elements as viewed in the thickness direction.
5 . The semiconductor device according to claim 1 , wherein the dimension of the second region in the first direction is smaller than a dimension of the first semiconductor element in the first direction.
6 . The semiconductor device according to claim 1 , wherein the second region is a slit.
7 . The semiconductor device according to claim 1 , wherein the second region is a groove recessed from the loading surface.
8 . The semiconductor device according to claim 1 ,
wherein the first lead has an opposing surface opposed to the obverse surface, and
the second region is a groove recessed from the opposing surface.
9 . The semiconductor device according to claim 1 , further comprising a dummy element arranged on the loading surface and separated from the second region,
wherein the dummy element is located on a side the first semiconductor element is located with respect to the second region as to the first direction.
10 . The semiconductor device according to claim 9 , wherein the dummy element is adjacent to the first semiconductor element in the second direction.
11 . The semiconductor device according to claim 1 , further comprising:
a base layer laminated on the obverse surface; and
a bonding layer for bonding the base layer and the first lead,
wherein the base layer and the bonding layer contain a metallic element.
12 . The semiconductor device according to claim 11 ,
wherein the base layer contains silver, and
the bonding layer contains tin.
13 . The semiconductor device according to claim 1 , further comprising a conductive bonding layer for bonding the loading surface and the first semiconductor element,
wherein the first semiconductor element is conducted to the first lead.
14 . The semiconductor device according to claim 13 , further comprising:
a second lead fixed on the obverse surface and separated from the first lead;
a second semiconductor element arranged on the second lead and conducted to the second lead,
wherein the second lead is conducted to the first semiconductor element.
15 . The semiconductor device according to claim 14 , further comprising:
a third lead separated from the first lead and the second lead,
wherein the third lead is conducted to the second semiconductor element.
16 . The semiconductor device according to claim 1 , further comprising a sealing resin for covering a part of each of the substrate and the first lead and the first semiconductor element,
wherein the sealing resin is in contact with the second region.
17 . The semiconductor device according to claim 16 ,
wherein the substrate has a reverse surface facing a side opposite to a side the obverse surface faces as to the thickness direction, and
the reverse surface is exposed out of the sealing resin.
18 . A semiconductor device, comprising:
a substrate having an obverse surface facing in a thickness direction;
a first lead having a loading surface facing a side same as a side the obverse surface faces as to the thickness direction and being fixed on the obverse surface; and
a first semiconductor element arranged on the loading surface,
wherein a dimension of the substrate in a first direction orthogonal to the thickness direction is larger than a dimension of the substrate in a second direction orthogonal to the thickness direction and the first direction,
the first lead comprises a first region overlapped with the first semiconductor element as viewed in the thickness direction and a second region separated from the first semiconductor element as viewed in the thickness direction, and at least a part of the second region extends along the second direction,
a dimension of the second region in the first direction is smaller than a dimension of the first region in the first direction, and
one end of the second region as to the second direction reaches a peripheral edge of the first lead.
19 . A semiconductor device, comprising:
a substrate having an obverse surface facing in a thickness direction;
a first lead having a loading surface facing a side same as a side the obverse surface faces as to the thickness direction and being fixed on the obverse surface; and
a first semiconductor element arranged on the loading surface,
wherein a dimension of the substrate in a first direction orthogonal to the thickness direction is larger than a dimension of the substrate in a second direction orthogonal to the thickness direction and the first direction,
the first lead comprises a first region overlapped with the first semiconductor element as viewed in the thickness direction and a second region separated from the first semiconductor element as viewed in the thickness direction, and at least a part of the second region extends along the second direction,
a dimension of the second region in the first direction is smaller than a dimension of the first region in the first direction, and
the second region is a slit.