IP Library Granted Patent US 12678862
Granted Patent B2
US 12678862 · App. 18/278,805 · Granted Jul 14, 2026

Additive manufacturing development method and three-dimensional additive manufacturing system

Inventors: Kenta Aoyagi (Sendai, JP); Akihiko Chiba (Sendai, JP); Hideki Kyogoku (Hiroshima, JP); Shin-ichi Kitamura (Tokyo, JP); Michiaki Hashitani (Tokyo, JP)
Assignee: JEOL LTD.
B22F10/80G06T7/0006B33Y50/00G06T2207/30136
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Quick Facts
Patent No.
US 12678862
App. No.
18/278,805
Granted
Jul 14, 2026
Kind
B2
Abstract

An additive manufacturing development method includes predicting a defect that occurs in a product based on a combination of a plurality of design data and a plurality of manufacturing conditions, collecting defect detection data for defect detection by monitoring the product during manufacturing in accordance with the combination of the plurality of design data and the plurality of manufacturing conditions, and generating a process map in which the plurality of manufacturing conditions are plotted using the predicted defect and the collected defect detection data. The method further includes collecting defect repair data for defect repair by monitoring the product during manufacturing and repairing a defect detected from the product, and storing the defect and the defect repair data in association with each other using the defect repair data and a repair result.

Claims (14)

1 . A three-dimensional additive manufacturing system for manufacturing a three-dimensional additively manufactured object by using an electron beam melting method or a laser melting method, comprising:

a defect predictor that predicts a defect that occurs in a product based on a combination of a plurality of design data and a plurality of manufacturing conditions, which are used to additively manufacture the product;

a defect detection data collector that collects defect detection data for defect detection by monitoring the product during manufacturing in accordance with the combination of the plurality of design data and the plurality of manufacturing conditions;

a process map generator that generates a process map in which the plurality of manufacturing conditions are plotted using the predicted defect and the collected defect detection data;

an additive manufacturing unit that additively manufactures the product while adjusting the plurality of manufacturing conditions in accordance with the process map; and

a defect repair data collector that collects defect repair data for defect repair by monitoring the product during manufacturing while adjusting the plurality of manufacturing conditions in accordance with the process map and repairing a defect detected from the product.

2 . The three-dimensional additive manufacturing system according to claim 1 , further comprising:

defect repair data storage unit that stores the defect detected from the product during manufacturing and the defect repair data in association with each other using the collected defect repair data and a repair result by the defect repair,

wherein the additive manufacturing unit repairs the defect detected from a subsequent product in accordance with the stored defect repair data.

3 . The three-dimensional additive manufacturing system according to claim 1 , further comprising:

a defect repair data storage unit that stores the defect detected from the product during manufacturing and the defect repair data in association with each other using the collected defect repair data and a repair result by the defect repair.

4 . The three-dimensional additive manufacturing system according to claim 1 , wherein the defect detection data collector and the defect repair data collector monitor the product before and after melting for each layer of the product, and wherein the defect detection data and the defect repair data include surface property data.

5 . The three-dimensional additive manufacturing system according to claim 1 , wherein pattern classification is performed for the plurality of design data in correspondence with a shape of the product.

6 . The three-dimensional additive manufacturing system according to claim 5 , wherein the pattern classification is performed based on at least one selected from a group of a scan path length and a distance from underskin, or based on at least one selected from a group of a melting area and a tilt angle.