IP Library Granted Patent US 12678894
Granted Patent B2
US 12678894 · App. 17/927,910 · Granted Jul 14, 2026

Method for welding an attachment piece to a semiconductor metallisation by laser welding

Inventors: Markus Lasch (Munich, DE); Friedrich Lupp (Gauting, DE); Stefan Stegmeier (Munich, DE)
Assignee: SIEMENS AKTIENGESELLSCHAFT
B23K26/32B23K2103/56H10W72/07335H10W72/352
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Quick Facts
Patent No.
US 12678894
App. No.
17/927,910
Granted
Jul 14, 2026
Kind
B2
Abstract

Various teachings of the present disclosure include a method for welding an attachment piece to a semiconductor metallization using laser welding. The method may include: arranging an attachment piece having a flat side with a thin point so the flat side faces the semiconductor metallization; and welding the flat side to the semiconductor metallization. The flat side rests against a flat side of the semiconductor metallization over an entire surface area of the flat side. The thin point is formed with a cup shape of the attachment piece. The cup shape is open in the direction away from the semiconductor metallization.

Claims (25)

1 . A method for welding an attachment piece to a semiconductor metallization using laser welding, the method comprising:

arranging the attachment piece having a cup shape having a flat base with a thin point so the flat base faces the semiconductor metallization and an opening of the cup is closed by a cover in a direction away from the semiconductor metallization; and

welding the flat base to the semiconductor metallization by melting the cover with a laser so a resulting molten material from the cover wets the thin point;

wherein the flat base rests against a flat side of the semiconductor metallization over an entire surface area of the flat base.

2 . The method as claimed in claim 1 , wherein:

the semiconductor metallization has a metallization thickness; and

welding the flat side to the semiconductor metallization results in a welding-in depth during the laser welding of at most as deep as the metallization thickness.

3 . The method as claimed in claim 1 , wherein:

the thin point has a thin-point thickness perpendicular to the flat side of at most 100 micrometers.

4 . The method as claimed in claim 1 , wherein:

a defined air gap is provided between the attachment piece and the semiconductor metallization; and

welding the flat side is performed at the defined air gap.

5 . The method as claimed in claim 1 , wherein the cup shape of the attachment piece holds a vacuum.

6 . The method as claimed in claim 1 , wherein an air gap is retained between the attachment piece and the semiconductor metallization.

7 . The method as claimed in claim 1 , wherein welding the flat side includes using a laser light with a wavelength of at most 800 nanometers.

8 . The method as claimed in claim 1 , wherein the thin point has a smallest width of at least 5 micrometers and at most 1000 micrometers in directions along the flat side.

9 . The method as claimed in claim 1 , wherein the attachment piece comprises copper and/or solder and/or ceramic and/or polymer and/or forms a terminal contact.

10 . The method as claimed in claim 1 , further comprising forming a melt pool with a smallest width in a direction along the flat side for welding the flat side;

wherein a smallest width of the thin point is at least twice the smallest width of the melt pool.

11 . An electronics module comprising:

a semiconductor metallization; and

an attachment piece welded to the semiconductor metallization;

wherein the attachment piece has a cup shape with a flat base having a thin point facing the semiconductor metallization and an opening of the cup in a direction away from the semiconductor metallization; and

the flat base is welded to the semiconductor metallization;

the flat base rests against a flat side of the semiconductor metallization over an entire surface area of the flat base.