X-ray fluorescence spectrometer and power supply apparatus
A power supply that applies a tube voltage to a target includes a transformer, a switching circuit connected to a primary side of the transformer, and a substrate to which the switching circuit and the transformer are connected, the substrate including a first layer and a second layer. The transformer includes a first primary winding and a second primary winding on the primary side. A first wiring pattern that connects the first primary winding and the switching circuit to each other is located in the first layer. A second wiring pattern that connects the second primary winding and the switching circuit to each other is located in the second layer. The first layer and the second layer are arranged such that at least a part of the first wiring pattern overlaps with the second wiring pattern when the substrate is viewed from a stacked direction in a plan view.
1 . An X-ray fluorescence spectrometer comprising:
an X-ray tube including a filament and a target, the X-ray tube being configured to irradiate a sample with primary X-rays;
a detector that detects secondary X-rays generated from the sample; and
a power supply that applies a tube voltage to the target, wherein
the power supply includes
a transformer,
a switching circuit connected to a primary side of the transformer, and
a substrate to which the switching circuit and the transformer are connected, the substrate including a first layer and a second layer,
the transformer includes a first primary winding and a second primary winding on the primary side,
a first wiring pattern that connects the first primary winding and the switching circuit to each other is located in the first layer,
a second wiring pattern that connects the second primary winding and the switching circuit to each other is located in the second layer, and
the first layer and the second layer are arranged such that at least a part of the first wiring pattern overlaps with the second wiring pattern when the substrate is viewed from a stacked direction in a plan view.
2 . The X-ray fluorescence spectrometer according to claim 1 , wherein
the first layer is a layer adjacent to the second layer in the stacked direction.
3 . The X-ray fluorescence spectrometer according to claim 1 , wherein
the switching circuit includes
a first switching element connected to the first primary winding through the first wiring pattern, and
a second switching element connected to the second primary winding through the second wiring pattern.
4 . The X-ray fluorescence spectrometer according to claim 3 , wherein
the power supply further includes
a first snubber circuit connected to the first primary winding and the first switching element, and
a second snubber circuit connected to the second primary winding and the second switching element.
5 . The X-ray fluorescence spectrometer according to claim 1 , wherein
the transformer includes a first transformer and a second transformer,
the first wiring pattern in the first transformer and the first wiring pattern in the second transformer are located in a same first layer, and
the second wiring pattern in the first transformer and the second wiring pattern in the second transformer are located in a same second layer.
6 . A power supply apparatus that applies a tube voltage to a target arranged in an X-ray tube, the power supply apparatus comprising:
a transformer;
a switching circuit connected to a primary side of the transformer; and
a substrate to which the switching circuit and the transformer are connected, the substrate including a first layer and a second layer, wherein
the transformer includes a first primary winding and a second primary winding on the primary side,
a first wiring pattern that connects the first primary winding and the switching circuit to each other is located in the first layer,
a second wiring pattern that connects the second primary winding and the switching circuit to each other is located in the second layer, and
the first layer and the second layer are arranged such that at least a part of the first wiring pattern overlaps with the second wiring pattern when the substrate is viewed from a stacked direction in a plan view.