Probe passing method and probe

Inventor: Akihito Kurachi (Hyogo, JP)

Assignee: JAPAN ELECTRONIC MATERIALS CORPORATION

G01R3/00 G01R1/06716

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Quick Facts

Patent No.: US 12681046
App. No.: 18/727,347
Granted: Jul 14, 2026
Kind: B2

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Abstract

[Problem] To facilitate passing of a probe through two or more guide plates. [Solution] Provided is a probe passing method for a probe card 1 in which two guide plates 301, 302 are spaced apart from each other, and a probe 50 is passed through two guide holes 311, 312 respectively formed in the two guide plates 301, 302 , the method comprising: a step for passing a towing rod 60 through the two guide holes 311, 312 ; a step for separably linking the tip-end of the towing rod 60 , having passed through the two guide holes 311, 312 , to a linking portion 510 provided at the tip-end of the probe 50 ; a step for pulling the towing rod 60 out of the receiving two guide holes 311, 312 , and passing the probe 50 through the two guide holes 311, 312 ; and a step for separating the towing rod 60 , having been pulled out of the two guide holes 311, 312 , from the probe 50.

Claims (38)

1 . A method for inserting a probe for a probe card in which two guide plates are arranged apart from each other, and the probe is inserted through two guide holes respectively formed in the two guide plates, comprising:

inserting a rod used to pull the probe through the two guide holes;

attaching a tip of the probe to a tip of the rod with the rod inserted through the two guide holes;

pulling the rod, to which the probe is attached, in an opposite direction from when it was inserted through the two guide holes to remove it out of the two guide holes, thereby inserting the probe through the two guide holes; and

detaching the rod from the probe after pulling it out of the two guide holes.

2 . The method according to claim 1 , wherein

attaching the tip of the probe to the tip of the rod by overlapping them lengthwise.

3 . The method according to claim 1 , further comprising:

removing a portion of the probe to which the rod was attached after detaching the rod from the probe.

4 . A probe, comprising:

an elastically deformable probe body to be inserted through two guide holes respectively formed in two guide plates arranged apart from each other; and

a connecting portion protruding in an axial direction from one end of the probe body and configured to be connected to a tip of a rod used to pull the probe through the two guide holes, wherein

the tip of the rod is detachably connected to a first connecting surface parallel to the axial direction of the connecting portion.

5 . The probe according to claim 4 , wherein

the first connecting surface is provided at a position recessed from a side surface of the probe body, and

a second connecting surface of the rod connected to the first connecting surface is positionable closer to the first connecting surface than the side surface of the probe body.

6 . The probe according to claim 5 , wherein

solder or thermoplastic adhesive is formed on the first connecting surface or the second connecting surface.

7 . The probe according to claim 5 , wherein

an engaging portion to be engaged with the pulling rod is provided on the first connecting surface.

8 . The probe according to claim 7 , wherein

the engaging portion is a hook shape formed to protrude from the first connecting surface, with a tip facing the probe body.

9 . The probe according to claim 7 , wherein

the engaging portion includes an engaging hole formed in the first connecting surface.

10 . The probe according to claim 4 , wherein