Inspection apparatus and inspection method
An inspection apparatus includes: a voltage application unit that applies voltage to a capacitor to perform charging; a current measurement unit that continuously measures current of the capacitor during the charging; and an anomaly detection unit that detects an anomaly of the capacitor based on a regression line derived from a logarithm of a measured value of the current in a determination time range during the charging and a logarithm of measurement timing of the current.
1 . An inspection apparatus comprising:
a voltage application unit that applies voltage to a capacitor to perform charging;
a current measurement unit that continuously measures current of the capacitor during the charging; and
a computer processor that detects an anomaly of the capacitor based on a regression line derived from a logarithm of a measured value of the current in a determination time range during the charging and a logarithm of measurement timing of the current.
2 . The inspection apparatus as defined in claim 1 , wherein the computer processor detects an anomaly of the capacitor based on degree of agreement of the logarithm of a measured value of the current and the logarithm of measurement timing of the current with respect to the regression line.
3 . The inspection apparatus as defined in claim 1 , wherein the computer processor detects an anomaly of the capacitor based on a relation of the logarithm of a measured value of the current with respect to at least one of an upper limit and a lower limit of a current tolerance range defined according to the regression line over the determination time range.
4 . The inspection apparatus as defined in claim 1 , wherein the computer processor
detects an anomaly of the capacitor based on a first regression line derived from the logarithm of a measured value of the current and the logarithm of measurement timing of the current in a first determination time range during the charging, and
detects an anomaly of the capacitor based on a second regression line derived from the logarithm of a measured value of the current and the logarithm of measurement timing of the current in a second determination time range during the charging.
5 . The inspection apparatus as defined in claim 1 , wherein:
the voltage application unit
applies voltage to the capacitor in a first polarity to perform first polarity charging, and
applies voltage to the capacitor in a second polarity being an opposite polarity to the first polarity, after the first polarity charging to perform second polarity charging;
the current measurement unit
measures a first polarity current that is a current of the capacitor during the first polarity charging, and
measures a second polarity current that is a current of the capacitor during the second polarity charging; and
the computer processor
detects an anomaly of the capacitor based on a first polarity regression line derived from a logarithm of a measured value of the first polarity current in a first determination time range during the first polarity charging and a logarithm of measurement timing of the first polarity current, and
detects an anomaly of the capacitor based on a second polarity regression line derived from a logarithm of a measured value of the second polarity current in a second determination time range during the second polarity charging and a logarithm of measurement timing of the second polarity current.
6 . An inspection method comprising the steps of:
applying voltage to a capacitor to perform charging;
measuring current of the capacitor continuously during the charging;
detecting an anomaly of the capacitor based on a regression line derived from a logarithm of a measured value of the current and a logarithm of measurement timing of the current in a determination time range during the charging; and
separately discharging electronic components determined to have the anomaly and electronic components determined not to have an anomaly to the collection device via discharge paths.