IP Library Granted Patent US 12683141
Granted Patent B2
US 12683141 · App. 18/148,313 · Granted Jul 14, 2026

Systems and techniques for in-source ion separation

Inventor: Mikhail V. Ugarov (San Jose, CA)
Assignee: THERMO FINNIGAN LLC
H01J49/282H01J49/022H01J49/0422H01J49/165
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Quick Facts
Patent No.
US 12683141
App. No.
18/148,313
Granted
Jul 14, 2026
Kind
B2
Abstract

Systems, devices, and methods for in-source ion separation are provided. An ion separator includes an ion transfer conduit fluidically upstream of and coupled with one or more components of an analytical instrument. The ion separator includes a gas conduit, fluidically upstream of and coupled with the ion transfer conduit, the gas conduit defining an internal volume. The ion separator also includes electronic circuitry defining an active surface exposed to the internal volume, the electronic circuitry being configured to energize the active surface. Embodiments of the present disclosure provide improved analysis of material samples based at least in part on in-source separation of relatively light ions from relatively heavy ions entrained in a gas flow.

Claims (32)

1 . An ion separator for in-source ion separation, comprising:

an ion transfer conduit fluidically upstream of and coupled with one or more components of an analytical instrument comprising an ion source, distinct from and fluidically coupled with the ion separator, the ion source being disposed upstream of the separator and configured to deliver a stream of ionized sample material to the ion separator;

a curved gas conduit, fluidically upstream of and coupled with the ion transfer conduit, the gas conduit defining an internal volume, the gas conduit being physically disconnected from and oriented toward the ion source and configured to receive the stream of ionized sample material from the ion source; and

electronic circuitry defining a curved active surface exposed to the internal volume, the electronic circuitry being configured to energize the active surface, wherein the active surface is disposed outside the internal volume.

2 . The ion separator of claim 1 , further comprising a standoff,

disposed between the active surface and the gas conduit, wherein at least part of the electronic circuitry is coupled with the gas conduit via the standoff, and wherein the gas conduit defines an aperture fluidically coupling the internal volume with the active surface via the aperture.

3 . The ion separator of claim 2 , wherein the aperture is a first aperture,

wherein the first aperture is proximal to a first region of the active surface, and wherein the gas conduit defines a second aperture fluidically coupling the internal volume with a second region of the active surface.

4 . The ion separator of claim 3 , wherein the first aperture and the second aperture are formed in opposing sides of the gas conduit.

5 . The ion separator of claim 1 , wherein the active surface is a first active surface, and wherein the electronic circuitry defines a second active surface disposed in or on the internal surface of the gas conduit.

6 . The ion separator of claim 1 , wherein the electronic circuitry is configured to energize the active surface to a voltage having a magnitude from about 10 V to about 1000 V.

7 . The ion separator of claim 1 , wherein the gas conduit is characterized by a higher gas conductance relative to the ion transfer conduit.

8 . The ion separator of claim 1 , wherein the ion separator is configured to generate a gas velocity through the gas conduit from about 1 m/s to about 50 m/s.

9 . The ion separator of claim 1 , wherein the gas conduit opens onto a first environment configured to operate at a first pressure, and wherein the ion transfer conduit opens onto a second environment configured to operate at a second pressure lower than the first pressure, the second environment being fluidically coupled with the first environment via the gas conduit and the ion transfer conduit.

10 . An analytical instrument, comprising:

an ion source configured to generate a stream of ionized sample material;

a curved gas conduit, physically disconnected from and fluidically coupled with the ion source, the gas conduit being oriented to receive the stream of ionized sample material from the ion source, the gas conduit defining an internal volume;

electronic circuitry defining a curved active surface exposed to the internal volume, the electronic circuitry being configured to energize the active surface, wherein the active surface is disposed outside the internal volume;

an ion transfer conduit downstream of and fluidically coupled with the ion source via the gas conduit; and

one or more components of the analytical instrument configured to receive ions of the stream of ionized sample material and to generate spectrometric data characteristic of the ionized sample material.

11 . The analytical instrument of claim 10 , further comprising a standoff, disposed between the active surface and the gas conduit, wherein at least part of the

electronic circuitry is coupled with the gas conduit via the standoff, and wherein the gas conduit defines an aperture fluidically coupling the internal volume with the active surface via the aperture.

12 . The analytical instrument of claim 10 , wherein the electronic circuitry is configured to energize the active surface to a voltage having a magnitude from about 10 V to about 1000 V.

13 . The analytical instrument of claim 10 , wherein the electronic circuitry comprises a shared voltage source electronically coupled with the active surface and with the ion source.

14 . The analytical instrument of claim 10 , wherein:

the ion source and the gas conduit are disposed in a first environment;

the ion transfer conduit is disposed in a second environment;

the analytical instrument is configured to maintain a first pressure of the first environment substantially equal to atmospheric pressure; and

the analytical instrument is configured to maintain a second pressure of the second environment lower than the first pressure.

15 . The analytical instrument of claim 10 , configured to generate a gas velocity through the gas conduit from about 1 m/s to about 50 m/s.

16 . The ion separator of claim 2 , wherein the aperture is formed through a material portion of the gas conduit, and wherein the active surface is coupled with material portion via the standoff.

17 . The analytical instrument of claim 11 , wherein the aperture is formed through a material portion of the gas conduit, and wherein the active surface is coupled with material portion via the standoff.