Image sensing device and method of operating the same
An image sensing device capable of detecting a distance to a target object according to a time-of-flight (TOF) method is disclosed. The image sensing device includes a pixel configured to generate a pulse signal based on photons reflected from a target object, the pixel including a light receiving element of which sensitivity is controlled according to a quenching control voltage, a time-to-digital converter (TDC) configured to count the number of the photons to output a photon counting value, and a controller configured to adjust a level of the quenching control voltage based on the photon counting value.
1 . An image sensing device comprising:
a pixel configured to generate a pulse signal based on photons reflected from a target object, the pixel including a light receiving element of which sensitivity is controlled according to a quenching control voltage;
a time-to-digital converter configured to count a number of the photons to output a photon counting value; and
a controller configured to adjust a level of the quenching control voltage based on the photon counting value,
wherein the controller is configured to:
control, when the photon counting value is equal to or greater than a preset threshold value, the sensitivity of the light receiving element to be a first sensitivity by adjusting the level of the quenching control voltage to a first level; and
control, when the photon counting value is less than the threshold value, the sensitivity of the light receiving element to be a second sensitivity by adjusting the level of the quenching control voltage to a second level higher than the first level.
2 . The image sensing device according to claim 1 , wherein the light receiving element includes a single-photon avalanche diode (SPAD) element.
3 . The image sensing device according to claim 1 , wherein the pixel includes:
a single-photon avalanche diode (SPAD) element configured to generate the pulse signal through a sensing node as avalanche breakdown is triggered by a single photon of incident light; and
a quenching circuit configured to perform a quenching operation by controlling a reverse bias voltage applied to the SPAD element.
4 . The image sensing device according to claim 3 , wherein the pixel further includes a precharge circuit configured to precharge the sensing node to a level of a power supply voltage according to an enable signal.
5 . The image sensing device according to claim 4 , wherein the quenching circuit and the precharge circuit are configured to operate complementarily to each other.
6 . The image sensing device according to claim 3 , wherein the SPAD element includes:
a cathode terminal connected to an input terminal of a first bias voltage; and
an anode terminal connected to the sensing node.
7 . The image sensing device according to claim 3 , wherein the quenching circuit includes a quenching transistor connected between the sensing node and an input terminal of a second bias voltage and configured to receive the quenching control voltage through a gate terminal thereof.
8 . The image sensing device according to claim 7 , wherein the quenching circuit is configured to control sensitivity of the SPAD element by adjusting resistance of the quenching transistor to change a quenching speed of a voltage level of the sensing node.
9 . The image sensing device according to claim 1 , further comprising a time-to-digital converter memory configured to store the photon counting value.
10 . The image sensing device according to claim 1 , wherein the controller is configured to generate an exposure control signal for controlling an exposure time of data acquired within one frame according to the photon counting value.
11 . The image sensing device according to claim 10 , wherein the controller is configured to:
control, when the photon counting value is equal to or greater than the threshold value, the exposure time to be a first time by adjusting the exposure control signal to the first level; and
control, when the photon counting value is less than the threshold value, the exposure time to be a second time longer than the first time by adjusting the exposure control signal to the second level.
12 . The image sensing device according to claim 10 , wherein the controller is configured to:
preset a reference value for a noise level; and
deactivate the exposure control signal and control the quenching control voltage, when the noise level is higher than the reference value.
13 . The image sensing device according to claim 1 , wherein the controller is configured to generate an optical power control signal for controlling optical power of emitted light applied to the target object according to the photon counting value.
14 . The image sensing device according to claim 13 , wherein the controller is configured to:
control, when the photon counting value is equal to or greater than the threshold value, the optical power of the emitted light to be a first intensity according to the optical power control signal; and
control, when the photon counting value is less than the threshold value, the optical power of the emitted light to be a second intensity stronger than the first intensity according to the optical power control signal.
15 . An image sensing device comprising:
a light receiving element connected between an input terminal of a first bias voltage and a sensing node;
a quenching circuit connected between the sensing node and an input terminal of a second bias voltage and configured to adjust a resistance value thereof based on a quenching control voltage; and
a controller configured to control the quenching control voltage based on a counting value of photons reflected from a target object,
wherein the controller is configured to:
control, when the counting value is equal to or greater than a preset threshold value, a sensitivity of the light receiving element to be a first sensitivity by adjusting a level of the quenching control voltage to a first level; and
control, when the counting value is less than the threshold value, the sensitivity of the light receiving element to be a second sensitivity by adjusting a level of the quenching control voltage to a second level higher than the first level.
16 . The image sensing device according to claim 15 , further comprising a precharge circuit configured to precharge the sensing node to a level of a power supply voltage according to an enable signal.
17 . The image sensing device according to claim 15 , wherein the light receiving element includes a single-photon avalanche diode element.
18 . A method of operating an image sensing device with a pixel including a light receiving element connected to a sensing node, the method comprising:
generating a pulse signal based on photons reflected from a target object;
counting a number of the photons to output a photon counting value;
generating a quenching control voltage having a level adjusted based on the photon counting value; and
adjusting a quenching speed of a voltage level of the sensing node according to the level of the quenching control voltage to control sensitivity of the light receiving element,
wherein controlling the sensitivity of the light receiving element comprises:
controlling the sensitivity of the light receiving element to be a first sensitivity by adjusting the level of the quenching control voltage to a first level when the photon counting value is equal to or greater than a preset threshold value; and
controlling the sensitivity of the light receiving element to be a second sensitivity by adjusting the level of the quenching control voltage to a second level higher than the first level when the photon counting value is less than the preset threshold value.