IP Library Granted Patent US 12685196
Granted Patent B2
US 12685196 · App. 18/474,336 · Granted Jul 14, 2026

Strip substrate and semiconductor package including the same

Inventors: Jinmo Kwon (Suwon-si, KR); Jitaek Oh (Suwon-si, KR); Hyoungjoon Kim (Suwon-si, KR)
Assignee: Samsung Electronics Co., Ltd.
H10W70/65H10W70/05H10W70/685H10W74/15H10W90/724H10W90/734
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Quick Facts
Patent No.
US 12685196
App. No.
18/474,336
Granted
Jul 14, 2026
Kind
B2
Abstract

A strip substrate comprises a dielectric layer comprising a unit region and a saw line region, a saw line pattern on the saw line region, a conductive dummy pattern extending from the saw line pattern and toward the unit region, and power/ground patterns on the unit region. The power/ground pattern includes a first lateral surface that extends in a first direction and is proximate to the saw line pattern, a second lateral surface that extends in a second direction and is proximate to the conductive dummy pattern, and a third lateral surface that connects the first lateral surface and the second lateral surface.

Claims (72)

1 . A strip substrate, comprising:

a dielectric layer comprising a unit region and a saw line region;

a saw line pattern on the saw line region of the dielectric layer;

a conductive dummy pattern that extends from the saw line pattern and toward the unit region; and

a plurality of power/ground patterns on the unit region,

wherein the conductive dummy pattern is between the plurality of power/ground patterns, and

wherein each of the plurality of power/ground patterns includes:

a first lateral surface that extends in a first direction and is proximate to the saw line pattern;

a second lateral surface that extends in a second direction and is proximate to the conductive dummy pattern, wherein the second direction intersects the first direction; and

a third lateral surface that connects the first lateral surface and the second lateral surface to each other.

2 . The strip substrate of claim 1 , wherein a distance between the third lateral surface and the conductive dummy pattern increases as a distance between the third lateral surface and the saw line pattern decreases.

3 . The strip substrate of claim 1 , wherein the third lateral surface includes a flat surface or a concave surface.

4 . The strip substrate of claim 3 , wherein:

the third lateral surface includes the flat surface, and

an angle between the third lateral surface and one of the first lateral surface and the second lateral surface is in a range of about 120 degrees to about 150 degrees.

5 . The strip substrate of claim 1 , wherein the third lateral surface includes:

a fourth lateral surface connected to the first lateral surface and parallel to the second lateral surface; and

a fifth lateral surface connected to the second lateral surface and the fourth lateral surface and parallel to the first lateral surface,

wherein a distance between the conductive dummy pattern and the fourth lateral surface is greater than a distance between the conductive dummy pattern and the second lateral surface.

6 . The strip substrate of claim 1 , wherein each of the plurality of power/ground patterns include a metal plate pattern.

7 . The strip substrate of claim 1 , wherein:

a distance between the saw line pattern and the first lateral surface of a power/ground pattern from among the plurality of power/ground patterns is in a range of about 50 micrometers to about 150 micrometers, and

a distance between the conductive dummy pattern and the second lateral surface of the power/ground pattern is in a range of about 10 micrometers to about 30 micrometers.

8 . The strip substrate of claim 1 , wherein a distance between the third lateral surface and the conductive dummy pattern is greater than or equal to a distance between the second lateral surface and the conductive dummy pattern.

9 . The strip substrate of claim 1 , further comprising:

a plurality of solder pads on the unit region of the dielectric layer, and wherein the plurality of solder pads are laterally arranged on and connected to the conductive dummy patterns; and

a dielectric protection layer on the dielectric layer, the saw line pattern, and the conductive dummy patterns.

10 . A semiconductor package, comprising:

a package substrate comprising a lateral surface, a top surface, and a bottom surface opposite to the top surface;

a semiconductor chip on the top surface of the package substrate; and

a solder terminal on the bottom surface of the package substrate,

wherein the package substrate includes:

a dielectric layer;

a solder pad between the solder terminal and the dielectric layer;

a conductive dummy pattern on the dielectric layer, wherein the conductive dummy pattern extends from the solder pad toward the lateral surface of the package substrate, and wherein a portion of the conductive dummy pattern is exposed at the lateral surface of the package substrate; and

a plurality of power/ground patterns proximate to the lateral surface and on the dielectric layer,

wherein the conductive dummy pattern is between the plurality of power/ground patterns,

wherein each of the plurality of power/ground patterns includes:

a first part; and

a second part between the first part and the lateral surface of the package substrate,

wherein a first distance between the first part and the conductive dummy pattern in a first direction is constant,

wherein a second distance between the second part and the conductive dummy pattern in a second direction increases as a third distance between the second part and the lateral surface of the package substrate in the first direction decreases, and

wherein the second direction intersects the first direction.

11 . The semiconductor package of claim 10 , wherein the second distance is greater than the first distance.

12 . The semiconductor package of claim 10 , wherein

the first distance is in a range of about 10 micrometers to about 30 micrometers, and

the second distance is greater than or equal to the first distance.

13 . The semiconductor package of claim 10 , wherein the third distance is in a range of about 50 micrometers to about 150 micrometers.

14 . The semiconductor package of claim 10 , wherein:

the first part comprises a first lateral surface,

the second part comprises a second lateral surface, and

an angle between the second lateral surface and the first lateral surface is in a range of about 120 degrees to about 150 degrees.

15 . The semiconductor package of claim 14 , wherein the second lateral surface includes a substantially flat surface or a concave surface.

16 . The semiconductor package of claim 14 , wherein a power/ground pattern from among the plurality of power/ground patterns further includes a third part between the first part and the second part,

wherein the third part has a third lateral surface, and

wherein the third lateral surface is inclined to the first lateral surface and the second lateral surface.

17 . The semiconductor package of claim 10 , wherein the power/ground pattern comprises a metal plate pattern.

18 . A strip substrate, comprising:

a dielectric layer;

a saw line pattern that extends in a first direction on the dielectric layer;

a plurality of metal plate patterns spaced apart from each other in the first direction;

a solder pad on the dielectric layer;

a conductive dummy pattern that extends from the solder pad and between the plurality of metal plate patterns, wherein the conductive dummy pattern is connected to the saw line pattern; and

a dielectric protection layer on the dielectric layer, the saw line pattern, the plurality of metal plate patterns, and the conductive dummy pattern,

wherein a first distance between the plurality of metal plate patterns and the conductive dummy pattern is in a range of about 10 micrometers to about 30 micrometers,

wherein a second distance between the plurality of metal plate patterns and the saw line pattern is in a range of about 50 micrometers to about 150 micrometers, and

wherein each of the plurality of metal plate patterns comprises a chamfer shape at a corner proximate to an intersection of the saw line pattern and the conductive dummy pattern.

19 . The strip substrate of claim 18 , wherein each of the plurality of metal plate patterns includes:

a first lateral surface that extends along the saw line pattern;

a second lateral surface that extends along the conductive dummy pattern; and

a third lateral surface inclined to each of the first lateral surface and the second lateral surface.

20 . The strip substrate of claim 19 , wherein the third lateral surface includes a substantially flat surface or a concave surface.