IP Library Granted Patent US 12687511
Granted Patent B2
US 12687511 · App. 18/264,575 · Granted Jul 21, 2026

Electronic device

Inventor: Jun Okamoto (Yamanashi, JP)
Assignee: FANUC CORPORATION
G01N25/18H10W40/00H10W40/22H10W90/736
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Quick Facts
Patent No.
US 12687511
App. No.
18/264,575
Granted
Jul 21, 2026
Kind
B2
Abstract

An electronic device according to one embodiment of the present disclosure is capable of continuously ensuring heat conduction by a heat conductive connection body and comprises: a semiconductor element; a heat dissipation member; a heat conductive connection body for connecting the semiconductor element and the heat dissipation member to each other in a heat conductive manner; a power detection unit for detecting power consumption of the semiconductor element; an element temperature detection unit for detecting the temperature of the semiconductor element; an ambient temperature detection unit for detecting the ambient temperature of the heat dissipation member; and a heat resistance calculation unit for calculating heat resistance of the heat conductive connection body on the basis of a detection value of the power detection unit, a detection value of the element temperature detection unit, and a detection value of the ambient temperature detection unit.

Claims (25)

1 . An electronic device comprising:

a semiconductor element;

a heat dissipation member;

a heat conductive connection body configured to connect the semiconductor element and the heat dissipation member to each other in a heat conductive manner;

a power detection unit configured to detect power consumption of the semiconductor element;

an element temperature detection unit configured to detect a temperature of the semiconductor element;

an ambient temperature detection unit configured to detect an ambient temperature of the heat dissipation member;

a heat resistance calculation unit configured to calculate a heat resistance of the heat conductive connection body on the basis of a detection value of the power detection unit, a detection value of the element temperature detection unit, and a detection value of the ambient temperature detection unit;

a fan for forcibly ventilating an atmosphere of the heat dissipation member; and

a fan setting unit configured to maintain the rotational speed of the fan at a set rotational speed that is set in advance; wherein

the heat resistance calculation unit calculates the heat resistance after the detection value of the element temperature detection unit or the ambient temperature detection unit has stabilized after the fan setting unit has maintained the rotational speed of the fan at the set rotational speed; and

the heat resistance calculation unit calculates the heat resistance while taking a rotational speed of the fan into consideration.

2 . The electronic device according to claim 1 , further comprising a deterioration determination unit configured to determine a deterioration of the heat conductive connection body by comparing the heat resistance calculated by the heat resistance calculation unit with a reference value.

3 . The electronic device according to claim 1 , further comprising an element setting unit configured to maintain the power consumption of the semiconductor element at a value that is set in advance.

4 . The electronic device according to claim 1 , wherein the fan setting unit maintains the rotational speed of the fan at a plurality of the set rotational speeds in order, and

the heat resistance calculation unit calculates the heat resistance while taking the detection values of the element temperature detection unit and the ambient temperature detection unit at the plurality of set rotational speeds into consideration.

5 . An electronic device comprising:

a semiconductor element;

a heat dissipation member;

a heat conductive connection body configured to connect the semiconductor element and the heat dissipation member to each other in a heat conductive manner;

a power detection unit configured to detect power consumption of the semiconductor element;

an element temperature detection unit configured to detect a temperature of the semiconductor element;

an ambient temperature detection unit configured to detect an ambient temperature of the heat dissipation member;

a heat resistance calculation unit configured to calculate a heat resistance of the heat conductive connection body on the basis of a detection value of the power detection unit, a detection value of the element temperature detection unit, and a detection value of the ambient temperature detection unit; and

a calculation execution control unit configured to cause the calculation of the heat resistance by the heat resistance calculation unit to be executed when the electronic device is not operating.