Verify failbit count circuit, memory device, memory system and method
A memory device includes a memory array and a count circuit coupled to the memory array. The count circuit includes a verify standard selector configured to output a verify standard signal, a bit counter circuit coupled to the verify standard selector and configured to receive the verify standard signal and output at least one comparison result, and a code converter coupled to the bit counter circuit.
1 . A memory device, comprising:
a memory array; and
a count circuit coupled to the memory array, wherein the count circuit comprises:
a verify standard selector configured to output a verify standard signal;
a bit counter circuit coupled to the verify standard selector and configured to receive the verify standard signal and output at least one comparison result, wherein the bit counter circuit comprises:
a highest bit counter coupled to the verify standard selector and configured to receive the verify standard signal and output a first enable signal and a first comparison result of the at least one comparison result, and
a lowest bit counter coupled to the highest bit counter and configured to receive the first enable signal and output a second enable signal and a second comparison result of the at least one comparison result; and
a code converter coupled to the bit counter circuit.
2 . The memory device of claim 1 , wherein the verify standard selector comprises at least one inverter.
3 . The memory device of claim 2 , wherein both an input terminal and an output terminal of the verify standard selector are coupled to the bit counter circuit.
4 . The memory device of claim 2 , wherein the verify standard selector is configured to select one from at least two verify standards with different magnitudes as the verify standard signal.
5 . The memory device of claim 1 , wherein the bit counter circuit further comprises:
at least one intermediate bit counter, a first intermediate bit counter of the at least one intermediate bit counter being coupled to the lowest bit counter and configured to receive the second enable signal and output a third enable signal and a third comparison result of the at least one comparison result.
6 . The memory device of claim 5 , wherein the highest bit counter comprises:
a first comparator configured to receive the verify standard signal and a verify failbit signal and output the first comparison result; and
a first inverter coupled to the first comparator and configured to:
receive the first comparison result; and
output the first enable signal based on the first comparison result, the first enable signal being an inverse signal of the first comparison result.
7 . The memory device of claim 5 , wherein the lowest bit counter comprises:
a first control circuit coupled to the highest bit counter and configured to receive the first enable signal and control a switch between an enabled status and a disabled status of the lowest bit counter based on the first enable signal; and
a second comparator configured to:
receive a verify failbit signal and a first reference signal; and
output the second comparison result and the second enable signal, the second enable signal being in phase with the second comparison result.
8 . The memory device of claim 7 , wherein each of the at least one intermediate bit counter has a same structure as the lowest bit counter.
9 . The memory device of claim 5 , wherein intermediate bit counters are connected sequentially based on their respective reference signals from low to high.
10 . The memory device of claim 1 , further comprising:
an accumulator coupled to the code converter and configured to accumulate a plurality of binary codes obtained from the code converter.
11 . A method of operating a memory device, comprising:
selecting one from at least two verify standards with different magnitudes and outputting a verify standard signal;
in response to receiving the verify standard signal, outputting at least one comparison result, comprising:
comparing a verify failbit signal with the verify standard signal to generate a first comparison result,
outputting a first enable signal based on the first comparison result,
in response to the first enable signal, comparing the verify failbit signal with a first reference signal to generate a second comparison result, and
outputting a second enable signal based on the second comparison result; and
converting the at least one comparison result into a binary code.
12 . The method of claim 11 , further comprising accumulating a plurality of binary codes.
13 . The method of claim 11 , wherein in response to receiving the verify standard signal, outputting at least one comparison result further comprises:
in response to the second enable signal, comparing the verify failbit signal with a second reference signal to generate a third comparison result.
14 . A memory system, comprising:
a memory device, comprising:
a memory array; and
a count circuit coupled to the memory array, wherein the count circuit comprises:
a verify standard selector configured to output a verify standard signal;
a bit counter circuit coupled to the verify standard selector and configured to receive the verify standard signal and output at least one comparison result, wherein the bit counter circuit comprises:
a highest bit counter coupled to the verify standard selector and configured to receive the verify standard signal and output a first enable signal and a first comparison result of the at least one comparison result, and
a lowest bit counter coupled to the highest bit counter and configured to receive the first enable signal and output a second enable signal and a second comparison result of the at least one comparison result; and
a code converter coupled to the bit counter circuit; and
a memory controller coupled to the memory device and configured to control the memory device.
15 . The memory system of claim 14 , wherein the verify standard selector comprises at least one inverter.
16 . The memory system of claim 15 , wherein both an input terminal and an output terminal of the verify standard selector are coupled to the bit counter circuit.
17 . The memory system of claim 15 , wherein the verify standard selector is configured to select one from at least two verify standards with different magnitudes as the verify standard signal.
18 . The memory system of claim 14 , wherein the bit counter circuit further comprises:
at least one intermediate bit counter, a first intermediate bit counter of the at least one intermediate bit counter being coupled to the lowest bit counter and configured to receive the second enable signal and output a third enable signal and a third comparison result of the at least one comparison result.
19 . The memory system of claim 18 , wherein each of the at least one intermediate bit counter has a same structure as the lowest bit counter.
20 . The memory system of claim 14 , wherein the memory device further comprises an accumulator coupled to the code converter and configured to accumulate a plurality of binary codes obtained from the code converter.