Thin film deposition method
Provided is a method for depositing a thin film, which is performed to deposit a thin film on a substrate. A method for depositing a thin film includes supplying a source gas together with a first diffusion gas onto a substrate provided in a process space, and supplying a reactant gas together with a second diffusion gas onto the substrate to continuous with the supplying of the source gas. The first diffusion gas and source gas and the second diffusion gas and reactant gas are supplied onto the substrate through paths different from each other.
1 . A method for depositing a thin film, the method comprising:
supplying a source gas together with a first diffusion gas onto a substrate provided in a process space; and
supplying a reactant gas together with a second diffusion gas onto the substrate without supplying a purge gas after supplying the source gas,
wherein the first diffusion gas and the source gas, and the second diffusion gas and the reactant gas are supplied onto the substrate through paths different from each other.
2 . The method for depositing a thin film of claim 1 , wherein the first diffusion gas is mixed with the source gas in a path through which the source gas is supplied, and
the second diffusion gas is mixed with the reactant gas in a path through which the reactant gas is supplied.
3 . The method for depositing a thin film of claim 1 , wherein, in the supplying of the source gas, the second diffusion gas is supplied together with the first diffusion gas and the source gas onto the substrate, and
in the supplying of the reactant gas, the first diffusion gas is supplied together with the second diffusion gas and the reactant gas onto the substrate.
4 . The method for depositing a thin film of claim 3 , wherein, in the supplying of the source gas and the supplying of the reactant gas, a supply amount of the first diffusion gas is differently controlled.
5 . The method for depositing a thin film of claim 4 , wherein the supply amount of the first diffusion gas in the supplying of the source gas is controlled to be less than the supply amount of the first diffusion gas in the supplying of the reactant gas.
6 . The method for depositing a thin film of claim 1 , wherein, in the supplying of the reactant gas, power is applied to generate plasma in the process space.
7 . The method for depositing a thin film of claim 1 , wherein a process cycle comprising the supplying of the source gas and the supplying of the reactant gas is performed several times.
8 . The method for depositing a thin film of claim 1 , wherein each of the first diffusion gas and the second diffusion gas comprises an inert gas.
9 . The method for depositing a thin film of claim 1 , wherein the source gas comprises a gas containing at least one of indium (In), gallium (Ga), or zinc (Zn),
the reactant gas comprises a gas containing oxygen (O).
10 . The method for depositing a thin film of claim 1 , wherein, in the supplying of the source gas, a supply amount of the first diffusion gas is controlled to be different from a supply amount of the second diffusion gas.
11 . A method for depositing a thin film, the method comprising:
a first process of supplying a first diffusion gas and a source gas through a first gas supply path formed in a gas injection part and supplying a second diffusion gas through a second gas supply path formed in the gas injection part; and
a second process of supplying the first diffusion gas through the first gas supply path and supplying the second diffusion gas and the reactant gas through the second gas supply path,
wherein a process cycle in which the second process is performed without supplying a purge gas after the first process is performed repeatedly.
12 . The method for depositing a thin film of claim 10 , wherein, in the supplying of the source gas, a supply amount of the first diffusion gas is controlled to be relatively less than a supply amount of the second diffusion gas.