Wavelength measurement chip and wavelength measurement system
An optical chip and a wavelength measurement system are disclosed. The optical chip includes an optical splitter configured to receive a first electromagnetic wave signal, and divide the first electromagnetic wave signal into two electromagnetic wave signals to be output. The optical chip also includes a first interferometer and a second interferometer, where the optical splitter, the first interferometer, and the second interferometer are disposed in sequential order. The first interferometer and the second interferometer are configured to receive one of the two electromagnetic wave signals, so that the one electromagnetic wave signal is interfered twice, to output a plurality of second electromagnetic wave signals. Another wave signal of the two electromagnetic wave signals is output as a third electromagnetic wave signal, and the second electromagnetic wave signal and the third electromagnetic wave signal may be used to obtain wavelength information of the first electromagnetic wave signal through optical-electrical conversion.
1 . An optical chip, comprising:
an optical splitter configured to receive a first electromagnetic wave signal and divide the first electromagnetic wave signal into two electromagnetic wave signals to be output; and
a first interferometer and a second interferometer, wherein:
the optical splitter, the first interferometer, and the second interferometer are disposed in sequential order,
the first interferometer and the second interferometer are configured to receive one of the two electromagnetic wave signals so that the one electromagnetic wave signal is interfered by each of the first interferometer and the second interferometer to output a plurality of second electromagnetic wave signals, wherein the plurality of second electromagnetic wave signals include more than two second electromagnetic wave signals to achieve better accuracy, and a preset phase shift between every two adjacent second electromagnetic wave signals is the same;
wherein another one of the two electromagnetic wave signals is output as a third electromagnetic wave signal;
wherein the optical chip defines a first path and a second path, and the two electromagnetic wave signals are respectively transmitted along the first path and the second path; and
wherein the optical splitter divides the first electromagnetic wave signal into the two electromagnetic wave signals according to a preset proportion to be output, wherein the preset proportion is determined based on optical losses of the first path and the second path.
2 . The optical chip according to claim 1 , wherein a proportion of the electromagnetic wave signal propagated along the first path in the first electromagnetic wave signal is greater than a proportion of the electromagnetic wave signal propagated along the second path in the first electromagnetic wave.
3 . The optical chip according to claim 2 , wherein the first path comprises the first interferometer and the second interferometer.
4 . The optical chip according to claim 1 , wherein the first interferometer is a Mach-Zehnder interferometer, and the second interferometer is a multimode interferometer.
5 . The optical chip according to claim 4 , wherein the preset phase shift between every two adjacent second electromagnetic wave signals in the plurality of second electromagnetic wave signals can be adjusted by adjusting a quantity of the plurality of second electromagnetic wave signals output by the second interferometer.
6 . The optical chip according to claim 5 , wherein the second interferometer outputs a quantity of four of the second electromagnetic wave signals, and a preset phase shift between the four electromagnetic wave signals is π/2.
7 . The optical chip according to claim 1 , further comprising a coupler, wherein the coupler is configured to receive the first electromagnetic wave and transmit the first electromagnetic wave to the optical splitter.
8 . The optical chip according to claim 1 , further comprising a high-order mode filter, wherein the high-order mode filter is disposed between the optical splitter and the first interferometer.
9 . The optical chip according to claim 1 , wherein the optical splitter, the first interferometer, and the second interferometer form a substrate.
10 . A wavelength measurement system, comprising:
an optical chip comprising: an optical splitter configured to receive a first electromagnetic wave signal, and divide the first electromagnetic wave signal into two electromagnetic wave signals to be output; a first interferometer and a second interferometer, wherein the optical splitter, the first interferometer, and the second interferometer are disposed in sequential order, and the first interferometer and the second interferometer are configured to receive one of the two electromagnetic wave signals, so that the one electromagnetic wave signal is interfered by each of the first interferometer and the second interferometer to output a plurality of second electromagnetic wave signals, wherein another one of the two electromagnetic wave signals is output as a third electromagnetic wave signal, wherein the plurality of second electromagnetic wave signals include more than two second electromagnetic wave signals to achieve better accuracy, and a preset phase shift between every two adjacent second electromagnetic wave signals is the same;
a photoelectric detector coupled to the wavelength measurement chip, and configured to receive a second electromagnetic wave signal and a third electromagnetic wave signal and convert the second electromagnetic wave signal and the third electromagnetic wave signal into electrical signals; and
a processor electrically connected to the photoelectric detector, and configured to obtain wavelength information of the first electromagnetic wave signal based on the electrical signals;
wherein the optical chip defines a first path and a second path, and the two electromagnetic wave signals are respectively transmitted along the first path and the second path; and
wherein the optical splitter divides the first electromagnetic wave signal into the two electromagnetic wave signals according to a preset proportion to be output, wherein the preset proportion is determined based on optical losses of the first path and the second path.
11 . The wavelength measurement system according to claim 10 , wherein the processor is configured to obtain a plurality of wavelength values based on the plurality of second electromagnetic wave signals output by the second interferometer, and determine, from the plurality of wavelength values based on the third electromagnetic wave signal output by the optical splitter, a wavelength value of the first electromagnetic wave signal.
12 . The wavelength measurement system according to claim 10 , wherein the photoelectric detector has a sensing zone, the wavelength measurement chip defines a coupling plane for outputting the second electromagnetic wave signal and the third electromagnetic wave signal, and the coupling plane is parallel to a plane on which the sensing zone is disposed.
13 . The wavelength measurement system according to claim 10 , wherein the photoelectric detector has a sensing zone, and a plane on which the sensing zone is disposed is parallel to a plane on which the second electromagnetic wave signal and the third electromagnetic wave signal are propagated on the wavelength measurement chip.
14 . The wavelength measurement system according to claim 10 , wherein a proportion of the electromagnetic wave signal propagated along the first path in the first electromagnetic wave signal is greater than a proportion of the electromagnetic wave signal propagated along the second path in the first electromagnetic wave.
15 . The wavelength measurement system according to claim 10 , wherein the first path comprises the first interferometer and the second interferometer.
16 . The wavelength measurement system according to claim 10 , wherein the first interferometer is a Mach-Zehnder interferometer, and the second interferometer is a multimode interferometer.
17 . The wavelength measurement system according to claim 16 , wherein the preset phase shift between the plurality of second electromagnetic wave signals can be adjusted by adjusting a quantity of the plurality of second electromagnetic wave signals output by the second interferometer.
18 . The wavelength measurement system according to claim 17 , wherein the second interferometer outputs a quantity of four of the second electromagnetic wave signals, and a preset phase shift between the four electromagnetic wave signals is π/2.
19 . The wavelength measurement system according to claim 10 , further comprising a coupler, wherein the coupler is configured to receive the first electromagnetic wave and transmit the first electromagnetic wave to the optical splitter.
20 . The wavelength measurement system according to claim 10 , further comprising a high-order mode filter, wherein the high-order mode filter is coupled between the optical splitter and the first interferometer.