Test apparatus
A test apparatus includes a support base that supports an undersurface of a chip, a pressing unit that presses the chip supported by the support base, and a load measuring instrument that measures a load applied when the pressing unit presses the chip. The pressing unit includes a first test indenter that performs a three-point bending test by pressing the chip supported by the support base and a second test indenter that performs a four-point bending test by pressing the chip supported by the support base, and the first test indenter and the second test indenter are configured to be selectable when the chip supported by the support base is pressed by the pressing unit.
1 . A test apparatus comprising:
a support base configured to support a lower surface of a test piece;
a pressing unit configured to press the test piece supported by the support base; and
a load measuring instrument configured to measure a load applied when the pressing unit presses the test piece;
the pressing unit including
a first test indenter configured to perform a first test by pressing a first test piece supported by the support base, and
a second test indenter configured to perform a second test different from the first test by pressing a second test piece supported by the support base; and
the first test indenter and the second test indenter being configured to be selectable when the first test piece or the second test piece supported by the support base is pressed by the pressing unit.
2 . The test apparatus according to claim 1 , wherein
the support base includes a pair of supporting units that are arranged in such a manner as to have a predetermined interval from each other and that each extend in a first direction to support the lower surface of the test piece,
the first test indenter includes a first end portion that abuts against and presses an upper surface of the first test piece supported by the supporting units and that extends in the first direction, and
the second test indenter includes a second end portion and a third end portion that each abut against and press an upper surface of the second test piece supported by the supporting units and that extend in the first direction, the third end portion being adjacent to the second end portion.
3 . The test apparatus according to claim 2 , wherein
the first test indenter and the second test indenter are juxtaposed to each other in the first direction.
4 . The test apparatus according to claim 3 , wherein
the support base includes a first test region on which the first test piece to be pressed by the first test indenter is to be mounted and a second test region that is adjacent to the first test region in the first direction and on which the second test piece to be pressed by the second test indenter is to be mounted, and
the first test region faces the first test indenter, and the second test region faces the second test indenter.
5 . The test apparatus according to claim 4 , further comprising:
a transporting unit that has a holding surface for holding the first test piece and the second test piece and that mounts the first test piece and the second test piece thus held onto the support base,
wherein the transporting unit transports the first test piece to be subjected to the first test to the first test region and transports the second test piece to be subjected to the second test to the second test region.