IP Library Granted Patent US 12693229
Granted Patent B2
US 12693229 · App. 18/389,522 · Granted Jul 28, 2026

Inspection apparatus

Inventors: Akifumi Sangu (Yongin-si, KR); Se-Kwang Han (Yongin-si, KR); Hyeran Ko (Yongin-si, KR); Jaemin Son (Yongin-si, KR)
Assignee: SAMSUNG DISPLAY CO., LTD.
G01N21/8806G01N21/94
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Quick Facts
Patent No.
US 12693229
App. No.
18/389,522
Granted
Jul 28, 2026
Kind
B2
Abstract

An inspection apparatus includes a light source which radiates a beam, a first lens disposed between the inspection object and the light source with a first opening defined therethrough in a first direction, a second lens disposed between the inspection object and the first lens with a second opening defined therethrough in the first direction to overlap the first opening, an inspection unit disposed to be spaced apart from the inspection object with the first lens interposed therebetween and including an incidence portion disposed to overlap the first opening and the second opening on a plane, and a driving unit which adjusts a distance between the first lens and the inspection object or a distance between the second lens and the inspection object.

Claims (49)

1 . An inspection apparatus comprising:

a light source disposed to be spaced apart from an inspection object in a first direction, wherein the light source radiates a beam;

a first lens disposed between the inspection object and the light source, wherein the first lens is provided with a first opening defined therethrough in the first direction;

a second lens disposed between the inspection object and the first lens, wherein the second lens is provided with a second opening defined therethrough in the first direction to overlap the first opening;

an inspection unit disposed to be spaced apart from the inspection object with the first lens interposed therebetween, wherein the inspection unit comprises an incidence portion disposed to overlap the first opening and the second opening on a plane; and

a driving unit which adjusts a first distance between the first lens and the inspection object or a second distance between the second lens and the inspection object.

2 . The inspection apparatus of claim 1 , wherein at least one selected from the first lens and the second lens comprises a convex lens.

3 . The inspection apparatus of claim 1 , wherein at least one selected from the first lens and the second lens comprises an aspherical lens.

4 . The inspection apparatus of claim 1 , wherein at least one selected from the first lens and the second lens comprises a Fresnel lens.

5 . The inspection apparatus of claim 1 , wherein at least one selected from the first lens and the second lens comprises:

a plurality of first sub-lenses disposed along a periphery of the first opening or the second opening and each having a first radius of curvature; and

a plurality of second sub-lenses disposed alternately with the plurality of first sub-lenses along a periphery of the first opening or the second opening and each having a second radius of curvature.

6 . The inspection apparatus of claim 1 , wherein a radius of the first opening is smaller than or equal to a radius of the second opening.

7 . The inspection apparatus of claim 1 , wherein:

the light source is provided in plurality; and

a plurality of light sources comprises a plurality of first light sources arranged to be spaced apart from a center of the first opening by a first separation distance and a plurality of second light sources arranged to be spaced apart from the center of the first opening by a second separation distance,

wherein the first separation distance and the second separation distance are greater than a radius of the first opening.

8 . The inspection apparatus of claim 7 , wherein:

the first separation distance and the second separation distance are the same as each other; and

the first light sources and the second light sources are alternately arranged with each other.

9 . The inspection apparatus of claim 7 , wherein the second separation distance is greater than the first separation distance.

10 . The inspection apparatus of claim 7 , wherein the first light sources and the second light sources are disposed to be aligned with each other when viewed from the center of the first opening.

11 . The inspection apparatus of claim 8 , further comprising:

a control unit which controls an operation of the plurality of light sources,

wherein the control unit adjusts an emission angle of the beam or control a switch-on or switch-off operation of the plurality of light sources.

12 . An inspection apparatus comprising:

a light source disposed to be spaced apart from an inspection object in a first direction, wherein the light source radiates a beam;

a first lens disposed between the inspection object and the light source, wherein the first lens is provided with a first opening defined therethrough in the first direction;

a second lens disposed between the inspection object and the first lens, wherein the second lens is provided with a second opening defined therethrough in the first direction to overlap the first opening; and

an inspection unit disposed to be spaced apart from the inspection object with the first lens interposed therebetween, wherein the inspection unit comprises an incidence portion disposed to overlap the first opening and the second opening on a plane,

wherein at least one selected from the first lens and the second lens comprises:

a plurality of first sub-lenses disposed along a periphery of the first opening or the second opening and each having a first radius of curvature; and

a plurality of second sub-lenses disposed alternately with the first sub-lenses along the periphery of the first opening or the second opening and each having a second radius of curvature.

13 . The inspection apparatus of claim 12 , wherein:

the first sub-lenses of the first lens overlap the first sub-lenses of the second lens of the second lens, and the second sub-lenses of the first lens overlap the second sub-lenses of the second lens; or

the first sub-lenses of the first lens overlap the second sub-lenses of the second lens of the second lens, and the second sub-lenses of the first lens overlap the first sub-lenses of the second lens.

14 . The inspection apparatus of claim 12 , wherein the first radius of curvature and the second radius of curvature are different from each other.

15 . The inspection apparatus of claim 12 , wherein:

the light source is provided in plurality; and

a plurality of light sources overlap one of the first sub-lenses or the second sub-lenses.

16 . The inspection apparatus of claim 12 , wherein a radius of the first opening is smaller than or equal to a radius of the second opening.

17 . The inspection apparatus of claim 12 , further comprising:

a driving unit which rotates at least one selected from the first lens and the second lens around an axis in the first direction.

18 . The inspection apparatus of claim 17 , wherein the driving unit adjusts a first distance between the first lens and the inspection object or a second distance between the second lens and the inspection object.

19 . The inspection apparatus of claim 12 , wherein:

the light source is provided in plurality; and

a plurality of light sources comprises a plurality of first light sources arranged to be spaced apart from a center of the first opening by a first separation distance and a plurality of second light sources arranged to be spaced apart from the center of the first opening by a second separation distance,

wherein the first separation distance and the second separation distance are greater than a radius of the first opening.

20 . The inspection apparatus of claim 19 , wherein the first light sources and the second light sources are disposed to be aligned with each other when viewed from the center of the first opening.