IP Library Granted Patent US 12693446
Granted Patent B2
US 12693446 · App. 18/184,357 · Granted Jul 28, 2026

Inspection system

Inventor: Hiroki Mori (Kawasaki Kanagawa, JP)
Assignee: KABUSHIKI KAISHA TOSHIBA
G01V5/224
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Quick Facts
Patent No.
US 12693446
App. No.
18/184,357
Granted
Jul 28, 2026
Kind
B2
Abstract

According to one embodiment, an inspection system includes a first circuitry estimating whether an inspection target possesses a predetermined object, an antenna receiving a first electromagnetic wave, a second circuitry determining whether an electronic device is present in a predetermined range based on the first electromagnetic wave, and a third circuitry determining whether the inspection target possesses the predetermined object based on an estimation result of the first circuitry and a determination result of the second circuitry.

Claims (42)

1 . An inspection system comprising:

a first circuitry configured to estimate whether an inspection target possesses a predetermined object based on a received signal from a radar antenna;

an antenna device configured to receive a first electromagnetic wave from an electronic device present in a predetermined range;

a second circuitry configured to determine whether the electronic device is present in the predetermined range based on a received signal of the first electromagnetic wave received by the antenna device; and

a third circuitry configured to determine whether the inspection target possesses the predetermined object based on an estimation result of the first circuitry and a determination result of the second circuitry,

wherein:

an electromagnetic wave receiving range of the antenna device includes the predetermined range,

the radar antenna and the antenna device are provided on an antenna panel,

an electromagnetic wave transmitting-and-receiving area of the antenna panel corresponds to the predetermined range, and

the predetermined object is different from the electronic device.

2 . The inspection system of claim 1 , wherein the third circuitry is configured to determine that the inspection target does not possess the predetermined object when the first circuitry estimates that the inspection target possesses the predetermined object and the second circuitry determines that the electronic device is present in the predetermined range.

3 . The inspection system of claim 1 , wherein;

the first circuitry is configured to estimate a position of the predetermined object;

the second circuitry is configured to determine a position of the electronic device; and

the third circuitry is configured to determine that the inspection target does not possess the predetermined object when the first circuitry estimates that the inspection target possesses the predetermined object, the second circuitry determines that the electronic device is present in the predetermined range, and the position of the predetermined object estimated by the first circuitry is coincident with the position of the electronic device determined by the second circuitry.

4 . The inspection system of claim 1 , wherein the third circuitry is configured to determine that the inspection target possesses the predetermined object when the first circuitry estimates that the inspection target possesses the predetermined object and the second circuitry determines that the electronic device is not present in the predetermined range.

5 . The inspection system of claim 1 , wherein:

the first circuitry is configured to estimate a position of the predetermined object;

the second circuitry is configured to determine a position of the electronic device; and

the third circuitry is configured to determine that the inspection target possesses the predetermined object when the first circuitry estimates that the inspection target possesses the predetermined object, the second circuitry determines that the electronic device is present in the predetermined range, and the position of the predetermined object estimated by the first circuitry is not coincident with the position of the electronic device determined by the second circuitry.

6 . The inspection system of claim 1 , wherein the first circuitry comprises a circuitry provided in a radar which transmits a second electromagnetic wave to the inspection target and receives the second electromagnetic wave reflected by the inspection target.

7 . The inspection system of claim 1 , wherein the second circuitry is configured to analyze the received signal of the first electromagnetic wave received by the antenna device by a spectrum analysis or a sniffer analysis and determine whether the electronic device is present in the predetermined range based on an analysis result.

8 . The inspection system of claim 1 , wherein the first electromagnetic wave comprises an electromagnetic wave for transmitting data, sound, channel sounding, beacon, or device discovery.

9 . The inspection system of claim 1 , further comprising a fourth circuitry configured to transmit a request signal for causing the electronic device to transmit the first electromagnetic wave,

wherein the request signal comprises a beacon signal for causing the electronic device to transmit a probe request signal, or an advertisement signal for causing the electronic device to transmit a scan request signal.

10 . The inspection system of claim 1 , wherein;

the radar antenna is configured to transmit a second electromagnetic wave to the inspection target and receive the second electromagnetic wave reflected by the inspection target, and

the inspection system further comprises:

a storage configured to store a plurality of data sets each including a received signal of the second electromagnetic wave received by the radar antenna, the estimation result of the first circuitry, and the determination result of the second circuitry; and

a fifth circuitry configured to change the estimation result output from the first circuitry based on the data sets stored in the storage.

11 . The inspection system of claim 1 , wherein:

the antenna device comprises antennas arranged in a two-dimensional array, antennas arranged in a one-dimensional array or array antennas arranged in a two-dimensional array, and

each of the array antennas comprises a plurality of antennas.

12 . The inspection system of claim 1 , wherein the predetermined object comprises a metal object and powder.

13 . The inspection system of claim 1 , wherein the electronic device comprises a personal computer, a smartphone, a mobile phone, a mobile game console, a wristwatch with a built-in sensor, clothes with a built-in sensor, and a shoe with a built-in sensor.

14 . The inspection system of claim 1 , wherein:

the antenna device comprises antennas, and

positions of the antennas in a vertical direction are different from each other.

15 . The inspection system of claim 14 , wherein:

the second circuitry is configured to determine a position of the electronic device in the vertical direction based on levels of received signals of the antennas, and

the third circuitry is configured to determine whether the inspection target possesses the predetermined object based on the estimation result of the first circuitry, the determination result of the second circuitry, and the position of the electronic device determined by the second circuitry.

16 . The inspection system of claim 1 , wherein the first circuitry is configured to irradiate the first electromagnetic wave to the predetermined range by using the radar antenna, receive a reflected wave of the first electromagnetic wave from the inspection target, and estimate whether the inspection target possesses the predetermined object based on a level of the reflected wave.