Automated data erasure device and method
View Patent ↗An automated device and method for erasing data stored in non-volatile memories (M) of electronic devices (A), such as smartphones or tablets. The device uses an irradiation chamber ( 1 ) comprising at least one X-ray source (S) confined in a X-ray-tight enclosure, capable of receiving a plurality of electronic devices (A) that can be brought into the chamber ( 1 ) by a conveyor ( 2 ). A control unit (CU) controls the conveyor ( 2 ) and the X-ray source (S) to irradiate each electronic device (A) with controlled power and duration for erasing data stored in the non-volatile memories (M) of said electronic devices (A).
1 . An automated device for erasing data stored in non-volatile memories of electronic devices,
wherein said automated device comprises:
an irradiation chamber comprising at least one X-ray source confined in an X-ray- tight enclosure and capable of successively receiving said electronic devices to be brought into the chamber by a conveyor,
an identification device for recognizing a type of said electronic devices and/or a type of memory of each of said electronic devices to irradiate; and
a control unit controlling the conveyor and said X-ray source to irradiate said each of said electronic devices with controlled power and duration as a function of irradiation parameters corresponding to the device identified by said identification device, for erasing data contained in the non-volatile memories of said electronic devices without inducing physical damage or permanent modification of cells in said memories,
wherein said X-ray source generates an X-ray beam irradiating said devices along a principal axis that is inclined or inclinable with respect to a plane of said conveyor, and wherein an angle of the principal axis is determined by said control unit according to said identification.
2 . The device according to claim 1 ,
wherein the control unit controls the X-ray source by controlling the power and duration based on the type of memory contained in said electronic devices.
3 . The device according to claim 1 ,
wherein the control unit controls the irradiation power by controlling a supply voltage of the X-ray source between 175 and 300 kilovolts and a target intensity of the X-ray source between 250 and 900 microamperes.
4 . The device according to claim 1 ,
wherein the control unit controls the X-ray source to deliver irradiation for a duration of between 1 and 8 minutes.
5 . The device according to claim 1 ,
wherein the X-ray source comprises a target made of tungsten or molybdenum.
6 . The device according to claim 1 ,
wherein the X-ray source comprises a window made of beryllium or aluminum.
7 . The device according to claim 1 ,
wherein the distance between said X-ray source and the conveyor transporting the devices is between 2 and 5 centimeters.
8 . The device according to claim 1 ,
wherein the control unit controls the irradiation power by controlling a supply voltage of the X-ray source between 175 and 300 kilovolts and a target intensity of the X-ray source between 250 and 900 microamperes.
9 . The device according to claim 1 , wherein said control unit determines, by the identification device, a location and the type of memory of said electronic devices to irradiate and controls, for controlling at least the speed of said conveyor and the power and duration of the irradiation from said X-ray source, according to said location and type.
10 . The device according to claim 1 , wherein the identification device recognizes said electronic devices based on an identifier of said each of electronic devices.
11 . The device according to claim 1 , wherein the identification device recognizes said electronic devices based on reference information of an irradiation parameter stored in a memory of said automated device.
12 . A method for erasing data stored in non-volatile memories of electronic devices, wherein the method comprises:
an identification of each of said electronic devices for recognizing a type of said electronic devices and/or a type of memory of each of said electronic devices to irradiate,
a determination, by a control unit, of irradiation parameters corresponding to said electronic devices identified in said identification, and
an irradiation of said electronic devices with at least one X-ray source confined in a X-ray-tight enclosure of an irradiation chamber capable of successively receiving said electronic devices to be brought into the chamber by a conveyor, the conveyor and said X-ray source being controlled by said control unit according to said irradiation parameters including power and duration of irradiation for erasing data contained in the non-volatile memory of said electronic devices without inducing physical damage or permanent modification of cells in said memories,
wherein a principal axis of an X-ray beam is generated by said X-ray source, the principal axis being inclined or inclinable with respect to a plane of said conveyor, and the angle of the principal axis being determined per said control unit according to said identification.
13 . The method according to claim 12 ,
wherein the control unit controls the X-ray source by controlling the power and duration based on the type of memory contained in said electronic devices.
14 . The method according to claim 12 ,
wherein the control unit controls the irradiation power by controlling a supply voltage of the X-ray source between 175 and 300 kilovolts and a target intensity of the X-ray source between 250 and 900 microamperes.
15 . The method according to claim 12 ,
wherein the control unit (CU) controls the X-ray source to deliver irradiation for a duration of between 1 and 8 minutes.
16 . The method according to claim 12 ,
wherein the control unit controls the X-ray source to deliver irradiation for a duration of between 2 and 5 minutes.
17 . The method according to claim 12 , wherein said identification is based on an identifier of said each of electronic devices.
18 . The method according to claim 12 , wherein said identification is based on reference information of an irradiation parameter stored in a memory of said automated device.