Substrate support assembly with improved thermal uniformity

1 . A method comprising:

temporarily clamping a ceramic puck to a cooling plate of a substrate support assembly with one or more layers of bonding material between the ceramic puck and the cooling plate;

heating the ceramic puck;

cooling the cooling plate;

recording temperatures at a plurality of locations on a substrate support surface of the ceramic puck; and

modifying, based on the recorded temperatures, one or more properties of the one or more layers of the bonding material to achieve a target temperature profile on the substrate support surface.

2 . The method of claim 1 , wherein modifying the one or more properties comprises:

determining an average temperature of the temperatures recorded at the plurality of locations;

determining respective temperature deviations from the average temperature for one or more locations of the plurality of locations; and

determining, based on the respective temperature deviations of the one or more locations, modifications to the one or more properties of the one or more layers of the bonding material.

3 . The method of claim 1 , wherein modifying the one or more properties of the one or more layers of the bonding material comprises changing a thickness of the one or more layers of the bonding material at one or more locations of the one or more layers.

4 . The method of claim 2 , further comprising:

determining a ratio of a thickness of the bonding material to a difference in temperature between the ceramic puck and the cooling plate; and

determining a change in the thickness of the one or more layers of the bonding material at the one or more locations based on the temperature deviations at the one or more locations and on the ratio of the thickness of the bonding material to the difference in temperature between the ceramic puck and the cooling plate.

5 . The method of claim 1 , wherein modifying the one or more properties of the one or more layers of the bonding material comprises creating one or more perforations at one or more locations in the one or more layers of the bonding material.

6 . The method of claim 5 , wherein modifying the one or more properties of the one or more layers of the bonding material further comprises:

at least partially filling the one or more perforations with a second material having a thermal conductivity that is lower than, greater than, or equal to a thermal conductivity of the bonding material.

7 . The method of claim 6 , wherein the second material comprises at least one of silicone and a ceramic material comprising aluminum oxide, aluminum nitride, or a polycrystalline diamond powder.

8 . The method of claim 1 , further comprising:

disposing the modified one or more layers of the bonding material between the ceramic puck and the cooling plate; and

at least partially bonding the ceramic puck to the cooling plate using the modified one or more layers of the bonding material.

9 . The method of claim 1 , wherein the ceramic puck is a multi-plate electrostatic puck comprising an upper puck plate and a lower puck plate, the method further comprising:

temporarily clamping the upper puck plate to the lower puck plate with one or more additional layers of bonding material between the upper puck plate and the lower puck plate; and

modifying, based on the recorded temperatures, one or more properties of the one or more additional layers of the bonding material to achieve the target temperature profile on the substrate support surface.

10 . A method comprising:

performing computational modeling to model heating a ceramic puck plate bonded to a cooling plate by one or more layers of a bonding material;

estimating temperatures at a plurality of locations on a substrate support surface of the ceramic puck plate based on the computational modeling;

determining, based on the computational modeling, modifications to one or more properties of the one or more layers of the bonding material to achieve a target temperature profile on the substrate support surface; and

modifying the one or more properties of the one or more layers of the bonding material in accordance with the determined modifications.

11 . The method of claim 10 , further comprising:

receiving one or more first properties of the ceramic puck plate;

receiving one or more second properties of the cooling plate;

receiving one or more third properties of the one or more layers of the bonding material; and

preparing a computational model for the ceramic puck plate bonded to the cooling plate by the one or more layers of the bonding material based on the one or more first properties, the one or more second properties, and the one or more third properties.

12 . The method of claim 11 , wherein receiving one or more first properties of the ceramic puck plate further comprises:

heating the ceramic puck plate;

cooling the cooling plate; and

recording temperatures at a plurality of locations on a substrate support surface of the ceramic puck plate.

13 . The method of claim 12 , wherein determining the one or more properties further comprises:

receiving the temperatures recorded at the plurality of locations; and

performing finite element analysis (FEA) to determine modifications to the one or more properties of the one or more layers of the bonding material.

14 . The method of claim 11 , wherein receiving one or more second properties of the cooling plate further comprises:

cooling the cooling plate; and

recording temperatures at a plurality of locations on a top surface of the cooling plate.

15 . A substrate support assembly comprising:

a ceramic puck;

a cooling plate; and

one or more layers of a bonding material disposed between the ceramic puck and the cooling plate, the bonding material to at least partially bond the ceramic puck to the cooling plate, wherein the one or more layers of the bonding material comprise at least one of:

one or more first locations having a reduced thickness as compared to an average thickness of the one or more layers of the bonding material,

one or more second locations comprising perforations to reduce a thermal conductivity of the one or more layers of the bonding material at the one or more second locations, or

one or more third locations comprising perforations at least partially filled with a second material to adjust the thermal conductivity of the one or more layers of the bonding material at the one or more third locations.

16 . The substrate support assembly of claim 15 , wherein the one or more layers of the bonding material comprise a first thickness at a first location and a second thickness at a second location, wherein the first thickness is greater than the second thickness.

17 . The substrate support assembly of claim 15 , wherein the one or more layers of the bonding material comprise one or more perforations at the one or more second locations.

18 . The substrate support assembly of claim 15 , wherein at the one or more third locations the perforations are at least partially filled with the second material having a thermal conductivity that is lower than, greater than, or equal to a thermal conductivity of the bonding material.

19 . The substrate support assembly of claim 15 , wherein the one or more layers of the bonding material are tuned to cause the ceramic puck to have an approximately uniform temperature profile.

20 . The substrate support assembly of claim 15 , wherein the ceramic puck is a multi-plate electrostatic puck comprising an upper puck plate bonded to a lower puck plate.