Load pull system using tuner with two dual-state tuning probes
View Patent ↗A load-pull measurement system uses a PC control computer, interface, calibration method and at least one slide screw impedance tuner with two dual-tuning probes; the tuner probes share the same slabline; they are inserted diametrically at fixed depth (distance from the center conductor) from both sides into the channel and move only horizontally along the slabline. The tuner does not have cumbersome adjustable vertical axes controlling the penetration of the probes and its low profile is optimized for on-wafer operations. The carriages holding the probes are moved at high speed along the slabline using linear electric actuators. An efficient de-embedding calibration method serves speeding up additionally the measurement procedure.
1 . A load-pull tuner system comprising:
a) an automated slide screw tuner with two dual-state tuning probes,
b) tuner calibration methods,
c) an impedance synthesis (tuning) method,
wherein
a) the automated slide screw tuner includes:
a parallel plate airline (slabline) having an input port, an output port, a center conductor and two conductive sidewalls forming a channel, and
two mobile carriages C #1 and C #2, mounted across the channel, opposite to each-other, one on top and one on bottom of the sidewalls, remotely movable along the slabline using a control computer, each said mobile carriage carrying a dual-state tuning probe, carriage C #1 carrying tuning probe P #1 and carriage C #2 carrying tuning probe P #2,
wherein
the dual-state tuning probes are insertable diametral into the channel and settable to two preset states PS #1 and PS #2, state PS #1 corresponding to full withdrawal of the tuning probe from the channel of the slabline and state PS #2 corresponding to insertion of the tuning probe into the channel of the slabline to a fixed distance from the center conductor;
and wherein
each tuning probe has an initial (zero) position X1.0 and X2.0 correspondingly,
relative to the test port, and
carriage C #1 moves tuning probe P #1 to a position X1 relative to the test port, and
carriage C #2 moves tuning probe P #2 to a position X2 relative to the test port;
and wherein
if X1>X2 then tuning probe P #2 is closer to the test port than tuning probe P #1, else if
X1≤X2 then tuning probe P #1 is equal or closer to the test port than tuning probe P #2;
b) the tuner calibration methods comprise:
b1) a first tuner calibration method comprising:
routines for control of a pre-calibrated vector network analyzer (VNA),
positioning the tuning probes to a multitude of distinct positions, measuring s-parameters by the VNA as a function of the multitude of tuning probe positions and acquiring s-parameter data by the control computer, processing the acquired s-parameter data numerically using swapped de-embedding and saving the processed s-parameter data in tuner calibration files in the control computer;
b2) a second tuner calibration method comprising:
routines for control of a pre-calibrated vector network analyzer (VNA),
positioning the tuning probes to a multitude of distinct positions, measuring s-parameters by the VNA as a function of the multitude of tuning probe positions, and saving the processed s-parameter data in tuner calibration files in the control computer;
c) the impedance synthesis (tuning) method comprises:
retrieval of tuner calibration s-parameter data from the tuner calibration files, interpolation of s-parameter data between the distinct calibrated positions and numeric search among the calibrated and interpolated s-parameter data for the tuning probe positions that generate user defined impedances.
2 . The load-pull tuner system of claim 1 ,
wherein
the slabline of the slide screw tuner is at least one half of a wavelength long (λ/2) at a minimum operation frequency (Fmin).
3 . The load-pull tuner system of claim 1 ,
wherein the first tuner calibration method, comprises swapped de-embedding with following steps:
a) connect the tuner to the VNA, pre-calibrated at a frequency F;
b) set both tuning probes to the state PS #1 (withdrawn);
c) measure s-parameters and save in a zero matrix [S0] and set the tuning probe P #1 to the state PS #2 (inserted);
d) in a measurement loop for a multitude M of positions X1 with X1.0≤X1≤X1.0+λ(F)/2:
d1) move the tuning probe P #1 to a position X1;
d2) measure s-parameters Sij, whereby {i,j}={1,2};
d3) save the s-parameters and the associated probe P #1 position in a format (X1, Sij) in a file S1;
d4) when all positions M have been selected:
e) set the tuning probe P #1 to the state PS #1 (withdrawn) and the tuning probe P #2 to the state PS #2 (inserted);
f) in a measurement loop for a multitude N of positions X2 with X2.0≤X2≤X2.0+λ(F)/2:
f1) move the tuning probe P #2 to a position X2; f2) measure s-parameters Sij whereby {i,j}={1,2};
f3) save the s-parameters and the associated probe P #2 position in a format (X2, Sij) in a file S2;
f4) when all positions N have been selected:
g) retrieve s-parameters Sij(X1) from the file S1 and Sij(X2) from the file S2;
h) in a scanning loop through Sij(X1) for the multitude M of positions X1:
execute a nested scanning loop through Sij(X2) for the multitude N of positions X2:
if (X1≤X2) then
h1) cascade the inverse s-parameter zero matrix [S0] −1 with the s-parameters Sij(X2) of the file S2 and replace (update) in the file S2;
else if (X1>X2) then
h2) cascade the inverse s-parameter zero matrix [S0] −1 with the s-parameters Sij(X1) of the file S1 and replace (update) in the file S1;
i) retrieve the s-parameters Sij(X1) from the updated file S1 and Sij(X2) from the updated file S2,
cascade the s-parameters of the updated file S1 with the s-parameters of the updated file S2 to create Sij(X1,X2) and save (X1, X2, Sij(X1,X2)) in a file TUNER-CAL(F) for later use.
4 . The load pull tuner of claim 1 , wherein the second tuner calibration method further comprises the following steps:
a) connect the tuner to the VNA, pre-calibrated at a frequency F;
b) set both tuning probes in the state PS #2 (inserted);
c) in a measurement loop for a multitude M>1 of positions X1, whereby X1.0≤X1≤X1.0+λ(F)/2,
c1) move tuning probe P #I to a position X1;
c2) in a nested measurement loop for a multitude N>1 of positions X2,
whereby
X 2.0≤ X 2≤ X 2.0+λ( F )/2,
(i) move tuning probe P #2 to a position X2;
(ii) measure s-parameters Sij, whereby {i,j}={1,2};
(iii) save (X1, X2, Sij) in a file TUNER-CAL(F);
when all X2 positions of the multitude of N positions have been selected,
select a next position X1 and return to step (c1);
d) when all X1 positions of the multitude of M positions have been selected, save the file TUNER-CAL(F) for later use.
5 . The load-pull tuner system of claim 4 , wherein the impedance synthesis (tuning) method comprises:
a) define a frequency F and load the tuner calibration file TUNER-CAL(F) in memory;
b) define a tuning target reflection factor Γ=|Γ|*exp(jΦ) and a maximum number of iterations NMAX;
c) search in s-parameter Sij(X1,X2) data of the file TUNER-CAL(F) for an initial calibration point S11(X1o, X2o), for which an error function EF=|S11(X1o, X2o)−Γ| 2 , defined as the vector difference between the test port reflection factor S11 at probe positions X1o and X2o and the target reflection factor Γ, is minimum;
d) set N=1 and search among interpolated s-parameter data S11(X1,X2) in the area surrounding the initial tuner setting (X1o,X2o) for a final tuner setting (X1.final,X2.final) in following steps:
d1) from the initial tuner setting (X1o,X2o) in a first optimization loop as follows: set N=N+1 and change X1o by δX1 to X1o+δX1, with δX1 proportional to the change of the Error Function EF=|S11(X1o+δX1,X2o)−Γ| 2 , until the error function EF reaches a minimum, and set X1o′=X1o+δX1;
d2) from a new tuner setting (X1o′,X2o) in a second optimization loop as follows: set N=N+1 and change X2o by δX2 to X2o+δX2, with δX2 proportional to the change of the Error Function EF=|S11(X1o′,X2o+δX2)−Γ| 2 , until the error function EF reaches a minimum, and set X2o′=X2o+δX2;
d3) set X1o=X1o′, X2o=X2o′ and repeat steps d1) and d2) until there is no further Error Function EF reduction, or if N>NMAX;
d4) define X1.final=X1o′, X2.final=X2o′;
e) insert the tuning probes to the state PS #2 and move the tuning probe P #1 to X1.final and the tuning probe P #2 to X2.final.