IP Library Granted Patent US 12695446
Granted Patent B2
US 12695446 · App. 18/590,343 · Granted Jul 28, 2026

Blanking-time-less desaturation protection method for power devices

Inventors: Zhehui Guo (Tallahassee, FL); Hui Li (Tallahassee, FL)
Assignee: The Florida State University Research Foundation, Inc.
H03K17/0812
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Quick Facts
Patent No.
US 12695446
App. No.
18/590,343
Granted
Jul 28, 2026
Kind
B2
Abstract

The disclosure relates to a devices, systems and methods implementing desaturation protection during faults (over-current or short-circuit faults) for a power device by monitoring drain source voltage and rate of change of the drain source voltage which provides a fault response time (t 0 to t 2 ) that is shorter than the blanking time (t 0 to t 5 ) required by conventional desaturation protection methods.

Claims (8)

1 . A circuit that provides blanking-time-less desaturation protection for a power device during a fault, comprising:

a desaturation protection sub-circuit;

a fault monitoring sub-circuit; and

a totem-pole driver sub-circuit,

wherein a drain-source voltage, V ds , and a rate of change of the drain-source voltage, dv/dt, of the power device are monitored during the fault, wherein the fault comprises a short-circuit (SC) fault and the SC fault is first monitored by the fault monitoring circuit at a time, t 2 , by sensing fall in dv/dt of Vds, wherein t 2 is shorter than the blanking time t 5 , and then monitored by the desaturation protection circuit at time t 5 , and wherein once the SC fault is monitored at time t 2 by the fault monitoring circuit, active gate clamping is activated by the totem-pole driver sub-circuit to mitigate a SC current until desaturation protection is triggered at time t 5 , after which the power device is fully turned off,

wherein the circuit provides a fault response time (t 0 to t 2 ) that is shorter than a blanking time (t 0 to t 5 ) required by conventional desaturation protection methods.

2 . The circuit of claim 1 , wherein the fault comprises an over-current (OC) fault and detection of V ds by the desaturation protection sub-circuit is used to monitor the OC fault.

3 . The system of claim 1 , wherein the power device comprises a Si, SiC, or GaN power device.