Method and apparatus for calculating signal quality value according to reference signal and signal under test that is derived from predetermined signal processing of reference signal
A signal quality measurement apparatus includes a processing circuit and a signal quality measurement circuit. The processing circuit receives a reference signal from a first circuit and a signal under test from a second circuit, and refers to the reference signal to derive a signal after processing from the signal under test, wherein the signal under test is derived from predetermined signal processing of the reference signal. The signal quality measurement circuit calculates a signal quality value according to the reference signal and the signal after processing.
1 . A signal quality measurement apparatus comprising:
a processing circuit, arranged to receive a reference signal from a first circuit and a signal under test from a second circuit, and refer to the reference signal to derive a signal after processing from the signal under test, wherein the signal under test is derived from predetermined signal processing of the reference signal; and
a signal quality measurement circuit, arranged to calculate a signal quality value according to the reference signal and the signal after processing;
wherein the reference signal comprises a plurality of first samples at a first sampling rate, the signal under test comprises a plurality of second samples at a second sampling rate that is different from the first sampling rate, and the processing circuit comprises:
a sampling rate conversion circuit, arranged to perform a sampling rate conversion operation upon the signal under test to generate a re-sampled signal under test, wherein the re-sampled signal under test comprises a plurality of third samples at the first sampling rate; and
a follow-up processing circuit, arranged to derive the signal after processing from the re-sampled signal under test according to the reference signal.
2 . The signal quality measurement apparatus of claim 1 , wherein the second sampling rate is higher than the first sampling rate, and the sampling rate conversion operation comprises down-sampling; or the second sampling rate is lower than the first sampling rate, and the sampling rate conversion operation comprises up-sampling.
3 . The signal quality measurement apparatus of claim 1 ,
wherein the follow-up processing circuit comprises:
a cross-correlation circuit, arranged to perform cross-correlation between the re-sampled signal under test and the reference signal, to find an optimal starting sample position of the re-sampled signal under test; and
a selection circuit, arranged to extract consecutive samples from the plurality of third samples of the re-sampled signal under test and output the consecutive samples as the signal after processing, wherein the consecutive samples start from a third sample of the re-sampled signal under the test that corresponds to the optimal starting sample position.
4 . The signal quality measurement apparatus of claim 1 , wherein the reference signal is a baseband modulation signal.
5 . The signal quality measurement apparatus of claim 4 , wherein the baseband modulation signal is a constant envelope (CE) modulation signal.
6 . The signal quality measurement apparatus of claim 5 , wherein the CE modulation signal is a Gaussian Frequency Shift Keying (GFSK) signal or a ZigBee signal.
7 . The signal quality measurement apparatus of claim 1 , wherein the reference signal and the signal under test both comprise waveform samples, or frequency deviation (FD) samples, or phase samples.
8 . The signal quality measurement apparatus of claim 1 , wherein the signal under test is an output of a digital phase-locked loop (DPLL) circuit or an output of a power amplifier (PA).
9 . A signal quality measurement apparatus comprising:
a processing circuit, arranged to receive a reference signal from a first circuit and a signal under test from a second circuit, and refer to the reference signal to derive a signal after processing from the signal under test, wherein the signal under test is derived from predetermined signal processing of the reference signal; and
a signal quality measurement circuit, arranged to calculate a signal quality value according to the reference signal and the signal after processing;
wherein the reference signal comprises a plurality of first samples at a sampling rate, the signal after processing comprises a plurality of second samples at the sampling rate, and the signal quality computation circuit comprises:
a matching gain estimation circuit, arranged to find an optimal matching gain for the signal after processing according to the plurality of first samples and the plurality of second samples;
an adjustment circuit, arranged to apply the optimal matching gain to the plurality of second samples included in the signal after processing, to generate a plurality of gain-adjusted samples, respectively; and
a calculation circuit, arranged to calculate the signal quality value according to the plurality of first samples and the plurality of gain-adjusted samples.
10 . A signal quality measurement method comprising:
receiving a reference signal from a first circuit and a signal under test from a second circuit, wherein the signal under test is derived from predetermined signal processing of the reference signal;
referring to the reference signal to derive a signal after processing from the signal under test; and
calculating a signal quality value according to the reference signal and the signal after processing;
wherein the reference signal comprises a plurality of first samples at a first sampling rate, the signal under test comprises a plurality of second samples at a second sampling rate that is different from the first sampling rate, and referring to the reference signal to derive the signal after processing from the signal under test comprises:
performing a sampling rate conversion operation upon the signal under test to generate a re-sampled signal under test, wherein the re-sampled signal under test comprises a plurality of third samples at the first sampling rate; and
deriving the signal after processing from the re-sampled signal under test according to the reference signal.
11 . The signal quality measurement method of claim 10 , wherein the second sampling rate is higher than the first sampling rate, and the sampling rate conversion operation comprises down-sampling; or the second sampling rate is lower than the first sampling rate, and the sampling rate conversion operation comprises up-sampling.
12 . The signal quality measurement method of claim 10 , wherein deriving the signal after processing from the re-sampled signal under test according to the reference signal comprises:
performing cross-correlation between the re-sampled signal under test and the reference signal, to find an optimal starting sample position of the re-sampled signal under test; and
extracting consecutive samples from the plurality of third samples of the re-sampled signal under test, and outputting the consecutive samples as the signal after processing, wherein the consecutive samples start from a third sample of the re-sampled signal under test that corresponds to the optimal starting sample position.
13 . The signal quality measurement method of claim 10 , wherein the reference signal is a baseband modulation signal.
14 . The signal quality measurement method of claim 13 , wherein the baseband modulation signal is a constant envelope (CE) modulation signal.
15 . The signal quality measurement method of claim 14 , wherein the CE modulation signal is a Gaussian Frequency Shift Keying (GFSK) signal or a ZigBee signal.
16 . The signal quality measurement method of claim 10 , wherein the reference signal and the signal under test both comprise waveform samples, or frequency deviation (FD) samples, or phase samples.
17 . The signal quality measurement method of claim 10 , wherein the signal under test is an output of a digital phase-locked loop (DPLL) circuit or an output of a power amplifier (PA).
18 . A signal quality measurement method comprising:
receiving a reference signal from a first circuit and a signal under test from a second circuit, wherein the signal under test is derived from predetermined signal processing of the reference signal;
referring to the reference signal to derive a signal after processing from the signal under test; and
calculating a signal quality value according to the reference signal and the signal after processing:
wherein the reference signal comprises a plurality of first samples at a sampling rate, the signal after processing comprises a plurality of second samples at the sampling rate, and calculating the signal quality value according to the reference signal and the signal after processing comprises:
finding an optimal matching gain for the signal after processing according to the plurality of first samples and the plurality of second samples;
applying the optimal matching gain to the plurality of second samples included in the signal after processing, to generate a plurality of gain-adjusted samples, respectively; and
calculating the signal quality value according to the plurality of first samples and the plurality of gain-adjusted samples.