IP Library Granted Patent US 12696119
Granted Patent B2
US 12696119 · App. 18/403,701 · Granted Jul 28, 2026

Method and apparatus for calculating signal quality value according to reference signal and signal under test that is derived from predetermined signal processing of reference signal

Inventors: Jeng-Hong Chen (Manhattan Beach, CA); Yun-Xuan Zhang (Taipei City, TW)
Assignee: Airoha Technology Corp.
H04W24/10H04B17/309H04L5/0051H04L27/2017
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Quick Facts
Patent No.
US 12696119
App. No.
18/403,701
Granted
Jul 28, 2026
Kind
B2
Abstract

A signal quality measurement apparatus includes a processing circuit and a signal quality measurement circuit. The processing circuit receives a reference signal from a first circuit and a signal under test from a second circuit, and refers to the reference signal to derive a signal after processing from the signal under test, wherein the signal under test is derived from predetermined signal processing of the reference signal. The signal quality measurement circuit calculates a signal quality value according to the reference signal and the signal after processing.

Claims (47)

1 . A signal quality measurement apparatus comprising:

a processing circuit, arranged to receive a reference signal from a first circuit and a signal under test from a second circuit, and refer to the reference signal to derive a signal after processing from the signal under test, wherein the signal under test is derived from predetermined signal processing of the reference signal; and

a signal quality measurement circuit, arranged to calculate a signal quality value according to the reference signal and the signal after processing;

wherein the reference signal comprises a plurality of first samples at a first sampling rate, the signal under test comprises a plurality of second samples at a second sampling rate that is different from the first sampling rate, and the processing circuit comprises:

a sampling rate conversion circuit, arranged to perform a sampling rate conversion operation upon the signal under test to generate a re-sampled signal under test, wherein the re-sampled signal under test comprises a plurality of third samples at the first sampling rate; and

a follow-up processing circuit, arranged to derive the signal after processing from the re-sampled signal under test according to the reference signal.

2 . The signal quality measurement apparatus of claim 1 , wherein the second sampling rate is higher than the first sampling rate, and the sampling rate conversion operation comprises down-sampling; or the second sampling rate is lower than the first sampling rate, and the sampling rate conversion operation comprises up-sampling.

3 . The signal quality measurement apparatus of claim 1 ,

wherein the follow-up processing circuit comprises:

a cross-correlation circuit, arranged to perform cross-correlation between the re-sampled signal under test and the reference signal, to find an optimal starting sample position of the re-sampled signal under test; and

a selection circuit, arranged to extract consecutive samples from the plurality of third samples of the re-sampled signal under test and output the consecutive samples as the signal after processing, wherein the consecutive samples start from a third sample of the re-sampled signal under the test that corresponds to the optimal starting sample position.

4 . The signal quality measurement apparatus of claim 1 , wherein the reference signal is a baseband modulation signal.

5 . The signal quality measurement apparatus of claim 4 , wherein the baseband modulation signal is a constant envelope (CE) modulation signal.

6 . The signal quality measurement apparatus of claim 5 , wherein the CE modulation signal is a Gaussian Frequency Shift Keying (GFSK) signal or a ZigBee signal.

7 . The signal quality measurement apparatus of claim 1 , wherein the reference signal and the signal under test both comprise waveform samples, or frequency deviation (FD) samples, or phase samples.

8 . The signal quality measurement apparatus of claim 1 , wherein the signal under test is an output of a digital phase-locked loop (DPLL) circuit or an output of a power amplifier (PA).

9 . A signal quality measurement apparatus comprising:

a processing circuit, arranged to receive a reference signal from a first circuit and a signal under test from a second circuit, and refer to the reference signal to derive a signal after processing from the signal under test, wherein the signal under test is derived from predetermined signal processing of the reference signal; and

a signal quality measurement circuit, arranged to calculate a signal quality value according to the reference signal and the signal after processing;

wherein the reference signal comprises a plurality of first samples at a sampling rate, the signal after processing comprises a plurality of second samples at the sampling rate, and the signal quality computation circuit comprises:

a matching gain estimation circuit, arranged to find an optimal matching gain for the signal after processing according to the plurality of first samples and the plurality of second samples;

an adjustment circuit, arranged to apply the optimal matching gain to the plurality of second samples included in the signal after processing, to generate a plurality of gain-adjusted samples, respectively; and

a calculation circuit, arranged to calculate the signal quality value according to the plurality of first samples and the plurality of gain-adjusted samples.

10 . A signal quality measurement method comprising:

receiving a reference signal from a first circuit and a signal under test from a second circuit, wherein the signal under test is derived from predetermined signal processing of the reference signal;

referring to the reference signal to derive a signal after processing from the signal under test; and

calculating a signal quality value according to the reference signal and the signal after processing;

wherein the reference signal comprises a plurality of first samples at a first sampling rate, the signal under test comprises a plurality of second samples at a second sampling rate that is different from the first sampling rate, and referring to the reference signal to derive the signal after processing from the signal under test comprises:

performing a sampling rate conversion operation upon the signal under test to generate a re-sampled signal under test, wherein the re-sampled signal under test comprises a plurality of third samples at the first sampling rate; and

deriving the signal after processing from the re-sampled signal under test according to the reference signal.

11 . The signal quality measurement method of claim 10 , wherein the second sampling rate is higher than the first sampling rate, and the sampling rate conversion operation comprises down-sampling; or the second sampling rate is lower than the first sampling rate, and the sampling rate conversion operation comprises up-sampling.

12 . The signal quality measurement method of claim 10 , wherein deriving the signal after processing from the re-sampled signal under test according to the reference signal comprises:

performing cross-correlation between the re-sampled signal under test and the reference signal, to find an optimal starting sample position of the re-sampled signal under test; and

extracting consecutive samples from the plurality of third samples of the re-sampled signal under test, and outputting the consecutive samples as the signal after processing, wherein the consecutive samples start from a third sample of the re-sampled signal under test that corresponds to the optimal starting sample position.

13 . The signal quality measurement method of claim 10 , wherein the reference signal is a baseband modulation signal.

14 . The signal quality measurement method of claim 13 , wherein the baseband modulation signal is a constant envelope (CE) modulation signal.

15 . The signal quality measurement method of claim 14 , wherein the CE modulation signal is a Gaussian Frequency Shift Keying (GFSK) signal or a ZigBee signal.

16 . The signal quality measurement method of claim 10 , wherein the reference signal and the signal under test both comprise waveform samples, or frequency deviation (FD) samples, or phase samples.

17 . The signal quality measurement method of claim 10 , wherein the signal under test is an output of a digital phase-locked loop (DPLL) circuit or an output of a power amplifier (PA).

18 . A signal quality measurement method comprising:

receiving a reference signal from a first circuit and a signal under test from a second circuit, wherein the signal under test is derived from predetermined signal processing of the reference signal;

referring to the reference signal to derive a signal after processing from the signal under test; and

calculating a signal quality value according to the reference signal and the signal after processing:

wherein the reference signal comprises a plurality of first samples at a sampling rate, the signal after processing comprises a plurality of second samples at the sampling rate, and calculating the signal quality value according to the reference signal and the signal after processing comprises:

finding an optimal matching gain for the signal after processing according to the plurality of first samples and the plurality of second samples;

applying the optimal matching gain to the plurality of second samples included in the signal after processing, to generate a plurality of gain-adjusted samples, respectively; and

calculating the signal quality value according to the plurality of first samples and the plurality of gain-adjusted samples.