Handling a fragile substrate for interconnect bonding
A bonding apparatus has a bonding platform including a top plate for supporting a fragile semiconductor substrate during interconnect bonding operations conducted on the substrate. Vacuum holes situated on the top plate, forming a first vacuum section, a second vacuum section, and a third vacuum section located between the first and second vacuum sections, generate vacuum suction forces on the substrate during bonding. Individually controllable first, second and third vacuum supplies are connected to the first, second and third vacuum sections respectively. The first and second vacuum supplies cooperate at a first bonding position to generate a vacuum suction force at the first and second vacuum sections, and the second and third vacuum supplies cooperate at a second bonding to position to generate a vacuum suction force at the second and third vacuum sections.
1 . A bonding apparatus for holding a fragile semiconductor substrate during interconnect bonding operations conducted on the substrate, the bonding apparatus comprising:
a bonding platform having a top plate for supporting the substrate;
a plurality of vacuum holes situated on the top plate operative to generate vacuum suction forces on the substrate during bonding, the plurality of vacuum holes forming a first vacuum section, a second vacuum section, and a third vacuum section located between the first and second vacuum sections;
first, second and third vacuum supplies connected to the first, second and third vacuum sections respectively, the first, second and third vacuum supplies being individually controllable; and
a substrate carrier configured to convey the substrate relative to the bonding platform to introduce the substrate to different bonding positions over the bonding platform;
wherein the first and second vacuum supplies cooperate to generate a vacuum suction force at the first and second vacuum sections when the substrate carrier positions the substrate at a first bonding position, and the second and third vacuum supplies cooperate to generate a vacuum suction force at the second and third vacuum sections when the substrate carrier positions the substrate at a second bonding position different from the first bonding position.
2 . The bonding apparatus as claimed in claim 1 , wherein the first, second and third vacuum section are connected to a vacuum generator having a variable vacuum force comprising two or more phases.
3 . The bonding apparatus as claimed in claim 2 , wherein the vacuum generator comprises at least a first phase for applying a first vacuum force, and a second phase for applying a second vacuum force that is higher than the first vacuum force.
4 . The bonding apparatus as claimed in claim 3 , further comprising a pressure control solenoid valve or variable pressure regulator operatively connected to the vacuum generator for increasing or decreasing the vacuum force between the first and second phases.
5 . The bonding apparatus as claimed in claim 1 , wherein the substrate includes an opening through which the substrate is in fluid communication with the plurality of vacuum holes during bonding.
6 . The bonding apparatus as claimed in claim 5 , further comprising at least one track along which the substrate carrier is guided to move relative to the bonding platform.
7 . The bonding apparatus as claimed in claim 5 , further comprising a rotary indexer operative to rotate the substrate relative to the bonding platform while the substrate is being carried by the substrate carrier.
8 . The bonding apparatus as claimed in claim 5 , wherein the bonding platform is movable towards and away from the substrate carrier, and the bonding platform is moved towards the substrate carrier to apply the vacuum suction force on the substrate during bonding.
9 . The bonding apparatus as claimed in claim 8 , wherein the bonding platform is moved away from the substrate carrier when the substrate carrier is conveying the substrate relative to the bonding platform.
10 . The bonding apparatus as claimed in claim 1 , wherein the first bonding position and the second bonding position are each locatable at a bonding area which corresponds to one quadrant of the substrate.
11 . The bonding apparatus as claimed in claim 1 , wherein the first, second and third vacuum supplies are fluidly connected to the plurality of vacuum holes through air channels formed in the bonding platform.
12 . The bonding apparatus as claimed in claim 11 , further comprising vacuum pipes connecting the air channels in the bonding platform to the first, second and third vacuum supplies.
13 . The bonding apparatus as claimed in claim 1 , further comprising a compressed air supply connected to the plurality of vacuum holes via a fast release channel to provide air pressure to the plurality of vacuum holes to assist removal of the substrate from the top plate.
14 . The bonding apparatus as claimed in claim 1 , further comprising a main solenoid valve centrally controlling the first, second and third vacuum supplies to control the vacuum suction force generated at the respective vacuum sections on the top plate.
15 . The bonding apparatus as claimed in claim 1 , further comprising at least one heater blower positioned over the bonding platform that is operative to blow a heated air stream across a top surface of the substrate positioned on the top plate.
16 . The bonding apparatus as claimed in claim 15 , wherein the at least one heater blower comprises a first heater blower and a second heater blower located at opposite sides of the first and second bonding positions to blow heated air streams from different directions.
17 . The bonding apparatus as claimed in claim 15 , wherein the heated air stream is operative to heat the top surface of the substrate to be substantially the same as a temperature at a bottom surface of the substrate that is being heated by the bonding platform.
18 . Method for bonding interconnects on a fragile semiconductor substrate,
the method comprising the steps of:
supporting the substrate on a bonding platform having a top plate, the top plate including a plurality of vacuum holes situated thereon operative to generate vacuum suction forces on the substrate during bonding, wherein the plurality of vacuum holes form a first vacuum section connected to a first vacuum supply, a second vacuum section connected to a second vacuum supply, and a third vacuum section connected to a third vacuum supply, the third vacuum section being located between the first and second vacuum sections, and wherein the first, second and third vacuum supplies are individually controllable;
conveying the substrate by a substrate carrier relative to the bonding platform to a first bonding position, and activating the first and second vacuum supplies to generate a vacuum suction force at the first and second vacuum sections when the substrate carrier positions the substrate at the first bonding position; and
conveying the substrate by the substrate carrier to a second bonding position, which is different from the first bonding position, and activating the second and third vacuum supplies to generate a vacuum suction force at the second and third vacuum sections when the substrate carrier positions the substrate at the second bonding position.