Test systems configured to test devices at different temperatures
An example test system includes a plenum including an air inlet and a rack including slots to hold devices under test. The rack is adjacent to the plenum. The slots are arranged on the rack in a matrix such that part of each device held in a slot borders the plenum and is in fluid communication with the air inlet. One or more blowers are configured to force temperature-conditioned air into the air inlet of the plenum to thereby increase air pressure in the plenum and force the temperature-conditioned air over the devices and out of the plenum.
1 . A test system comprising:
a first plenum comprising an air inlet;
a rack comprising slots to hold devices under test, the rack being adjacent to the first plenum, and the slots being arranged on the rack in a matrix such that part of each device held in a slot borders the first plenum and is in fluid communication with the air inlet;
one or more blowers to force temperature-conditioned air into the air inlet of the first plenum to thereby increase air pressure in the first plenum and force the temperature-conditioned air over the devices and out of the first plenum; and
a second plenum, the slots being arranged on the rack in the matrix such that part of each device held in a slot also borders the second plenum, the temperature-conditioned air being forced over the devices into the second plenum.
2 . The test system of claim 1 , wherein each slot is configured to hold a corresponding device so that there is an air gap in the slot, the air gap for directing air from the first plenum over a surface of the corresponding device.
3 . The test system of claim 2 , wherein each slot is configured to hold the corresponding device so that there are air gaps adjacent to different surfaces of the corresponding device, each air gap for directing air from the first plenum over a different surface of the corresponding device.
4 . The test system of claim 1 , further comprising a heater to produce temperature-conditioned air that is above room temperature.
5 . The test system of claim 1 , further comprising a coolant to produce temperature-conditioned air that is below room temperature.
6 . The system of claim 1 , wherein the temperature-conditioned air is between −40° Celsius (C) and 100° C.
7 . The test system of claim 1 , further comprising:
test instruments that are external to the first plenum; and
cables that connect the test instruments to the devices.
8 . The test system of claim 1 , wherein the test system does not include air movers dedicated to individual slots.
9 . The test system of claim 1 ,
wherein the rack has a first side facing the first plenum and a second side facing the second plenum; and
wherein the test system further comprises:
temperature sensors on the first side and the second side, the temperature sensors producing readings; and
a control system to control the one or more blowers based on the readings and to control at least one of an air heating system or an air cooling system.
10 . The test system of claim 9 , wherein the control system comprises a proportional-integral-derivative controller.
11 . The test system of claim 10 , wherein the temperature sensors are spaced in a regular pattern across the matrix.
12 . The test system of claim 11 , wherein the test system comprises fewer temperature sensors than there are slots in the test system.
13 . The test system of claim 9 , wherein the control system is configured to obtain temperature readings from the devices; and
wherein the control system is configured to control the one or more blowers based also on the temperature readings from the devices, the control system also being configured to control at least one of the air heating system or the air cooling system.
14 . The test system of claim 1 , further comprising:
adapters that fit into the slots, each adapter for holding a corresponding device.
15 . The test system of claim 1 , wherein the adapters have different physical configurations to hold different types of devices at a same time within the rack.
16 . The test system of claim 1 , wherein the slots are configured for manual loading and unloading of the devices.
17 . The test system of claim 1 , further comprising:
robotics to move the devices into and out of the slots.
18 . The test system of claim 1 ,
wherein each device comprises a solid state drive, a back of each solid state drive faces the first plenum, and a front of each solid state drive faces the second plenum.
19 . The test system of claim 1 , wherein the test system is a batch tester, the batch tester for performing testing of the devices as part of a group.
20 . The test system of claim 19 , wherein the batch tester is configured not to perform testing on the devices individually.
21 . The test system of claim 1 , further comprising:
an adapter configured to fit within a slot of the test system and configured to hold a device under test (DUT), the adapter comprising:
a connector that is complementary to a connector of the DUT; and
a structure having a shape that is configured to fit within the slot and that is complementary to a shape of the DUT, the adapter being configured to fit within the slot so as to produce an air gap above or below the adapter.
22 . The test system of claim 21 , wherein the connector comprises an electrical connector.
23 . The test system of claim 21 , wherein the connector comprises a mechanical connector.
24 . The test system of claim 21 , wherein the adapter is configured to fit within the slot so as to produce an air gap above the adapter between the slot and the adapter and an air gap below the adapter between the slot and the adapter.
25 . A test system comprising:
a plenum comprising an air inlet;
a rack comprising slots to hold devices under test, the rack being adjacent to the plenum, and the slots being arranged on the rack in a matrix such that part of each device held in a slot borders the plenum and is in fluid communication with the air inlet;
one or more blowers to force temperature-conditioned air into the air inlet of the plenum to thereby increase air pressure in the plenum and force the temperature-conditioned air over the devices and out of the plenum;
test instruments that are external to the plenum;
cables that connect the test instruments to the devices; and
glands that are sealed to the plenum, the cables passing through the glands.
26 . The test system of claim 25 , wherein the glands comprise an elastomeric material.