Apparatus for variable temperature infrared spectroscopy with a button sample holder

1 . A test sample system for carrying out a testing protocol on a sample at one or more temperatures within a spectrophotometer, the system comprising:

a button sample holder configured to hold the sample during the testing protocol,

wherein the button sample holder further comprises:

a mesh sample retainer, wherein the mesh sample retainer comprises:

a mesh disc configured to retain the sample;

a backing member; and

a thermocouple connected to the backing member and configured to measure the temperature of the sample in the mesh disc; and

a sample plate, wherein the sample plate comprises a mesh sample container recess that is configured to receive the mesh sample retainer such that a top surface of the mesh disc is substantially flush with a top surface of the sample plate; and

a temperature control support assembly for supporting the button sample holder and controlling the temperature of the sample in the button sample holder, wherein the temperature control support assembly comprises:

a thermoelectric heat transfer system comprising at least one thermoelectric chip (TEC) in direct contact with the sample plate of the button sample holder; and

a liquid cooling system.

2 . The test sample system of claim 1 , wherein the liquid cooling system comprises a cooling block and wherein the at least one TEC is mounted on the cooling block.

3 . The test sample system of claim 2 , wherein the liquid cooling system further comprises:

a recirculating chiller for chilling a coolant liquid;

an inlet for delivering the coolant liquid from the recirculating chiller to the cooling block; and

an outlet for delivering the coolant liquid from the cooling block to the recirculating chiller.

4 . The test sample system of claim 1 , wherein the mesh sample retainer recess has approximately the same diameter as the mesh sample retainer.

5 . The test sample system of claim 1 , wherein the thermoelectric heat transfer system comprises at least two TECs.

6 . A test sample system for carrying out a testing protocol on a sample at one or more temperatures within a spectrophotometer, the system comprising:

a button sample holder configured to hold the sample during the testing protocol,

wherein the button sample holder further comprises:

a mesh sample retainer, wherein the mesh sample retainer comprises:

a mesh disc configured to retain the sample;

a backing member; and

a thermocouple connected to the backing member and configured to measure the temperature of the sample in the mesh disc; and

a sample plate, wherein the sample plate comprises a mesh sample container recess that is configured to receive the mesh sample retainer such that a top surface of the mesh disc is substantially flush with a top surface of the sample plate; and

a temperature control support assembly for supporting the button sample holder and controlling the temperature of the sample in the button sample holder, wherein the temperature control support assembly comprises:

a thermoelectric heat transfer system comprising two or more thermoelectric chips (TECs), wherein at least one of the two or more TECs is in contact with the sample plate of the button sample holder; and

a liquid cooling system.

7 . The test sample system of claim 6 , wherein the thermoelectric heat transfer system comprises:

a first TEC in contact with the button sample holder; and

a second TEC in planar contact with the first TEC.

8 . The test sample system of claim 7 , wherein the temperature control support assembly further comprises a housing for retaining the first and second TECs.

9 . The test sample system of claim 8 , wherein the housing comprises:

a first plate that includes a first chamber configured to retain the first TEC and an upper portion of the second TEC;

a second plate that includes a second chamber configured to retain a lower portion of the second TEC; and

a cover plate connected to the first plate, wherein the cover plate includes a button aperture sized to allow the button sample holder to be placed in direct contact with the first TEC.

10 . The test sample system of claim 9 , wherein the second plate further comprises a coolant reservoir under the second TEC.

11 . The test sample system of claim 9 , wherein the housing further comprises an o-ring seal between the cover plate and the first TEC.

12 . A method for the variable temperature infrared spectroscopy analysis of a test sample using a spectrophotometer, the method comprising the steps of:

loading the sample in a button sample holder that includes a mesh sample retainer and sample plate, wherein the mesh sample retainer further includes a mesh disc configured to retain the sample, a backing member, and a thermocouple connected to the backing member and configured to measure the temperature of the sample in the mesh disc, and wherein the sample plate comprises a mesh sample container recess that is configured to receive the mesh sample retainer such that a top surface of the mesh disc is substantially flush with a top surface of the sample plate;

placing the loaded button sample holder onto a temperature control support assembly that includes a thermoelectric heat transfer system that includes at least one thermoelectric chip (TEC) such that that TEC is in direct contact with the sample plate of the button sample holder;

placing the loaded button sample holder and temperature control support assembly into the spectrophotometer;

changing the temperature of the sample to a setpoint temperature with a thermoelectric chip in the temperature control support assembly; and

taking a measurement with the spectrophotometer of the sample at the setpoint temperature.

13 . The method of claim 11 , further comprising the step of cooling the temperature control support assembly with a liquid cooling system.

14 . The method of claim 11 , further comprising the steps of:

changing the temperature of the sample to a second setpoint temperature with the thermoelectric chip in the temperature control support assembly; and

taking a second measurement with the spectrophotometer of the sample at the second setpoint temperature.

15 . The method of claim 14 , further comprising the step of selecting the first setpoint temperature and the second setpoint temperature to accomplish measurements for a linear, cyclic, exponential or stepped temperature profile.