System and method for detecting and controlling a spectrum of a light source of a hyperspectral imaging system

1 . A system for determining external and/or internal attributes of a produce, the system comprising:

a halogen light source configured to illuminate the produce;

a light source sensor configured to generate a signal indicative of a spectral emission profile of the halogen light source, wherein the light source sensor is a temperature sensor or a current and/or voltage monitor;

a power supply coupled to the halogen light source and configured to supply power to the halogen light source;

a control unit capable of adjusting a frequency, a current, and/or a voltage of the power supply;

one or more optical sensors operating in visual and/or non-visual spectra and configured to capture images of the illuminated produce; and

a processing unit configured to:

receive the signal from the light source sensor and to compute a spectral emission profile of the halogen light source, based thereon;

dynamically trigger the control unit to adjust a frequency, a current, and/or a voltage of the power supply, based on the computed spectral emission profile, so as to maintain the spectral emission profile of the halogen light source within a predetermined range;

receive spectral data from the one or more optical sensors after adjustment of the power supply; and

derive an internal and/or external quality attribute of the produce, based on the spectral data, based on the spectral data received from the one or more optical sensors.

2 . The system of claim 1 , wherein the temperature sensor is selected from a thermal sensor, a thermocouple, a thermistor or any combination thereof.

3 . The system of claim 1 , further comprising a diode receptor configured to measure the intensity of the specific wavelength of the light emitted by the light source.

4 . The system of claim 1 , further comprising one or more additional sensors configured to measure one or more parameters of the illuminated produce; the additional sensor selected from a distance sensor, a lidar sensor, a depth sensor, a temperature sensor, an ultrasonic sensor, fluorescence sensor, X-ray sensor, XRF (X-ray fluorescence) sensor, MRI sensor, dielectric sensor, or any combination thereof.

5 . The system of claim 1 , wherein the one or more optical sensors comprise at least one hyperspectral camera.

6 . A system for determining external and/or internal attributes of a produce, the system comprising:

a halogen light source configured to illuminate the produce;

a light source sensor configured to generate a signal indicative of a spectral emission profile of the halogen light source, wherein the light source sensor is a temperature sensor or a current and/or voltage monitor;

one or more optical sensors operating in visual and/or non-visual spectra and configured to capture images of the illuminated produce; and

a processing unit programmed with a machine learning model configured to:

receive as an input the sensor signals or the spectral emission profile derived therefrom and output an optimal output voltage and/or current, based thereon:

receive spectral data from the one or more optical sensors; and

output an internal and/or external quality attribute of the produce based on the received sensor signals or the spectral emission profile derived therefrom and the received spectral data.

7 . The system of claim 6 , wherein the one or more optical sensors comprise at least one hyperspectral camera.

8 . The system of claim 6 , wherein the temperature sensor is selected from a thermal sensor, a thermocouple, a thermistor or any combination thereof.

9 . The system of claim 6 , further comprising a diode receptor configured to measure the intensity of the specific wavelength of the light emitted by the light source.