IP Library Granted Patent US 12699049
Granted Patent B2
US 12699049 · App. 18/122,106 · Granted Aug 4, 2026

Methods and systems to measure properties of moving products in device manufacturing machines

Inventors: Todd J. Egan (Fremont, CA); Avishek Ghosh (Maharashtra, IN); Edward W. Budiarto (Fremont, CA); Guoheng Zhao (Palo Alto, CA)
Assignee: Applied Materials, Inc.
G01N21/41G01B11/0625G01B11/303G01P13/00G01N2201/06113G01N2201/062G01N2201/127
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Quick Facts
Patent No.
US 12699049
App. No.
18/122,106
Granted
Aug 4, 2026
Kind
B2
Abstract

Described are systems and techniques directed to optical inspection of moving products (wafers, substrates, films, patterns) that are being transported to or from processing chambers in device manufacturing systems. Implementations include a system that has a first source of light to direct a first light to a first location on a surface of a product. The first light generates, at the first location, a first reflected light. The system further includes a first optical sensor to generate a first data representative of a first reflected light, and a processing device, in communication with the first optical sensor to determine, using the first data, a property of the product.

Claims (78)

1 . An optical device comprising:

a first source of light configured to direct a first light to a first location on a surface of a product, the product being transported to or from a processing chamber, wherein the first light generates, at the first location, a first reflected light;

a first optical sensor configured to:

generate, while the product is in motion, a first data representative of a first reflected light; and

a processing device, in communication with the first optical sensor, configured to:

determine, based at least on the first data, a misalignment of the product caused by transportation of the product and comprising at least one of:

a vertical displacement of the product, or

a tilt of the product; and

determine, using the first data, a property of the product.

2 . The optical device of claim 1 , wherein the first data is representative of a direction of the first reflected light; and

wherein the misalignment of the product is determined based at least on a direction of the first reflected light.

3 . The optical device of claim 1 , wherein the first optical sensor is further to:

generate a second data representative of intensity of the first reflected light; and

wherein to determine the property of the product, the processing device is to evaluate the second data in view of the misalignment of the product.

4 . The optical device of claim 3 , wherein to determine the property of the product, the processing device is to evaluate the second data in view of a calibration data, wherein the calibration data characterizes intensity of light reflected by a reference product for a plurality of tilt angles of a surface of the reference product.

5 . The optical device of claim 3 , wherein the second data is representative of an intensity of the first reflected light for a plurality of wavelengths.

6 . The optical device of claim 3 , wherein the second data is representative of an intensity of the first reflected light for a plurality of polarizations.

7 . The optical device of claim 3 , wherein the first source of light is further to direct a first light to a second location on the surface of the product, the first light to generate, at the second location, a second reflected light;

wherein the first optical sensor is further to generate a third data representative of intensity of the second reflected light; and

wherein to determine the property of the product, the processing device is further to evaluate the third data.

8 . The optical device of claim 1 , wherein the product comprises:

a substrate, and

one or more films deposited on the substrate, and wherein the property of the product comprises at least one of:

a thickness of at least one film of the one or more films,

a uniformity of at least one film of the one or more films, or

a smoothness of the surface of the product.

9 . The optical device of claim 1 , wherein the processing device is to cause the first source of light to direct the first light to the first location responsive to the first location being transported to a position that is aligned with a direction of the first light.

10 . The optical device of claim 1 , further comprising:

a second source of light to direct a second light to the first location on the surface of the product, the second light to generate, at the first location, a second reflected light; and

a second optical sensor to generate a second data representative of the second reflected light; and

wherein to determine the property of the product, the processing device is further to use the second data.

11 . The optical device of claim 1 , wherein the property of the product comprises at least one of a refractive index of the product or an extinction coefficient of the product.

12 . The optical device of claim 1 , further comprising:

a plurality of n sources of light comprising the first source of light, wherein each one of the n sources of light is to direct a respective light to each of a plurality of m locations on a surface of the product, to generate, at each one of the m locations, a respective reflected light;

a plurality of n optical sensors comprising the first optical sensor, wherein each of the n optical sensors is to:

detect the respective reflected light generated by a respective one of the n sources of light at each of the m locations on the surface of the product; and

generate m intensity data, wherein each of the m intensity data is representative of an intensity of the respective reflected light generated at a respective one of the m locations; and

wherein to determine the property of the product, the processing device is to use the m intensity data from each of the n optical sensors.

13 . The optical device of claim 12 , wherein at least one of the n optical sensors is to collect positional data for at least one of the m locations, the positional data being representative of the tilt of the product, and

wherein to determine the property of the product, the processing device is further to use the positional data.

14 . The optical device of claim 12 , wherein each one of the m locations is sequentially aligned, during transportation of the product, with the light directed by each of the n sources of light.

15 . The optical device of claim 12 , wherein each of the plurality of n optical sensors is to detect light within a respective range of wavelengths of a plurality of n ranges of wavelengths, and wherein each of the plurality of n ranges of wavelengths is centered differently than each other one of the plurality of n ranges of wavelengths.

16 . The optical device of claim 12 , wherein the processing device uses a light directed by at least one of the n sources of light to synchronize detection of a light reflected from one or more of the m locations on the surface of the product with a motion of the product.

17 . A method comprising:

directing a first light, produced by a first source of light, to a first location on a surface of a moving product, the product being transported to or from a processing chamber, wherein the first light is to generate, at the first location, a first reflected light;

generating, while the product is in motion, by a first optical sensor, a first data representative of a first reflected light;

determining, based at least on the first data, a misalignment of the product caused by transportation of the product and comprising at least one of:

a vertical displacement of the product, or

a tilt of the product; and

determining, using the first data, a property of the product.

18 . The method of claim 17 , wherein the first data is representative of a direction of the first reflected light; and

wherein determining the property of the product comprises:

determining, using the first data, a positioning of the surface of the product, the positioning comprising at least one of:

a vertical displacement of the surface of the product, or

a tilt of the surface of the product.

19 . The method of claim 17 , further comprising:

generating a second data representative of intensity of the first reflected light; and wherein determining the property of the prodcut comprises:

evaluating the second data in view of the misalignment of the product.

20 . The method of claim 17 , further comprising:

directing, by each of a plurality of n sources of light comprising the first source of light, a respective light to each of a plurality of m locations on a surface of the product, to generate, at each one of the m locations, a respective reflected light;

detecting, by each of a plurality of n optical sensors comprising the first optical sensor, the respective reflected light generated by a respective one of the n sources of light at each of the m locations on the surface of the product,

wherein each of the plurality of n optical sensors is detecting light within a respective range of wavelengths of a plurality of n ranges of wavelengths, and

wherein each of the plurality of n ranges of wavelengths is centered differently than each other one of the plurality of n ranges of wavelengths; and

generating m intensity data, wherein each of the m intensity data is representative of intensity of the respective reflected light generated at a respective one of the m locations; and

wherein determining the property of the product comprises using the m intensity data from each of the n optical sensors.

21 . A semiconductor manufacturing system, comprising:

a plurality of chambers comprising:

one or more processing chambers, and

a transfer chamber interfacing the one or more processing chambers;

a first source of light to:

direct a first light to a first location on a surface of a product, the product being transported between at least two of the plurality of chambers, the first light generating, at the first location, a first reflected light;

a first optical sensor to:

generate, while the product is in motion, a first data representative of a first reflected light; and

a processing device, in communication with the first optical sensor, to:

determine, based at least on the first data, a misalignment of the product caused by transportation of the product and comprising at least one of:

a vertical displacement of the product, or

a tilt of the product; and

determine, using the first data, a property of the product.