Robotic non-destructive testing probe mount
An apparatus for non-destructive testing of a component is disclosed herein. The apparatus comprises a robotic arm, a probe holder, a probe connected to the robotic arm via the probe holder, and a controller configured to move the robotic arm to move the probe over a surface of a component to be tested. The probe holder comprises a spring assembly for biasing the probe towards the surface of the component to be tested to keep the probe in contact therewith. The spring assembly comprises at least one pair of spring portions that are spaced apart along a first axis.
1 . A probe holder for holding a probe during non-destructive testing of a component, the probe holder comprising:
a spring assembly for biasing the probe in use towards a surface of a component to be tested to keep the probe in contact therewith, wherein the spring assembly comprises at least one pair of spring portions that are spaced apart along a first axis, the spring assembly configured such that in use when a probe held therein is moved over the surface of the component to be tested in a direction parallel to the first axis, the pair of spring portions that are spaced apart along the first axis maintain the probe in a certain orientation relative to the surface of a component to be tested, wherein the at least one pair of spring portions comprises a pair of c-shaped springs;
wherein the probe holder comprises a plurality of probe holder parts including a first probe holder part and a second probe holder part,
wherein the first probe holder part and second probe holder part are configured to hold a probe for non-destructive testing therebetween in use,
wherein the first probe holder part and second probe holder part are spaced apart in a second direction perpendicular to the first axis,
wherein each of the first probe holder part and second probe holder part comprise a respective pair of spring portions spaced apart along the first axis,
wherein each of the first probe holder part and second probe holder part comprises an upper portion for connection to a robotic arm and a lower portion arranged to support the probe,
wherein the respective pairs of spring portions for each of the first probe holder part and second probe holder part connect between the respective upper portion and lower portion of the first probe holder part and second probe holder part,
wherein each c-shaped spring of the pair of c-shaped springs comprise an open section and a curved section, and
wherein the curved section of each c-shaped spring comprises a single curvature extending from the lower portion to the upper portion of the probe holder.
2 . The probe holder of claim 1 , wherein each of the first probe holder part and second probe holder part are integrally formed.
3 . The probe holder of claim 1 , wherein the curved section of at least one of the c-shaped springs further comprises a cut-out portion.
4 . The probe holder of claim 1 , wherein the probe holder is made from plastic.
5 . The probe holder of claim 1 , comprising a connecting tab that connects between the first probe holder part and second probe holder part, the connecting tab being provided by one of the first probe holder part and second probe holder part and designed to fit into a corresponding slot on the other of the first probe holder part and second probe holder part.
6 . An apparatus for non-destructive testing of a component, the apparatus comprising:
a robotic arm;
the probe holder according to claim 1 ;
the probe connected to the robotic arm via the probe holder; and
a controller configured to move the robotic arm to move the probe over a surface of a component to be tested.
7 . The apparatus of claim 6 , wherein the robotic arm comprises an end effector, wherein the end effector comprises a first holding element and a second holding element configured to be moveable towards one another, wherein the first probe holder part is removably connected to the first holding element and the second probe holder part is removably connected to the second holding element, such that when the first holding element and second holding element of the end effector are moved towards one another, the first probe holder part and second probe holder part are moved together to hold the probe.