IP Library Granted Patent US 12699192
Granted Patent B2
US 12699192 · App. 18/016,273 · Granted Aug 4, 2026

Detection substrate and ray detector

Inventors: Jianxing Shang (Beijing, CN); Zhenyu Wang (Beijing, CN); Zhenwu Jiang (Beijing, CN); Liyou Xiao (Beijing, CN)
Assignees: Beijing BOE Sensor Technology Co., Ltd.; BOE Technology Group Co., Ltd.
G01T1/20182H10F39/1898
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Quick Facts
Patent No.
US 12699192
App. No.
18/016,273
Granted
Aug 4, 2026
Kind
B2
Abstract

The disclosure provides a detection substrate and a ray detector, the detection substrate including a base substrate, an average atomic number of a material used for the base substrate being less than 30, a ray mass attenuation coefficient of the material used for the base substrate being positively correlated with power of 3-4 of the average atomic number, and the base substrate including a ray incident side; a photodiode on a side of the base substrate, and the side of the base substrate with the photodiode facing away from the ray incident side; and a scintillator layer on a side of the layer of the photodiode away from the base substrate.

Claims (31)

1 . A detection substrate, comprising:

a base substrate, wherein an average atomic number of a material used for the base substrate is less than 30, a ray mass attenuation coefficient of the material used for the base substrate is positively correlated with power of 3-4 of the average atomic number, and the base substrate comprises a ray incident side;

a photodiode on a side of the base substrate, wherein the side of the base substrate with the photodiode faces away from the ray incident side; and

a scintillator layer, on a side of a layer of the photodiode away from the base substrate;

wherein the detection substrate further comprises a first planarization layer between a layer of the photodiode and the base substrate;

wherein the photodiode comprises a first electrode, a photovoltaic conversion material layer and a second electrode arranged in stack, and the second electrode is adjacent to the scintillator layer;

wherein the detection substrate further comprises a driving circuit, wherein

a layer of the driving circuit is disposed between the base substrate and the first planarization layer; and

the driving circuit is electrically connected with the first electrode through a via running through the first planarization layer.

2 . The detection substrate according to claim 1 , wherein the base substrate is a flexible substrate.

3 . The detection substrate according to claim 2 , wherein a material of the flexible substrate comprises at least one of polyimide, polyethylene glycol terephthalate, polyethylene naphthalate, polymethyl methacrylate, organic silica gel or resin.

4 . The detection substrate according to claim 3 , wherein the flexible substrate comprises a polyimide layer.

5 . The detection substrate according to claim 4 , wherein the flexible substrate further comprises a polyethylene glycol terephthalate layer, and the polyethylene glycol terephthalate layer is disposed on a side of the polyimide layer away from the layer of the photodiode.

6 . The detection substrate according to claim 4 , wherein a thickness of the polyimide layer is less than 100 μm in a direction perpendicular to the base substrate.

7 . The detection substrate according to claim 1 , wherein the base substrate is a rigid substrate.

8 . The detection substrate according to claim 1 , wherein a thickness of the base substrate is less than or equal to 1000 μm in a direction perpendicular to the base substrate.

9 . The detection substrate according to claim 1 , wherein a glass-transition temperature of the base substrate is greater than 200° C.

10 . The detection substrate according to claim 1 , wherein an orthographic projection of the driving circuit on the base substrate is located in an orthographic projection of the photovoltaic conversion material layer on the base substrate.

11 . The detection substrate according to claim 1 , wherein an orthographic projection of the driving circuit on the base substrate does not overlap an orthographic projection of the photovoltaic conversion material layer on the base substrate.

12 . The detection substrate according to claim 1 , wherein the driving circuit comprises an amorphous-silicon transistor, and the amorphous-silicon transistor is a top-gate transistor or a bottom-gate transistor.

13 . The detection substrate according to claim 1 , wherein the driving circuit comprises an oxide transistor, and the oxide transistor is a bottom-gate transistor.

14 . A ray detector, comprising a detection substrate and a ray source, wherein the detection substrate comprises:

a base substrate, wherein an average atomic number of a material used for the base substrate is less than 30, a ray mass attenuation coefficient of the material used for the base substrate is positively correlated with power of 3-4 of the average atomic number, and the base substrate comprises a ray incident side;

a photodiode on a side of the base substrate, wherein the side of the base substrate with the photodiode faces away from the ray incident side; and

a scintillator layer, on a side of a layer of the photodiode away from the base substrate;

and rays emitted by the ray source irradiate into the detection substrate from the ray incident side;

wherein the detection substrate further comprises a first planarization layer between a layer of the photodiode and the base substrate;

wherein the photodiode comprises a first electrode, a photovoltaic conversion material layer and a second electrode arranged in stack, and the second electrode is adjacent to the scintillator layer;

wherein the detection substrate further comprises a driving circuit, wherein

a layer of the driving circuit is disposed between the base substrate and the first planarization layer; and

the driving circuit is electrically connected with the first electrode through a via running through the first planarization layer.