IP Library Granted Patent US 12699236
Granted Patent B2
US 12699236 · App. 18/372,750 · Granted Aug 4, 2026

Optical devices, systems, and methods for waveguide alignment

Inventors: Hassid C. Gurgov (Binyamina, IL); Liron Gantz (Haifa, IL); Thomas Hastings Greer, III (Chapel Hill, NC)
Assignee: Mellanox Technologies, Ltd.
G02B6/4222G01M11/31
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Quick Facts
Patent No.
US 12699236
App. No.
18/372,750
Granted
Aug 4, 2026
Kind
B2
Abstract

Apparatuses, systems, and methods are provided for waveguide alignment. An example optical module includes a substrate, one or more primary waveguides supported by the substrate, and an optoelectronic component supported by the substrate and in optical communication with the one or more primary waveguides. The optoelectronic component uses optical signals having a first wavelength. The optical module further includes a signal reflection component configured to selectively reflect optical signals having a second wavelength so as to determine an alignment of the one or more primary waveguides. In some instances the one or more primary waveguides define the signal reflection component(s). In other instances, one or more secondary waveguides are supported by the substrate and define the signal reflection component(s).

Claims (38)

1 . An optical module comprising:

a substrate;

one or more primary waveguides supported by the substrate, the one or more primary waveguides configured to transmit optical signals having a first wavelength;

an optoelectronic component supported by the substrate and in optical communication with the one or more primary waveguides, wherein the optoelectronic component is configured for use with the optical signals having the first wavelength that are received from the one or more primary waveguides; and

a signal reflection component configured to selectively reflect optical signals having a second wavelength back along a path in which the optical signals having the second wavelength were received so as to determine an alignment of the one or more primary waveguides.

2 . The optical module according to claim 1 , wherein the second wavelength is different than the first wavelength.

3 . The optical module according to claim 1 , wherein the one or more primary waveguides define the signal reflection component.

4 . The optical module according to claim 3 , wherein the one or more primary waveguides further comprise a plurality of primary waveguides each defining respective signal reflection components.

5 . The optical module according to claim 1 , further comprising one or more secondary waveguides supported by the substrate.

6 . The optical module according to claim 5 , wherein the one or more secondary waveguides define the signal reflection component.

7 . The optical module according to claim 6 , wherein at least one of the one or more primary waveguides is bounded on the substrate by a pair of secondary waveguides defining respective signal reflection components.

8 . The optical module according to claim 1 , wherein the one or more primary waveguides further comprise at least a first primary waveguide, the optical module further comprising:

a pair of secondary waveguides supported by the substrate on opposing sides of the first primary waveguide, wherein each of the pair of secondary waveguides define respective signal reflection components.

9 . The optical module according to claim 1 , wherein the signal reflection component comprises a Bragg grating.

10 . The optical module according to claim 9 , wherein a reflection coefficient of the Bragg grating is configured to reflect optical signals having the second wavelength.

11 . The optical module according to claim 5 , wherein the one or more secondary waveguides are disposed along a peripheral edge of the substrate so as to form a loopback, and the signal reflection component configured to selectively direct optical signals having a second wavelength into the one or more secondary waveguides forming the loopback.

12 . An optical testing system comprising:

the optical module according to claim 3 ; and

a testing device optically coupled with the one or more primary waveguides and configured to:

provide the optical signals having the second wavelength to the one or more primary waveguides; and

determine the alignment of the one or more primary waveguides based upon a reflection of the optical signals having the second wavelength.

13 . An optical testing system comprising:

the optical module according to claim 5 ; and

a testing device optically coupled with the one or more secondary waveguides and configured to:

provide the optical signals having the second wavelength to the one or more secondary waveguides; and

determine the alignment of the one or more primary waveguides based upon a reflection of the optical signals having the second wavelength.

14 . A method of manufacturing an optical module, the method comprising:

providing a substrate;

supporting one or more primary waveguides on the substrate, the one or more primary waveguides configured to transmit optical signals having a first wavelength;

supporting an optoelectronic component on the substrate and in optical communication with the one or more primary waveguides, wherein the optoelectronic component is configured for use with the optical signals having the first wavelength that are received from the one or more primary waveguides; and

providing a signal reflection component configured to selectively reflect optical signals having a second wavelength back along a path in which the optical signals having the second wavelength were received so as to determine an alignment of the one or more primary waveguides.

15 . The method according to claim 14 , wherein the second wavelength is different than the first wavelength.

16 . The method according to claim 14 , wherein the one or more primary waveguides define the signal reflection component.

17 . The method according to claim 14 , further comprising supporting one or more secondary waveguides on the substrate.

18 . The method according to claim 17 , wherein the one or more secondary waveguides define the signal reflection component.

19 . The method according to claim 18 , wherein at least one of the one or more primary waveguides are bounded on the substrate by a pair of secondary waveguides defining respective signal reflection components.

20 . The method according to claim 14 , wherein the one or more primary waveguides further comprise at least a first primary waveguide, the method further comprising:

supporting a pair of secondary waveguides on the substrate on opposing sides of the first primary waveguide, wherein each of the pair of secondary waveguides define respective signal reflection components.