IP Library Granted Patent US 12699411
Granted Patent B2
US 12699411 · App. 18/491,809 · Granted Aug 4, 2026

Reference current source

Inventor: Yasuhiro Kamijima (Nagano, JP)
Assignee: ABLIC Inc.
G05F3/245G05F1/468
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Quick Facts
Patent No.
US 12699411
App. No.
18/491,809
Granted
Aug 4, 2026
Kind
B2
Abstract

A reference current source 100 includes a reference voltage circuit 110 , generating a reference voltage Vref; a voltage division circuit 130 , dividing the reference voltage Vref and outputting a divided voltage Vdiv; and an output MOS transistor 140 , supplying a reference current Iref in response to the divided voltage Vdiv being applied to a gate terminal 140 G. The reference voltage circuit 110 includes a depletion type MOS transistor 111 , and an enhancement type MOS transistor 112 having same conductivity type and impurity concentration as a channel 111 c of the depletion type MOS transistor 111 and a different Fermi level from a gate electrode 111 g of the depletion type MOS transistor 111 . The voltage division circuit 130 outputs the divided voltage Vdiv within a voltage range which is 0V or above and lower than a cross point X to the gate terminal 140 G of the output MOS transistor 140.

Claims (10)

1 . A reference current source, comprising:

a reference voltage circuit, generating a reference voltage;

a buffer amplifier including an output terminal and a non-inverting input terminal connecting to the reference voltage circuit to receive the reference voltage;

a voltage division circuit, connecting to the output terminal of the buffer amplifier and dividing the reference voltage and outputting a divided voltage; and

an output MOS transistor, supplying a reference current in response to the divided voltage being applied to a gate terminal,

wherein the reference voltage circuit comprises:

a depletion type MOS transistor; and

an enhancement type MOS transistor, having same conductivity type and impurity concentration as a channel of the depletion type MOS transistor and a different Fermi level from a gate electrode of the depletion type MOS transistor,

wherein the voltage division circuit outputs the divided voltage to a gate terminal of the output MOS transistor, wherein the divided voltage is within a voltage range which is above OV and lower than a cross point at which a gate voltage-drain current characteristic of the output MOS transistor does not depend on temperature in order that a positive temperature coefficient of a drain current of the output MOS transistor cancels a negative temperature coefficient of the reference voltage, wherein the divided voltage cancels a temperature characteristic of the reference voltage so that the drain current of the output MOS transistor does not fluctuate with temperature.

2 . The reference current source according to claim 1 , wherein the voltage division circuit comprises a trimming circuit capable of adjusting the divided voltage.