Multilayer ceramic electronic component
An internal electrode layer includes therein a plurality of inner ceramic particles within an observation range of a cross-section intersecting the internal electrode layer. The position of the inner ceramic particles in the internal electrode layer relative to the center position of the internal electrode layer in the thickness direction is correlated with the position from the center position to the edge position, and the corresponding positions are indicated by the numbers 0-100. Such an index is referred to as Dsp. Inside the internal electrode layer, within a region of Dsp of 40 or less, preferably 30 or less, the inner ceramic particles are present in an area of at least 50% of the total area of the inner ceramic particles present within the observation range.
1 . A multilayer ceramic electronic component comprising ceramic layers and internal electrode layers alternately stacked,
wherein
the internal electrode layers contain a plurality of inner ceramic particles therein within an observation range of a cross section intersecting the internal electrode layers, and
the inner ceramic particles are present in 50% or more of a total area of the inner ceramic particles present within a region with a Dsp of 40 or less inside the internal electrode layers, where
Dsp is an index indicating a relative position of the inner ceramic particles in the inner electrode layers with respect to a central position in a thickness direction of the inner electrode layers, the index being expressed by a number from 0 to 100, each number corresponding to a position from the central position to an edge position.
2 . A multilayer ceramic electronic component comprising ceramic layers and internal electrode layers alternately stacked,
wherein
the internal electrode layers contain a plurality of inner ceramic particles therein within an observation range of a cross section intersecting with the internal electrode layers, and
the inner ceramic particles are present in 99% or more of a total area of the inner ceramic particles present within a region with a Dsp of 75 or less inside the internal electrode layers, where
Dsp is an index indicating a relative position of the inner ceramic particles in the inner electrode layers with respect to a central position in a thickness direction of the inner electrode layers, the index being expressed by a number from 0 to 100, each number corresponding to a position from the central position to an edge position.
3 . The multilayer ceramic electronic component according to claim 1 , wherein a ratio of the total area of the inner ceramic particles to a total area of the internal electrode layers present within the observation range is 2.5% or less.
4 . The multilayer ceramic electronic component according to claim 1 , wherein the inner ceramic particles present within the observation range have a maximum particle size of 69 nm or less.
5 . The multilayer ceramic electronic component according to claim 1 , wherein the number of the inner ceramic particles per 50 μm area of the internal electrode layers present within the observation range is 185 or less.
6 . The multilayer ceramic electronic component according to claim 2 , wherein a ratio of the total area of the inner ceramic particles to a total area of the internal electrode layers present within the observation range is 2.5% or less.
7 . The multilayer ceramic electronic component according to claim 2 , wherein the inner ceramic particles present within the observation range have a maximum particle size of 69 nm or less.
8 . The multilayer ceramic electronic component according to claim 2 , wherein the number of the inner ceramic particles per 50 μm 2 area of the internal electrode layers present within the observation range is 185 or less.