IP Library Granted Patent US 12700867
Granted Patent B2
US 12700867 · App. 18/497,464 · Granted Aug 4, 2026

Delay element gain calibration

Inventors: Yunliang Zhu (San Diego, CA); Yiwu Tang (San Diego, CA)
Assignee: Qualcomm Incorporated
H03L7/081H03K5/131H03L7/085H03K2005/00058
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12700867
App. No.
18/497,464
Filed
Oct 30, 2023
Granted
Aug 4, 2026
Kind
B2
Examiner
CHENG, DIANA
Art Unit
2836
USPC
327/158
Abstract

Certain aspects of the present disclosure are directed towards a method for delay element calibration. The method generally includes: incrementing a calibration delay control signal provided to a delay element to generate an output clock signal by delaying an input clock signal; comparing, via a phase detector (PD), the input clock signal and the output clock signal to generate a PD output signal; and accumulating, via a first accumulator, the PD output signal to generate a calibration output signal.

Claims (51)

1 . A method for delay element calibration, comprising:

incrementing a calibration delay control signal provided to a delay element to generate an output clock signal by delaying an input clock signal, wherein the calibration delay control signal comprises a delay gain control signal configured to incrementally adjust a gain of the delay element, the gain of the delay element comprising an amount of change in delay associated with the delay element in response to a change in a delay tuning voltage;

comparing, via a phase detector (PD), phases of the input clock signal and the output clock signal to generate a PD output signal; and

accumulating, via a first accumulator, the PD output signal to generate a calibration output signal.

2 . The method of claim 1 , further comprising controlling, via the delay tuning voltage, the delay of the delay element based on the calibration output signal, wherein the delay is controlled separately from the gain.

3 . The method of claim 1 , further comprising:

generating, via a voltage generator, the delay tuning voltage; and

providing the delay tuning voltage to the delay element, wherein the output clock signal is generated based on the delay tuning voltage.

4 . The method of claim 3 , further comprising:

calculating a mission mode delay control signal based on the calibration output signal, a target delay control signal, and the delay tuning voltage; and

providing the mission mode delay control signal to the delay element to generate a delayed signal during a mission mode of operation, the delayed signal having a time delay controlled by the mission mode delay control signal.

5 . The method of claim 1 , further comprising frequency dividing, via a timing control circuit, the input clock signal to yield a frequency-divided signal, wherein the PD output signal is accumulated via the first accumulator based on the frequency-divided signal.

6 . The method of claim 5 , wherein the calibration delay control signal is incremented, via a second accumulator, based on the frequency-divided signal.

7 . The method of claim 1 , wherein comparing the input clock signal and the output clock signal comprises sampling the output clock signal based on the input clock signal.

8 . The method of claim 7 , wherein the output clock signal is sampled at a rising edge of the input clock signal.

9 . The method of claim 1 , wherein the input clock signal comprises an oscillating signal generated via a voltage-controlled oscillator (VCO).

10 . The method of claim 9 , wherein the VCO is part of a phase-locked loop (PLL).

11 . An apparatus for delay element calibration, comprising:

a delay element;

a first accumulator configured to increment a calibration delay control signal provided to the delay element, wherein the delay element is configured to generate an output clock signal by delaying an input clock signal based on the calibration delay control signal, wherein the calibration delay control signal comprises a delay gain control signal configured to incrementally adjust a gain of the delay element, the gain of the delay element comprising an amount of change in delay associated with the delay element in response to a change in a delay tuning voltage;

a phase detector (PD) having a first input coupled to an input of the delay element and having a second input coupled to an output of the delay element, the PD being configured to generate a PD output signal based on a phase difference between the input clock signal and the output clock signal; and

a second accumulator having an input coupled to an output of the PD and configured to accumulate the PD output signal to generate a calibration output signal.

12 . The apparatus of claim 11 , further comprising a voltage generator having an output coupled to a control input of the delay element, the voltage generator being configured to generate the delay tuning voltage and provide the delay tuning voltage to the delay element to control the delay associated with the delay element separately from the gain, wherein the delay element is configured to generate the output clock signal based on the delay tuning voltage.

13 . The apparatus of claim 12 , further comprising a controller having an input coupled to an output of the second accumulator and an output coupled to the control input of the delay element, the controller being configured to:

calculate a mission mode delay control signal based on the calibration output signal, a target delay control signal, and the delay tuning voltage; and

provide the mission mode delay control signal to the delay element to generate a delayed signal during mission mode of operation.

14 . The apparatus of claim 11 , further comprising a timing control circuit having an input coupled to the input of the delay element, the timing control circuit being configured to frequency divide the input clock signal to yield a frequency-divided signal, wherein the second accumulator has a clock input coupled to an output of the timing control circuit and is configured to accumulate the PD output signal based on the frequency-divided signal.

15 . The apparatus of claim 14 , wherein the first accumulator has an input coupled to the output of the timing control circuit and is configured to increment the calibration delay control signal based on the frequency-divided signal.

16 . The apparatus of claim 11 , wherein, to generate the PD output signal, the PD is configured to sample the output clock signal based on the input clock signal.

17 . The apparatus of claim 16 , wherein the PD is configured to sample the output clock signal at a rising edge of the input clock signal.

18 . The apparatus of claim 11 , wherein a voltage-controlled oscillator (VCO) is configured to generate the input clock signal.

19 . The apparatus of claim 18 , further comprising a phase-locked loop (PLL) including the VCO.

20 . The apparatus of claim 11 , further comprising a digital-to-time converter (DTC) including the delay element.

21 . An apparatus for delay element calibration, comprising:

means for incrementing a calibration delay control signal;

means for delaying an input clock signal to generate an output clock signal based on the calibration delay control signal, wherein the calibration delay control signal comprises a delay gain control signal configured to incrementally adjust a gain of the means for delaying, the gain of the means for delaying comprising an amount of change in delay associated with the means for delaying in response to a change in a delay tuning voltage;

means for detecting a phase of the output clock signal based on the input clock signal to generate a phase detection output signal; and

means for accumulating the phase detection output signal to generate a calibration output signal.

22 . The apparatus of claim 21 , further comprising means for controlling, via the delay tuning voltage, the delay of the delay element based on the calibration output signal, wherein the delay is controlled separately from the gain.

23 . An apparatus for delay element calibration, comprising:

a delay element;

a phase detector (PD) having a first input coupled to an input of the delay element and having a second input coupled to an output of the delay element;

a first accumulator having an input coupled to the input of the delay element, wherein the first accumulator comprises a delay gain control output coupled to the delay element, the delay gain control output being configured to control a gain of the delay element comprising an amount of change in delay associated with the delay element in response to a change in a delay tuning voltage; and

a second accumulator having a clock input coupled to an output of the PD.

24 . The apparatus of claim 23 , further comprising a voltage generator having an output coupled to a control input of the delay element.

25 . The apparatus of claim 24 , further comprising a controller having an input coupled to an output of the second accumulator and an output coupled to the control input of the delay element.

26 . The apparatus of claim 23 , further comprising a timing control circuit having an input coupled to the input of the delay element, wherein the clock input of the second accumulator is coupled to an output of the timing control circuit.

27 . The apparatus of claim 26 , wherein the first accumulator has another input coupled to the output of the timing control circuit.

28 . The apparatus of claim 23 , wherein the input of the delay element is coupled to an output of a voltage-controlled oscillator (VCO).

29 . The apparatus of claim 28 , further comprising a phase-locked loop (PLL) including the VCO.

30 . The apparatus of claim 23 , further comprising a digital-to-time converter (DTC) including the delay element.