Wireless electronic device, wireless communication method for beam failure recovery

1 . An electronic device, comprising:

processing circuitry, configured to:

receive first configuration information of a first reference signal set and second configuration information of a second reference signal set from a base station,

wherein the first configuration information is set independently from the second configuration information,

wherein the first reference signal set corresponds to a first transmission and reception point (TRP), and the second reference signal set associated with a second TRP different from the first TRP, and

wherein the first reference signal set comprises one or more first reference signals, and the second reference signal set comprises one or more second reference signals,

based on the first configuration information, determine whether a first beam failure event occurs for the first reference signal set based on measured signal qualities of at least one of the first reference signals; and

based on the second configuration information, determine whether a second beam failure event occurs for the second reference signal set based on measured signal qualities of at least one of the second reference signals,

wherein the processing circuitry determines whether the first beam failure event occurs for the first reference signal set by:

measuring a signal quality of the at least one of the first reference signals, and incrementing a first counter associated with the first reference signal set when the signal quality of a reference signal in the first reference signal set is worse than a first threshold, and

when the first counter reaches a first maximum count, transmitting a first beam failure recovery request for the first reference signal set,

wherein the processing circuitry determines whether the second beam failure event occurs for the second reference signal set by:

measuring a signal quality of at least one of the second reference signals, and incrementing a second counter associated with the second reference signal set when the signal quality of a reference signal in the second reference signal set is worse than a second threshold, and

when the second counter reaches a second maximum count, transmitting a second beam failure recovery request for the second reference signal set,

wherein the first and second beam failure recovery requests are each included in a single message that comprises a first octet and at least one second octet,

wherein a part of the first octet indicates whether the first beam failure event occurs on the first reference signal set and another part of the first octet indicates whether the second beam failure event occurs on the second reference signal set, and

wherein the at least one second octet identifies a candidate beam to replace a beam associated with the first or second beam failure event.

2 . The electronic device according to claim 1 ,

wherein the first and second beam errors occur simultaneously.

3 . The electronic device according to claim 1 , wherein

the first threshold is different from the second threshold, or

the first maximum count is different from the second maximum count.

4 . The electronic device according to claim 1 , wherein the processing circuitry is further configured to:

transmit the first octet to the base station through a scheduling request from a physical layer to request uplink resources from the base station.

5 . The electronic device according to claim 4 , wherein the transmitted scheduling request is associated with the beam failure reference signal.

6 . The electronic device according to claim 4 , wherein the processing circuitry is further configured to:

based on the requested uplink resources, transmit the second octet to the base station through a media access control element or an aperiodic channel state information report.

7 . The electronic device according to claim 6 , wherein the media access control element or the aperiodic channel state information report comprises identification information of the candidate beam corresponding to the beam failure reference signal.

8 . The electronic device according to claim 1 , wherein

the at least one of the first reference signals comprises at least two of the first reference signals, or

the at least one of the second reference signals comprises at least two of the second reference signals.

9 . A method performed by an electronic device, the method comprising:

receiving first configuration information of a first reference signal set and second configuration information of a second reference signal set from a base station,

wherein the first configuration information is set independently from the second configuration information,

wherein the first reference signal set corresponds to a first transmission and reception point (TRP), and the second reference signal set corresponds to a second TRP different from the first TRP, and

wherein the first reference signal set comprises one or more first reference signals, and the second reference signal set comprises one or more second reference signals,

based on the first configuration information, determining whether a first beam failure event occurs for the first reference signal set based on measured signal qualities of at least one of the first reference signals; and

based on the second configuration information, determining whether a second beam failure event occurs for the second reference signal set based on measured signal qualities of at least one of the second reference signals,

wherein the processing circuitry determines whether the first beam failure event occurs for the first reference signal set by:

measuring a signal quality of the at least one of the first reference signals, and incrementing a first counter associated with the first reference signal set when the signal quality of a reference signal in the first reference signal set is worse than a first threshold, and

when the first counter reaches a first maximum count, transmitting a first beam failure recovery request for the first reference signal set, and

wherein the processing circuitry determines whether the second beam failure event occurs for the second reference signal set by:

measuring a signal quality of the at least one of the second reference signals, and incrementing a second counter associated with the second reference signal set when the signal quality of a reference signal in the second reference signal set is worse than a second threshold, and

when the second counter reaches a second maximum count, transmitting a second beam failure recovery request for the second reference signal set,

wherein the first and second beam failure recovery requests are each included in a single message that comprises a first octet and at least one second octet,

wherein a part of the first octet indicates whether the first beam failure event occurs on the first reference signal set and another part of the first octet indicates whether the second beam failure event occurs on the second reference signal set, and

wherein the at least one second octet identifies a candidate beam to replace a beam associated with the first or second beam failure event.

10 . An electronic device, the electronic device configured as a base station and comprising:

processing circuitry, configured to:

transmit, to another device, first configuration information of a first reference signal set and second configuration information of a second reference signal set from a base station,

wherein the first configuration information is set independently from the second configuration information,

wherein the first reference signal set corresponds to a first transmission and reception point (TRP), and the second reference signal set associated with a second TRP different from the first TRP, and

wherein the first reference signal set comprises one or more first reference signals, and the second reference signal set comprises one or more second reference signals,

based on the first configuration information, the other device determines whether a first beam failure event occurs for the first reference signal set based on measured signal qualities of at least one of the first reference signals; and

based on the second configuration information, the other device determines whether a second beam failure event occurs for the second reference signal set based on measured signal qualities of at least one of the second reference signals,

wherein the other device determines whether the first beam failure event occurs for the first reference signal set by:

measuring a signal quality of the at least one of the first reference signals, and incrementing a first counter associated with the first reference signal set when the signal quality of a reference signal in the first reference signal set is worse than a first threshold, and

when the first counter reaches a first maximum count, transmitting a first beam failure recovery request for the first reference signal set,

wherein the processing circuitry is configured to receive and process the first beam failure recovery request,

wherein the other device determines whether the second beam failure event occurs for the second reference signal set by:

measuring a signal quality of at least one of the second reference signals, and incrementing a second counter associated with the second reference signal set when the signal quality of a reference signal in the second reference signal set is worse than a second threshold, and

when the second counter reaches a second maximum count, transmitting a second beam failure recovery request for the second reference signal set,

wherein the processing circuitry is configured to receive and process the second beam failure recovery request,

wherein the first and second beam failure recovery requests are each included in a single message that comprises a first octet and at least one second octet,

wherein a part of the first octet indicates whether the first beam failure event occurs on the first reference signal set and another part of the first octet indicates whether the second beam failure event occurs on the second reference signal set, and

wherein the at least one second octet identifies a candidate beam to replace a beam associated with the first or second beam failure event.

11 . A method performed by an electronic device configured as a base station, the method comprising:

transmitting, to another device, first configuration information of a first reference signal set and second configuration information of a second reference signal set from a base station,

wherein the first configuration information is set independently from the second configuration information,

wherein the first reference signal set corresponds to a first transmission and reception point (TRP), and the second reference signal set associated with a second TRP different from the first TRP, and

wherein the first reference signal set comprises one or more first reference signals, and the second reference signal set comprises one or more second reference signals,

based on the first configuration information, the other device determines whether a first beam failure event occurs for the first reference signal set based on measured signal qualities of at least one of the first reference signals; and

based on the second configuration information, the other device determines whether a second beam failure event occurs for the second reference signal set based on measured signal qualities of at least one of the second reference signals,

wherein the other device determines whether the first beam failure event occurs for the first reference signal set by:

measuring a signal quality of the at least one of the first reference signals, and incrementing a first counter associated with the first reference signal set when the signal quality of a reference signal in the first reference signal set is worse than a first threshold, and

when the first counter reaches a first maximum count, transmitting a first beam failure recovery request for the first reference signal set,

wherein the processing circuitry is configured to receive and process the first beam failure recovery request,

wherein the other device determines whether the second beam failure event occurs for the second reference signal set by:

measuring a signal quality of at least one of the second reference signals, and incrementing a second counter associated with the second reference signal set when the signal quality of a reference signal in the second reference signal set is worse than a second threshold, and

when the second counter reaches a second maximum count, transmitting a second beam failure recovery request for the second reference signal set; and

receiving and processing the second beam failure recovery request,

wherein the first and second beam failure recovery requests are each included in a single message that comprises a first octet and at least one second octet,

wherein a part of the first octet indicates whether the first beam failure event occurs on the first reference signal set and another part of the first octet indicates whether the second beam failure event occurs on the second reference signal set, and

wherein the at least one second octet identifies a candidate beam to replace a beam associated with the first or second beam failure event.