IP Library Granted Patent US 12701770
Granted Patent B2
US 12701770 · App. 18/169,218 · Granted Aug 4, 2026

Power module including a semiconductor device with parasitic diode

Inventor: Yan-Ru Chen (Hsinchu City, TW)
Assignee: Hon Young Semiconductor Corporation
H10D64/647H10D30/028H10D30/601H10D84/143H10D84/146
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Quick Facts
Patent No.
US 12701770
App. No.
18/169,218
Granted
Aug 4, 2026
Kind
B2
Abstract

A semiconductor device includes a substrate, an epitaxial layer on the substrate, a first well region in the epitaxial layer, a source region in the first well region, a source contact, a base region wrapping around a sidewall of the source contact and a second well region wrapping around the base region. The substrate, the epitaxial layer and the source region include a plurality of dopants of a first semiconductor type. A bottom of the source contact is lower than a bottom of the first well region. The base region and the second well region include a plurality of dopants of a second semiconductor type. The second semiconductor type is different from the first semiconductor type, and a doping concentration of the base region is higher than a doping concentration of the first well region and a doping concentration of the second well region.

Claims (11)

1 . A semiconductor device, comprising:

a substrate;

an epitaxial layer on the substrate;

a first well region in the epitaxial layer;

a source region in the first well region, wherein the substrate, the epitaxial layer and the source region comprise a plurality of dopants of a first semiconductor type;

a source contact, wherein a bottom of the source contact is lower than a bottom of the first well region;

a base region wrapping around a sidewall of the source contact; and

a second well region wrapping around the base region, wherein the first well region, the base region and the second well region comprise a plurality of dopants of a second semiconductor type, the second semiconductor type is different from the first semiconductor type, and a doping concentration of the base region is higher than a doping concentration of the first well region and a doping concentration of the second well region, and the second well region is closer to the substrate than the first well region is.

2 . The semiconductor device of claim 1 , wherein a lower portion of the source contact and the source region are separated by the base region.

3 . The semiconductor device of claim 1 , wherein the base region and the source region are separated by the second well region.

4 . The semiconductor device of claim 1 , wherein a bottom of the base region is lower than the bottom of the first well region.