IP Library Granted Patent US 12701822
Granted Patent B2
US 12701822 · App. 18/340,290 · Granted Aug 4, 2026

Method of manufacturing semiconductor light-emitting element

Inventors: Noritaka Niwa (Ishikawa, JP); Tetsuhiko Inazu (Ishikawa, JP)
Assignee: NIKKISO CO., LTD.
H10H20/01335
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Quick Facts
Patent No.
US 12701822
App. No.
18/340,290
Granted
Aug 4, 2026
Kind
B2
Abstract

A method of manufacturing a semiconductor light-emitting element includes: forming an active layer of an AlGaN-based semiconductor material on an n-type semiconductor layer of an n-type AlGaN-based semiconductor material; forming a p-type semiconductor layer on the active layer; removing a portion of the p-type semiconductor layer and the active layer by dry etching to expose an upper surface of the n-type semiconductor layer; treating the upper surface of the n-type semiconductor layer with a plasma in an atmosphere including an N 2 gas and an NH 3 gas; and forming a n-side contact electrode on the upper surface of the n-type semiconductor layer treated with the plasma.

Claims (10)

1 . A method of manufacturing a semiconductor light-emitting element, comprising:

forming an active layer of an AlGaN-based semiconductor material on an n-type semiconductor layer of an n-type AlGaN-based semiconductor material;

forming a p-type semiconductor layer on the active layer;

removing a portion of the p-type semiconductor layer and the active layer by dry etching to expose an upper surface of the n-type semiconductor layer;

treating the upper surface of the n-type semiconductor layer with a plasma in an atmosphere including an N 2 gas and an NH 3 gas; and

forming an n-side contact electrode on the upper surface of the n-type semiconductor layer treated with the plasma,

wherein substantially only the N 2 gas and the NH 3 gas are included in the atmosphere of the plasma treating, and

wherein a volume ratio of the NH 3 gas in the atmosphere in the treating with a plasma is equal to or more than 4.6% and equal to or less than 18.8%.

2 . The method of manufacturing a semiconductor light-emitting element according to claim 1 , wherein

a treatment time in the treating with a plasma is equal to or more than 10 seconds and equal to or less than 90 seconds.