Method of marking semiconductor package
A method of marking a semiconductor package includes preparing a semiconductor package including a semiconductor chip and a package molding layer surrounding semiconductor chip, attaching a dry film to a top surface of the package molding layer, the dry film being attached to a carrier substrate, forming an ink spot by liquefying a portion of the dry film by radiating laser light to the carrier substrate, forming an ink marking pattern by solidifying the ink spot corresponding to the liquefied portion of the dry film, and removing a remaining portion of the dry film from the top surface of the package molding layer, the remaining portion of the dry film having not been liquefied, wherein the ink marking pattern includes information about storage capacity or information for identifying a producer of a product.
1 . A method of marking a semiconductor package, the semiconductor package including a semiconductor chip and a package molding layer surrounding the semiconductor chip, the method comprising:
attaching, using a carrier substrate, a dry film to a top surface of the package molding layer;
forming an ink spot by radiating laser light to the carrier substrate such that a portion of the dry film is liquified;
forming an ink marking pattern by solidifying the ink spot corresponding to the liquefied portion of the dry film; and
removing a remaining portion of the dry film from the top surface of the package molding layer, the remaining portion of the dry film having not been liquefied,
wherein the ink marking pattern includes at least one of information about storage capacity or information for identifying a producer of a product.
2 . The method of claim 1 , wherein the ink marking pattern has a hemispherical shape resulting from shrinkage of the ink spot during the solidifying of the ink marking pattern.
3 . The method of claim 1 , wherein the forming of the ink spot includes forming a hole in the dry film, the hole having a tapered shape having a width increasing toward the package molding layer.
4 . The method of claim 3 , wherein
a bottom of the hole has a first width, and
the ink spot has a diameter that is less than the first width.
5 . The method of claim 1 , further comprising:
increasing a surface roughness of the package molding layer, before the attaching of the dry film to the top surface of the package molding layer, by performing a plasma treatment on the top surface of the package molding layer.
6 . The method of claim 1 , wherein, in the forming of the ink marking pattern,
the top surface of the package molding layer includes a first region and a second region,
the first region has the ink marking pattern formed therein,
the second region surrounds the first region and does not have the ink marking pattern therein, and
a surface roughness of the first region is higher than a surface roughness of the second region.
7 . The method of claim 1 , wherein the carrier substrate includes a transparent material.
8 . The method of claim 1 , wherein, in the attaching of the dry film to the top surface of the package molding layer,
the package molding layer includes a first molding layer on a package substrate and a second molding layer on the first molding layer,
the second molding layer includes at least one of a photosensitive material and a thermosensitive material, and
the dry film is attached to a top surface of the second molding layer in the attaching of the dry film to the top surface of the package molding layer.
9 . The method of claim 1 , wherein a color of the ink marking pattern is different from a color of the package molding layer.
10 . The method of claim 1 , wherein, in the forming of the ink marking pattern,
the top surface of the package molding layer includes a first region and a second region,
the first region has the ink marking pattern formed therein,
the second region surrounds the first region and does not have the ink marking pattern therein, and
a top surface of the first region is coplanar with a top surface of the second region.
11 . The method of claim 1 , wherein, in the forming of the ink spot by liquefying the portion of the dry film
the top surface of the package molding layer includes a target region when viewed in a plan view, and
a portion of the dry film overlapping the target region is irradiated with the laser light.
12 . The method of claim 11 , wherein an area of the target region is less than an area of a remaining region of the top surface of the package molding layer excluding the target region.
13 . The method of claim 1 , wherein, in the forming of the ink spot by liquefying the portion of the dry film,
the top surface of the package molding layer includes a target region when viewed in a plan view, and
a remaining portion of the dry film, excluding a portion of the dry film overlapping the target region, is irradiated with the laser light.
14 . A method of marking a semiconductor package including a semiconductor chip and a package molding layer surrounding the semiconductor chip, the method comprising:
aligning a dry sheet above a top surface of the package molding layer, the dry sheet including a dry film, a first adhesive material attached to a first surface of the dry film and to a carrier substrate, and a second adhesive material attached to a second surface of the dry film opposite to the first surface of the dry film and facing the package molding layer;
attaching the second adhesive material to the top surface of the package molding layer;
liquefying a portion of the dry film and a portion of the second adhesive material by radiating laser light to the carrier substrate, the portion of the second adhesive material being between the portion of the dry film and the top surface of the package molding layer;
forming an ink marking pattern by solidifying an ink spot corresponding to the liquefied portion of the dry film;
forming an adhesive layer by solidifying the liquefied portion of the second adhesive material; and
removing a remaining portion of the dry film and a remaining portion of the second adhesive material from the top surface of the package molding layer, the remaining portion of each of the dry film and the second adhesive material having not been liquefied,
wherein the ink marking pattern includes at least one of information about storage capacity or information for identifying a producer of a product.
15 . The method of claim 14 , wherein, in the liquefying of the portion of the second adhesive material,
the first adhesive material has a melting point that is higher than a melting point of the second adhesive material such that the first adhesive material is not liquefied by the laser light during the liquefying of the portion of the second adhesive material.
16 . The method of claim 14 , wherein, in the forming of the adhesive layer by solidifying the liquefied portion of the second adhesive material, the adhesive layer overlaps the ink spot when viewed in a plan view.
17 . The method of claim 14 , wherein the top surface of the package molding layer is flat and without a step.
18 . A method of marking a semiconductor package including a semiconductor chip and a package molding layer surrounding the semiconductor chip, the method comprising:
aligning a dry sheet above a top surface of the package molding layer, the dry sheet including a dry film and an adhesive material attaching the dry film to a carrier substrate;
attaching the dry film to the top surface of the package molding layer;
forming a hole in the dry film by radiating laser light to the carrier substrate such that a target region of the dry film is liquified, the hole having a tapered shape having a width increasing toward the package molding layer;
forming an ink marking pattern, including ink spots having a hemispherical shape, by solidifying the liquefied portion of the dry film; and
removing a remaining portion of the dry film from the top surface of the package molding layer, the remaining portion of the dry film having not been liquefied,
wherein a bottom of the hole has a first width and the ink marking pattern has a diameter that is less than the first width, and
the ink marking pattern includes at least one of information about storage capacity or information for identifying a producer of a product.
19 . The method of claim 18 , wherein, in the forming of the ink marking pattern, the remaining portion of the dry film having not been liquefied is spaced apart from the ink spots.
20 . The method of claim 18 , wherein, in the forming of the ink marking pattern including the ink spots having the hemispherical shape by solidifying the liquefied portion of the dry film, a surface roughness of a portion of the package molding layer in contact with the ink spots is higher than a surface roughness of a portion of the package molding layer not in contact with the ink spots.