IP Library Granted Patent US 12702374
Granted Patent B2
US 12702374 · App. 18/596,188 · Granted Aug 11, 2026

X-ray detector and control method

Inventor: Akira Nishijima (Nasushiobara, JP)
Assignee: Canon Kabushiki Kaisha
A61B6/542A61B6/4241G01T1/24A61B6/032
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Quick Facts
Patent No.
US 12702374
App. No.
18/596,188
Granted
Aug 11, 2026
Kind
B2
Abstract

An X-ray detector according to an embodiment is an X-ray detector of photon counting type including a plurality of detection elements and a voltage supply device configured to supply the detection elements with a voltage for reading out electric charges accumulated in the detection elements irradiated with X-rays, and the X-ray detector includes processing circuitry configured to: identify target elements from among the detection elements based on information that is acquired during a CT scan using the X-ray detector, each of the target elements causing a large current to flow through a circuit between the target element and the voltage supply device; and stop voltage supply from the voltage supply device to at least some of the target elements.

Claims (11)

1 . An X-ray detector of photon counting type comprising a plurality of detection elements and a voltage supply device configured to supply the detection elements with a voltage for reading out electric charges accumulated in the detection elements irradiated with X-rays, the X-ray detector comprising:

processing circuitry configured to

identify target elements from among the detection elements of the X-ray detector based on information that is acquired during a CT scan using the X-ray detector, each of the target elements causing a large current to flow through a circuit between the target element and the voltage supply device, and

stop voltage supply from the voltage supply device to at least some of the target elements.

2 . The X-ray detector according to claim 1 , wherein the processing circuitry stops voltage supply from the voltage supply device to determined elements among the target elements.

3 . The X-ray detector according to claim 2 , wherein the determined elements are set at regular intervals with respect to the detection elements arranged on a detection face.

4 . The X-ray detector according to claim 1 , wherein the processing circuitry identifies the target element based on an incident dose to the detection element.

5 . The X-ray detector according to claim 1 , wherein the processing circuitry identifies the target element based on a measured value of a voltage supplied from the voltage supply device to the detection element.

6 . A control method for an X-ray detector of photon counting type comprising a plurality of detection elements and a voltage supply device configured to supply the detection elements with a voltage for reading out electric charges accumulated in the detection elements irradiated with X-rays, the control method comprising:

identifying target elements from among the detection elements of the X-ray detector based on information that is acquired during a CT scan using the X-ray detector, each of the target elements causing a large current to flow through a circuit between the target element and the voltage supply device, and

stopping voltage supply from the voltage supply device to at least some of the target elements.