IP Library Granted Patent US 12702375
Granted Patent B2
US 12702375 · App. 18/759,422 · Granted Aug 11, 2026

X-ray detector comprising AEC sensor, and operating method therefor

Inventor: Sanguk Kim (Suwon-si, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
A61B6/542A61B6/4241G01T1/02
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Quick Facts
Patent No.
US 12702375
App. No.
18/759,422
Granted
Aug 11, 2026
Kind
B2
Abstract

Provided are an X-ray detector automatically correcting an automatic exposure control (AEC) sensing area, based on an image obtained using an AEC sensor array, and a method of operating the X-ray detector. The X-ray detector may detect, using an AEC sensor array, X-rays that have passed through an object, obtain a one-dimensional (1D) image by quantifying a dose of the detected X-rays into a signal value, identify a symmetric point from the 1D image, based on a signal value for each pixel of the 1D image, and adjust respective locations of a plurality of AEC sensing areas so that the plurality of AEC sensing areas are symmetrical to each other with respect to the identified symmetric point.

Claims (49)

1 . An X-ray detector comprising:

a plurality of photodetection elements including a plurality of pixels and configured to detect X-rays;

an automatic exposure control (AEC) sensor array including at least one AEC sensor configured to detect X-rays that have passed through an object and to quantify a dose of the detected X-rays as a signal value and output the signal value;

a memory storing one or more instructions; and

at least one processor, comprising processing circuitry, configured to execute the one or more instructions stored in the memory,

wherein at least one processor, individually and/or collectively, is configured to:

obtain a one-dimensional (1D) image, based on the signal value output by the AEC sensor array,

identify a symmetric point from the 1D image, based on a signal value for each pixel of the 1D image, and

adjust respective locations of a plurality of AEC sensing areas so that the plurality of AEC sensing areas are symmetrical to each other with respect to the identified symmetric point.

2 . The X-ray detector of claim 1 , wherein the AEC sensor array comprises a line-type sensor array including a plurality of photodetection elements arranged in a first direction among the plurality of photodetection elements included in the X-ray detector.

3 . The X-ray detector of claim 1 , wherein the AEC sensor array includes a plurality of AEC sensors, and at least one AEC sensor among the plurality of AEC sensors is located within the plurality of AEC sensing areas.

4 . The X-ray detector of claim 1 , wherein at least one processor, individually and/or collectively, is configured to: calculate an average value of differences between a signal value of each of a plurality of pixels included in the 1D image and respective signal values of pixels spaced apart from each of the plurality of pixels included in the 1D image, search for a minimum value among the average values respectively calculated for the plurality of pixels, and identify, among the plurality of cells, a location of a pixel having the minimum value as the symmetric point.

5 . The X-ray detector of claim 1 , wherein at least one processor, individually and/or collectively, is configured to: detect a plurality of edge points based on the signal values of the plurality of pixels of the 1D image, obtain an edge point pair among the detected plurality of edge points, calculate a location of a center point of the obtained edge point pair, and identify the location of the calculated center point as the symmetric point.

6 . The X-ray detector of claim 1 , wherein

the AEC sensor array includes a first AEC sensor array and a second AEC sensor array arranged in parallel lines, and

at least one processor, individually and/or collectively, is configured to identify the symmetric point using a sum of a signal value for each pixel of a first 1D image obtained using the first AEC sensor array and a signal value for each pixel of a second 1D image obtained using the second AEC sensor array.

7 . The X-ray detector of claim 1 , wherein

the AEC sensor array includes a plurality of arrays, and

at least one processor, individually and/or collectively, is configured to:

identify a plurality of symmetric points from the 1D image obtained using a plurality of AEC sensor arrays, obtain a symmetric axis by connecting the plurality of symmetric points to each other, and change respective locations of the plurality of AEC sensing areas so that the plurality of AEC sensing areas arranged on left and right sides of the symmetric axis are symmetrical to each other about the symmetric axis.

8 . The X-ray detector of claim 1 , wherein at least one processor, individually and/or collectively, is configured to: obtain a location of a center point of the plurality of AEC sensing areas arranged on the left and right sides of the identified symmetric point, and change respective locations of the plurality of AEC sensing areas such that the location of the center point is consistent with the location of the symmetric point.

9 . A method of operating an X-ray detector including an automatic exposure control (AEC) sensor, the method comprising:

detecting, using an AEC sensor array, X-rays that have passed through an object, and obtaining a one-dimensional (1D) image by quantifying a dose of the detected X-rays into a signal value;

identifying a symmetric point from the 1D image, based on a signal value for each pixel of the 1D image; and

adjusting respective locations of a plurality of AEC sensing areas so that the plurality of AEC sensing areas are symmetrical to each other with respect to the identified symmetric point.

10 . The method of claim 9 , wherein the identifying of the symmetric point comprises:

calculating an average value of differences between a signal value of each of a plurality of pixels included in the 1D image and respective signal values of pixels spaced apart from each of the plurality of pixels included in the 1D image;

searching for a minimum value among average values respectively calculated for the plurality of pixels; and

identifying a location of a pixel having the minimum value among the plurality of pixels as the symmetric point.

11 . The method of claim 9 , wherein the identifying of the symmetric point comprises:

detecting a plurality of edge points, based on the signal values of the plurality of pixels of the 1D image;

obtaining an edge point pair from among the plurality of detected edge points;

calculating a location of a center point of the obtained edge point pair; and

identifying the location of the center point as the symmetric point.

12 . The method of claim 9 , wherein

the AEC sensor array includes a first AEC sensor array and a second AEC sensor array arranged in parallel lines, and

the identifying of the symmetric point comprises identifying the symmetric point using a sum of a signal value for each pixel of a first 1D image obtained using the first AEC sensor array and a signal value for each pixel of a second 1D image obtained using the second AEC sensor array.

13 . The method of claim 9 , wherein

the identifying of the symmetric point comprises:

identifying a plurality of symmetric points from the 1D image obtained using a plurality of AEC sensor arrays; and

obtaining a symmetric axis by connecting the plurality of symmetry points to each other, and

the adjusting of the locations of the plurality of AEC sensing areas comprises changing the locations of the plurality of AEC sensing areas such that the plurality of AEC sensing areas arranged on left and right sides of the symmetric axis are symmetrical to each other about the symmetric axis.

14 . The method of claim 9 , wherein the adjusting of the respective locations of a plurality of AEC sensing areas comprises:

obtaining a location of a center point of the plurality of AEC sensing areas arranged on the left and right sides of the identified symmetric point; and

changing the locations of the plurality of AEC sensing areas so that the location of the obtained center point is consistent with the location of the symmetric point.

15 . A computer program product including a non-transitory computer-readable storage medium storing instructions readable by an X-ray detector including an automatic exposure control (AEC) sensor, the instructions, when executed by at least one processor, individually and/or collectively, of the X-ray detector, cause the X-ray detector to perform operations including:

detecting, using an AEC sensor array, X-rays that have passed through an object, and obtaining a one-dimensional (1D) image by quantifying a dose of the detected X-rays into a signal value;

identifying a symmetric point from the 1D image, based on a signal value for each pixel of the 1D image; and

adjusting respective locations of a plurality of AEC sensing areas so that the plurality of AEC sensing areas are symmetrical to each other with respect to the identified symmetric point.