Automatic emitter point cleaners with a detection surface cleaner
Example automatic emitter point cleaning systems include: an emitter point configured to produce at least one of positive ions or negative ions within or proximate to an ionization delivery path; an emitter frame configured to hold the emitter point in or proximate to the ionization delivery path; a brush; a motor coupled to the brush to actuate the brush to move past the emitter point; a detection surface coupled to the brush; a sensor configured to detect when the brush is in a predetermined position with respect to a reference position by detecting the detection surface; and a detection surface cleaner configured to clean the detection surface while the brush moves with respect to the emitter frame.
1 . An automatic emitter point cleaning system, comprising:
an emitter point configured to produce at least one of positive ions or negative ions within or proximate to an ionization delivery path;
an emitter frame configured to hold the emitter point in or proximate to the ionization delivery path;
a brush;
a motor coupled to the brush to actuate the brush to move past the emitter point;
a detection surface coupled to the brush;
a sensor configured to detect when the brush is in a predetermined position with respect to a reference position by detecting the detection surface; and
a detection surface cleaner configured to clean the detection surface while the brush moves with respect to the emitter frame.
2 . The automatic emitter point cleaning system as defined in claim 1 , further comprising a controller configured to control the motor to actuate the brush to move the brush past the emitter point.
3 . The automatic emitter point cleaning system as defined in claim 2 , wherein the controller is configured to control the motor to actuate the brush based on at least one of a determination by the controller or an external signal.
4 . The automatic emitter point cleaning system as defined in claim 2 , wherein the controller is configured to control the motor to stop the brush in response to the sensor detecting that the brush is in the predetermined position.
5 . The automatic emitter point cleaning system as defined in claim 1 , further comprising a plurality of emitter points in a same axial plane as the emitter point and the brush, the emitter frame configured to hold the plurality of emitter points radially inward from the emitter frame and into the ionization path, the motor configured to move the brush into contact with each of the plurality of emitter points.
6 . The automatic emitter point cleaning system as defined in claim 5 , wherein the plurality of emitter points are arranged in a substantially circular or polygonal arrangement.
7 . The automatic emitter point cleaning system as defined in claim 6 , further comprising:
a first gear coupled to the brush, configured to hold the brush in a same axial plane as the emitter point, and configured to move the brush into contact with the emitter point; and
a second gear coupled between the motor and the first gear to actuate the first gear in response to actuation by the motor, wherein the plurality of emitter points are arranged around or adjacent to an inner circumference of the first gear.
8 . The automatic emitter point cleaning system as defined in claim 6 , wherein the substantially circular or polygonal arrangement is substantially coaxial with a fan.
9 . The automatic emitter point cleaning system as defined in claim 1 , wherein the motor is a bidirectional motor configured to move the brush in either direction.
10 . The automatic emitter point cleaning system as defined in claim 1 , wherein the detection surface cleaner is positioned on the emitter frame adjacent the predetermined position.
11 . The automatic emitter point cleaning system as defined in claim 1 , wherein the detection surface cleaner comprises a pad configured to wipe contaminants from the detection surface as the detection surface moves over the pad.
12 . The automatic emitter point cleaning system as defined in claim 11 , wherein the pad is a non-abrasive material.
13 . The automatic emitter point cleaning system as defined in claim 1 , wherein the detection surface cleaner is positioned on the emitter frame along a path of the detection surface.
14 . The automatic emitter point cleaning system as defined in claim 1 , wherein the emitter point is configured to generate ionization.
15 . The automatic emitter point cleaning system as defined in claim 1 , further comprising:
a first gear coupled to the brush, configured to hold the brush in a same axial plane as the emitter point, and configured to move the brush into contact with the emitter point; and
a second gear coupled between the motor and the first gear to actuate the first gear in response to actuation by the motor.
16 . The automatic emitter point cleaning system as defined in claim 1 , wherein the detection surface comprises a smooth, electrostatically non-conductive surface configured to resist adhesion by contaminants.
17 . The automatic emitter point cleaning system as defined in claim 16 , wherein the detection surface is a polished surface.
18 . The automatic emitter point cleaning system as defined in claim 16 , wherein the detection surface comprises a coating configured to resist adhesion by contaminants.
19 . The automatic emitter point cleaning system as defined in claim 1 , further comprising a fan configured to direct a stream of gas along the ionization path.
20 . The automatic emitter point cleaning system as defined in claim 19 , wherein the emitter point is oriented in a same direction as the ionization path.