IP Library Granted Patent US 12703657
Granted Patent B2
US 12703657 · App. 18/734,875 · Granted Aug 11, 2026

Glass substrate for high-frequency device and circuit board for high-frequency device

Inventors: Kazutaka Ono (Tokyo, JP); Shuhei Nomura (Tokyo, JP); Nobutaka Kidera (Tokyo, JP); Nobuhiko Takeshita (Tokyo, JP)
Assignee: AGC Inc.
C03C3/089C03C3/091C03C4/16H05K1/024H05K1/03C03B17/02C03B17/064C03B19/14C03B25/08C03C3/06C03C3/087C03C3/118C03C13/046C03C2204/08C03C2217/253
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Quick Facts
Patent No.
US 12703657
App. No.
18/734,875
Granted
Aug 11, 2026
Kind
B2
Abstract

A glass substrate for a high-frequency device, which contains, in terms of mole percent on the basis of oxides: 40 to 75% of SiO 2 ; 0 to 15% of Al 2 O 3 ; 13 to 23% of B 2 O 3 ; 2.5 to 11% of MgO; and 0 to 13% of CaO, and having a total content of alkali metal oxides in the range of 0.001-5%, where at least one main surface of the glass substrate has a surface roughness of 1.5 nm or less in terms of arithmetic average roughness Ra, and the glass substrate has a dielectric dissipation factor at 35 GHz of 0.007 or less.

Claims (21)

1 . A glass substrate, comprising:

a glass composition comprising, in terms of mole percent on a basis of oxides:

40 to 75% of SiO 2 ;

0 to 10% of Al 2 O 3 ;

13 to 36% of B 2 O 3 ; and

0.1 to 6% of CaO,

wherein

a total content of Al 2 O 3 and B 2 O 3 is in a range of 13-40%,

a total content of alkaline earth metal oxides is in a range of 0.1-6%, and

a total content of alkali metal oxides is in a range of 0.001-5%,

wherein the glass composition has a molar ratio Al 2 O 3 /(Al 2 O 3 +B 2 O 3 ) in a range of 0-0.45, at least one main surface of the glass substrate has a surface roughness of 1.5 nm or less in terms of arithmetic average roughness Ra, and the glass substrate has a dielectric dissipation factor at 35 GHz of 0.007 or less.

2 . The glass substrate according to claim 1 , wherein the glass composition comprises 13-30% of B 2 O 3 in terms of mole percent on the basis of oxides.

3 . The glass substrate according to claim 1 , wherein a content of Fe, in terms of Fe 2 O 3 , is 0.012% or less in terms of mole percent on the basis of oxides.

4 . The glass substrate according to claim 1 , wherein the alkali metal oxides has a molar ratio Na 2 O/(Na 2 O+K 2 O) in a range of 0.01-0.99.

5 . The glass substrate according to claim 1 , wherein the glass substrate has a β-OH value in a range of 0.05-0.6 mm −1 .

6 . The glass substrate according to claim 1 , wherein the glass substrate has a relative permittivity at 35 GHz of 10 or less.

7 . The glass substrate according to claim 1 , wherein the glass substrate has an average thermal expansion coefficient over the range of from 50° C. to 350° C. in a range of 3-15 ppm/° C.

8 . The glass substrate according to claim 1 , wherein the glass substrate has a Young's modulus of 40 GPa or higher.

9 . The glass substrate according to claim 1 , wherein the glass substrate has a porosity of 0.1% or less.

10 . The glass substrate according to claim 1 , wherein the glass substrate has a transmittance at 350-nm wavelength of 50% or higher.

11 . The glass substrate according to claim 1 , wherein the glass substrate has a thickness in a range of 0.05-1 mm and a substrate area in a range of 225-10,000 cm 2 .