IP Library Granted Patent US 12703665
Granted Patent B2
US 12703665 · App. 18/277,072 · Granted Aug 11, 2026

Ceramic material, powder and layer system

Inventor: Arturo Flores Renteria (Berlin, DE)
Assignee: Siemens Energy Global GmbH & Co. KG
C04B35/486C23C28/042C04B2235/3217C04B2235/3225C04B2235/3244
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Quick Facts
Patent No.
US 12703665
App. No.
18/277,072
Granted
Aug 11, 2026
Kind
B2
Abstract

An improved ceramic material for heat insulation is achieved by the following selection of specific stabilizers and the adapted proportions: Base of zirconium dioxide (ZrO 2 ) with: 1.0 wt. % to 9.0 wt. % of base stabilizers: yttrium oxide (Y 2 O 3 ), hafnium oxide (HfO 2 ), wherein at least yttrium oxide (Y 2 O 3 ) is used, and at least one of the additional stabilizers: erbium oxide (Er 2 O 3 ) and/or ytterbium oxide (Yb 2 O 3 ) with a proportion of 0.2 wt. % to 20 wt. %.

Claims (57)

1 . A ceramic material based on zirconium oxide (ZrO 2 ), comprising (in wt %):

up to 8.0 wt % of base stabilizers, the base stabilizers comprising:

at least 2.5 wt % yttrium oxide (Y 2 O 3 ), and optionally hafnium oxide (HfO2),

additional stabilizers comprising:

erbium oxide (Er 2 O 3 ) and/or ytterbium oxide (Yb 2 O 3 )

with a fraction of 0.2 wt % to 20.0 wt %,

further comprising:

aluminum oxide (Al 2 O 3 ) 0.1%-3.0 wt %

and further comprising allowed impurity levels:

calcium oxide (CaO)

up to 0.2 wt%,

iron oxide (Fe 2 O 3 )

up to 0.2 wt%,

magnesium oxide (MgO)

up to 0.2 wt%,

silicon oxide (SiO 2 )

up to 0.3 wt%,

titanium oxide (TiO 2 )

up to 0.2 wt%.

2 . The ceramic material as claimed in claim 1 , comprising the hafnium oxide (HfO 2 ).

3 . The ceramic material as claimed in claim 1 , wherein the yttrium oxide (Y 2 O 3 ) is the only base stabilizer.

4 . The ceramic material as claimed in claim 1 ,

wherein the yttrium oxide (Y 2 O 3 ) content is 2.5 wt % to 5.5 wt %.

5 . The ceramic material as claimed in claim 1 ,

comprising the hafnium oxide (HfO 2 ), wherein the hafnium oxide (HfO 2 ) content is >2.0 wt % to 4.0 wt %.

6 . The ceramic material as claimed in claim 1 ,

comprising the hafnium oxide (HfO 2 ), wherein the hafnium oxide (HfO 2 ) content is 0.2 wt % to <2.0 wt %.

7 . The ceramic material as claimed in claim 1 ,

wherein the aluminum oxide (Al 2 O 3 ) content is 0.2 wt % to 1.5 wt %.

8 . The ceramic material as claimed in claim 1 , comprising

wherein the aluminum oxide (Al 2 O 3 ) content is 1.5 wt % to 3.0 wt %.

9 . The ceramic material as claimed in claim 1 ,

wherein the ytterbium oxide (Yb 2 O 3 ) is the only additional stabilizer.

10 . The ceramic material as claimed in claim 1 ,

wherein the erbium oxide (Er 2 O 3 ) is the only additional stabilizer.

11 . The ceramic material as claimed in claim 1 , which comprises as the additional stabilizers the ytterbium oxide (Yb 2 O 3 ) and the erbium oxide (Er 2 O 3 ).

12 . The ceramic material as claimed in claim 1 , consisting of

13 . The ceramic material as claimed in claim 1 , consisting of

14 . The ceramic material as claimed in claim 1 ,

comprising the ytterbium oxide (Yb 2 O 3 ), wherein the ytterbium oxide (Yb 2 O 3 ) content is 5.5 wt % to 8.5 wt %.

15 . The ceramic material as claimed in claim 1 ,

comprising the erbium oxide (Er 2 O 3 ), wherein the erbium oxide (Er 2 O 3 ) content is 2.0 wt % to 4.0 wt %.

16 . The ceramic material as claimed in claim 1 ,

comprising the erbium oxide (Er 2 O 3 ) and the ytterbium oxide (Yb 2 O 3 ),

comprising (8.0−x) wt % of Y 2 O 3 +[(2-4)*x] wt % of Yb 2 O 3 /Er 2 O 3 , and

where x represents a weight fraction of the additional stabilizers.

17 . A ceramic powder comprising,

a composition of a material as claimed in claim 1 .

18 . A layer system at least comprising

a metallic substrate,

optionally a metallic adhesion promoter layer, and

at least one ceramic layer comprising the ceramic material as claimed in claim 1 .

19 . The layer system as claimed in claim 18 , comprising

a NiCoCrAlY based metallic adhesion promoter layer between the ceramic layer and the metallic substrate, and

optionally comprising silicon (Si), rhenium (Re) and/or tantalum (Ta).

20 . The layer system as claimed in claim 18 ,

wherein below the ceramic layer there is a ceramic sublayer comprising the ceramic material, which is at least 20% thinner in configuration.