Chromatic confocal measurement device comprising a camera
The present application relates to a chromatic confocal measurement device ( 1 ) comprising: —a light pen ( 4 ) comprising a lens ( 5 ) with axial chromatism, said light pen being configured to apply a light beam ( 3 ) to a surface ( 6 ), the light pen ( 4 ) having an input end ( 10 ) connected to a light source ( 2 ), and an output end ( 11 ) configured to be placed close to the surface ( 6 ); and—a camera ( 7 ) attached close to the output end ( 11 ) of the light pen ( 4 ), such that a portion of the light beam ( 3 ) originating from the light source ( 2 ) and emerging from the lens ( 5 ) with axial chromatism is blocked by the camera ( 7 ) at the output end ( 11 ) of the light pen ( 4 ), and such that another portion of the light beam ( 3 ) circumvents the camera ( 7 ) and reaches the surface ( 6 ).
1 . A chromatic confocal measurement device comprising:
a light source configured to generate a light beam;
a light pen comprising an objective with axial chromatism configured to apply the light beam on a surface of the sample, the light pen having an input end connected to the light source and an output end configured to be placed close to the surface of the sample; and
a camera positioned between the objective with axial chromatism and the surface of the sample such that a portion of the light beam originating from the light source and emerging from the objective with axial chromatism is blocked by the camera at the output end of the light pen and another portion of the light beam is not blocked by the camera and reaches the surface of the sample.
2 . The measurement device according to claim 1 , wherein the light pen comprises a lens placed close to the output end of the light pen, a first area being larger than a second area, wherein the first area corresponding to an orthogonal projection of the lens in a first plane which is perpendicular to an axis of propagation of the light beam through the lens and the second area corresponds to an orthogonal projection of the camera in the first plane, such that the camera only partially blocks the optical field of the lens.
3 . The measurement device according to claim 2 , wherein the first area is at least twice larger than the second area.
4 . The measurement device according to claim 2 , wherein the camera is at least partially housed a through-passage of the lens.
5 . The measurement device according to claim 2 , wherein the lens has an axial chromatism and forms part of the objective with axial chromatism.
6 . The measurement device according to claim 2 , wherein the lens is achromatic and is placed between the objective with axial chromatism and the camera, the camera being at least partially housed in a through-passage of the lens.
7 . The measurement device according to claim 2 , wherein the first area is at least four times larger than the second area.
8 . The measurement device according to claim 1 , wherein the camera is placed between the light pen and the surface to be measured.
9 . The measurement device according to claim 1 , further comprising an additional camera positioned between the lens with axial chromatism and the surface of the sample such that a portion of the light beam originating from the light source and emerging from the objective with axial chromatism is also blocked by the additional camera at the output end of the light pen and the other portion of the light beam also bypasses the additional camera and reaches the surface of the sample.
10 . The measurement device according to claim 1 , wherein a depth of field of the camera is between 2 mm and 100 mm.
11 . The measurement device according to claim 1 , further comprising a light fixed on the measurement device and configured to illuminate the surface of the sample.
12 . The measurement device according to claim 11 , wherein the light is incorporated to the camera or is attached and fixed on the light pen close to the output end.
13 . The measurement device according to claim 1 , further comprising a spectral analysis system configured for determining a spectral distribution of the light beam reflected by the surface of the sample.