Temperature measuring device for electrical contact element
The present disclosure relates to a temperature measuring device for measuring a temperature of a pin-shaped electrical contact element, which includes a flexible circuit board with a first thermally conducting and electrically insulating substrate layer. The first substrate layer includes a contact surface that is configured to lie flat against a flange of the pin-shaped electrical contact element and an opening disposed in the contact surface. The pin-shaped electrical contact element is disposed at least partially in the opening. The flexible circuit board further includes a second thermally and electrically conducting layer that is disposed on a sensor surface opposite the contact surface of the first substrate layer and includes a sensor element connected to the sensor surface. The sensor element is configured to record a temperature of the pin-shaped electrical contact element when the pin-shaped electrical contact element is at least partially disposed in the opening.
1 . A temperature measuring device for measuring a temperature of a pin-shaped electrical contact element, the temperature measuring device comprising:
a flexible circuit board comprising:
a first thermally conducting and electrically insulating substrate layer comprising:
a contact surface that is configured to lie flat against a flange of the pin-shaped electrical contact element; and
an opening disposed in the contact surface, wherein the pin-shaped electrical contact element is at least partially disposed in the opening; and
a second thermally and electrically conducting layer that is disposed on a sensor surface opposite the contact surface of the first thermally conducting and electrically insulating substrate layer and includes a sensor element connected to the sensor surface, which is configured to record a temperature of the pin-shaped electrical contact element when the pin-shaped electrical contact element is disposed at least partially in the opening.
2 . The temperature measuring device according to claim 1 , wherein the contact surface is geometrically adapted to the flange of the pin-shaped electrical contact element.
3 . A temperature measuring device for measuring a temperature of a pin-shaped electrical contact element, the temperature measuring device comprising:
a flexible circuit board comprising:
a first thermally conducting and electrically insulating substrate layer comprising:
a contact surface that is configured to lie flat against a flange of the pin-shaped electrical contact element; and
an opening disposed in the contact surface, wherein the pin-shaped electrical contact element is at least partially disposed in the opening; and
a second thermally and electrically conducting layer that is disposed on a sensor surface opposite the contact surface of the first thermally conducting and electrically insulating substrate layer and includes a sensor element connected to the sensor surface, which is configured to record a temperature of the pin-shaped electrical contact element when the pin-shaped electrical contact element is disposed at least partially in the opening and the sensor element comprises a flat conductor path that is disposed on the sensor surface and comprises a temperature probe that is thermally connected to the flat conductor path.
4 . The temperature measuring device according to claim 1 , wherein the sensor surface includes a material with a temperature-dependent resistance.
5 . The temperature measuring device according to claim 4 , wherein the sensor surface comprises a metal wire disposed in a meandering manner.
6 . The temperature measuring device according to claim 5 , wherein the metal wire disposed in a meandering manner is disposed in a low-induction layout.
7 . The temperature measuring device according to claim 4 , wherein the sensor surface comprises a structured metal film.
8 . The temperature measuring device according to claim 1 , further comprising a third insulating layer on the second thermally and electrically conducting layer.
9 . The temperature measuring device according to claim 1 , wherein the second thermally and electrically conducting layer comprises at least one electrical line that is configured to connect the temperature measuring device electronically to an evaluating unit.
10 . The temperature measuring device according to claim 1 , wherein the pin-shaped electrical contact element is disposed at least partially in the opening, and the contact surface of the flexible circuit board lies flat against the flange of the pin-shaped electrical contact element.
11 . The temperature measuring device according to claim 10 , further comprising a housing with a first housing part and a second housing part, wherein the flange of the pin-shaped electrical contact element abuts against the first housing part, and wherein the second housing part exerts a force on the flexible circuit board in the direction of the first housing part, and thus presses the contact surface of the flexible circuit board against the flange of the pin-shaped electrical contact element.
12 . The temperature measuring device according to claim 11 , wherein an elastic pressing element is disposed between the flexible circuit board and the second housing part, and wherein pressure is exerted via the elastic pressing element onto the flexible circuit board.
13 . The temperature measuring device according to claim 11 , wherein a further elastic pressing element is disposed between the flange of the pin-shaped electrical contact element and the first housing part.
14 . A method for manufacturing a temperature measuring device for measuring a temperature of a pin-shaped electrical contact element, the method comprising:
providing a first thermally conducting and electrically insulating substrate layer of a flexible circuit board with a contact surface that is configured to lie flat against a flange of the pin-shaped electrical contact element, and an opening disposed in the contact surface, wherein the pin-shaped electrical contact element is disposed at least partially in the opening; and
applying a second thermally and electrically conducting layer onto the provided first thermally conducting and electrically insulating substrate layer, including a sensor element disposed on a sensor surface opposite the contact surface of the first thermally conducting and electrically insulating substrate layer, which sensor element is configured to record a temperature of the pin-shaped electrical contact element on the contact surface when the pin-shaped electrical contact element is disposed at least partially in the opening.
15 . The method according to claim 14 , further comprising an application of a third insulating layer onto the second thermally and electrically conducting layer.