IP Library Granted Patent US 12704537
Granted Patent B2
US 12704537 · App. 18/686,973 · Granted Aug 11, 2026

Waveguide probe structure, calibration device and calibration method for antenna array

Inventors: Zhihao Jiang (Beijing, CN); Wenjin Gao (Beijing, CN); Meng Wei (Beijing, CN); Hongyuan Feng (Beijing, CN); Liangrong Ge (Beijing, CN); Xueyan Su (Beijing, CN); Yuanfu Li (Beijing, CN); Guo Liu (Beijing, CN); Fengshuo Wan (Beijing, CN); Xinyu Wu (Beijing, CN); Sheng Chen (Beijing, CN); Longzhu Cai (Beijing, CN); Zhifeng Zhang (Beijing, CN); Chuncheng Che (Beijing, CN); Wei Hong (Beijing, CN)
Assignees: BOE TECHNOLOGY GROUP CO., LTD.; Beijing BOE Sensor Technology Co., Ltd.; Research Institute of Millimeter Wave and Terahertz Technology
G01R29/10G01R29/0878G01R29/0892
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Quick Facts
Patent No.
US 12704537
App. No.
18/686,973
Granted
Aug 11, 2026
Kind
B2
Abstract

A waveguide probe structure, a calibration device for an antenna array and a calibration method for an antenna array are provided. The waveguide probe structure includes a waveguide coaxial converter, a tapered waveguide and a first straight waveguide. The waveguide coaxial converter is configured to transmit and receive two orthogonal linearly-polarized signals; the tapered waveguide includes a first waveguide cavity including a first waveguide port and a second waveguide port, the first waveguide port is connected to the waveguide coaxial converter, the second waveguide port is connected to the first straight waveguide, and a size of a cross section of the first waveguide cavity increases monotonically in a direction from the first waveguide port to the second waveguide port; the first straight waveguide includes a second waveguide cavity, a size of a cross section of the second waveguide cavity is equal to a size of the second waveguide port.

Claims (45)

1 . A waveguide probe structure, comprising a waveguide coaxial converter, a tapered waveguide and a first straight waveguide; wherein

the waveguide coaxial converter is configured to transmit and receive two orthogonal linearly-polarized signals;

the tapered waveguide comprises a first waveguide cavity with a first waveguide port and a second waveguide port along a length direction of the first waveguide cavity, the first waveguide port is connected to the waveguide coaxial converter, the second waveguide port is connected to the first straight waveguide, and a size of a cross section of the first waveguide cavity increases monotonically in a direction from the first waveguide port to the second waveguide port; and

the first straight waveguide comprises a second waveguide cavity, and a size of a cross section of the second waveguide cavity is equal to a size of the second waveguide port;

wherein the waveguide coaxial converter comprises a second straight waveguide, a first feeding port, a second feeding port, and an isolation component; and

feeding directions of the first feeding port and the second feeding port are orthogonal to each other, the second straight waveguide comprises a third waveguide cavity, and the first feeding port, the second feeding port and the isolation component are all mounted on a side wall of the second straight waveguide and all extend into the third waveguide cavity, and the isolation component is between the first feeding port and the second feeding port and parallel to one of the first feeding port and the second feeding port; and

wherein the waveguide probe structure further comprises a first fixing component mounted on the side wall of the second straight waveguide and comprising a plurality of mounting holes therein.

2 . The waveguide probe structure of claim 1 , wherein the first fixing component comprises a flange.

3 . The waveguide probe structure of claim 1 , wherein the tapered waveguide has a flare angle in a range from 1.5° to 2.5°.

4 . The waveguide probe structure of claim 1 , further comprising a spacer fixed on an end surface of the first straight waveguide away from the tapered waveguide.

5 . The waveguide probe structure of claim 1 , wherein a length of the first straight waveguide is greater than a wavelength corresponding to a central frequency of a microwave signal transmitted through the first straight waveguide.

6 . A waveguide probe structure, comprising a waveguide coaxial converter, a tapered waveguide and a first straight waveguide; wherein

the waveguide coaxial converter is configured to transmit and receive two orthogonal linearly-polarized signals;

the tapered waveguide comprises a first waveguide cavity with a first waveguide port and a second waveguide port along a length direction of the first waveguide cavity, the first waveguide port is connected to the waveguide coaxial converter, the second waveguide port is connected to the first straight waveguide, and a size of a cross section of the first waveguide cavity increases monotonically in a direction from the first waveguide port to the second waveguide port; and

the first straight waveguide comprises a second waveguide cavity, and a size of a cross section of the second waveguide cavity is equal to a size of the second waveguide port,

wherein the waveguide coaxial converter is fixedly connected to the tapered waveguide through a second fixing component; and

wherein the second fixing component comprises a flange.

7 . A calibration device for an antenna array, comprising a waveguide probe structure, a vector network analyzer and a controller; wherein the waveguide probe structure comprises a waveguide probe structure, and the waveguide probe structure comprises a waveguide coaxial converter, a tapered waveguide and a first straight waveguide; the waveguide coaxial converter is configured to transmit and receive two orthogonal linearly-polarized signals; the tapered waveguide comprises a first waveguide cavity with a first waveguide port and a second waveguide port along a length direction of the first waveguide cavity, the first waveguide port is connected to the waveguide coaxial converter, the second waveguide port is connected to the first straight waveguide, and a size of a cross section of the first waveguide cavity increases monotonically in a direction from the first waveguide port to the second waveguide port; and the first straight waveguide comprises a second waveguide cavity, and a size of a cross section of the second waveguide cavity is equal to a size of the second waveguide port;

the vector network analyzer is configured to transmit a microwave signal to an in-array unit to be calibrated through the waveguide probe structure under control of the controller, receive the microwave signal reflected by the in-array unit and transmitted through the waveguide probe structure, and obtain network parameters of the in-array unit based on a relationship between an incident microwave and a reflected microwave through analysis according to the received microwave signal; and

the controller is configured to process the network parameters based on the relationship between the incident microwave and the reflected microwave obtained by the vector network analyzer through analysis, and obtain a calibration error through a preset algorithm.

8 . A calibration method for an antenna array, wherein the method employs the calibration device of claim 7 , the antenna array comprises M×N in-array units, where one of M and Nis a positive integer greater than or equal to 1, and the other one of M and N is a positive integer greater than or equal to 2;

wherein the method comprises:

sequentially calibrating the M×N in-array units based on a reference phase matching codebook acquired in advance, wherein the reference phase matching codebook comprises a correspondence between test voltages and reference amplitudes as well as reference phases, respectively;

calibrating an in-array unit in an ith row and a jth column comprises:

sequentially loading test voltages in the reference phase matching codebook to the in-array unit in the ith row and the jth column, and transmitting the microwave signal reflected by the in-array unit in the ith row and the jth column to the vector network analyzer through the waveguide probe structure after each test voltage is loaded, so that the vector network analyzer acquires the network parameters of the in-array unit in the ith row and the jth column based on the relationship between the incident microwave and the reflected microwave; where 0<i≤M, 0<j≤N, and i and j are positive integers;

analyzing the network parameters acquired by the vector network analyzer on the basis of the relationship between the incident microwave and the reflected microwave under different test voltages based on the in-array unit in the ith row and the jth column to obtain a first S parameter matrix; and

processing, by the controller, the first S parameter matrix to obtain a normalized S parameter matrix of the in-array unit in the ith row and the jth column under each test voltage, and determining a target voltage absolute phase response curve and a target voltage amplitude response curve corresponding to the in-array unit in the ith row and the jth column, wherein the normalized S parameter matrix is used for representing the network parameters of the in-array unit in the ith row and the jth column on the basis of the relationship between the incident microwave and the reflected microwave under the test voltage.

9 . The calibration method for an antenna array of claim 8 , wherein the processing the first S parameter matrix to obtain the normalized S parameter matrix of the in-array unit in the ith row and the jth column under each test voltage comprises:

placing the waveguide probe structure above a reflective component, transmitting the microwave signal reflected by the reflective component to the vector network analyzer through the waveguide probe structure, so that the vector network analyzer obtains network parameters of the waveguide probe structure and the reflective component based on the relationship between the incident microwave signal and the reflected microwave signal through analysis;

determining, by the vector network analyzer, a second S parameter matrix based on the network parameters of the waveguide probe structure and the reflective component based on the relationship between the incident microwave signal and the reflected microwave signal through analysis; and

subtracting, by the controller, vectors of the first S parameter matrix from vectors of the second S parameter matrix to obtain the normalized S parameter matrix of the in-array unit in the ith row and the jth column under each test voltage.

10 . The calibration method for an antenna array of claim 8 , wherein an operating mode of the antenna array is a circular polarization, and the determining the target voltage absolute phase response curve and the target voltage amplitude response curve corresponding to the in-array unit in the ith row and the jth column comprises:

performing a linear-circular polarization basis transformation on the normalized S parameter matrix, and determining the target voltage absolute phase response curve and the target voltage amplitude response curve corresponding to the in-array unit in the ith row and the jth column.

11 . The calibration method for an antenna array of claim 8 , further comprising obtaining a reference phase matching codebook; wherein the reference phase matching codebook comprises a correspondence response curve of the test voltages versus the reference phases of each in-array unit and a correspondence response curve of the test voltages versus the reference amplitude of each in-array unit;

acquiring the correspondence response curve of the test voltages versus the reference phases of the in-array unit in the ith row and the jth column and a correspondence response curve of the test voltages versus the reference amplitudes of the in-array unit in the ith row and the jth column comprises:

sequentially loading test voltages in a test voltage set acquired in advance to the in-array unit in the ith row and the jth column, placing the waveguide probe structure above the in-array unit in the ith row and the jth column, and obtaining, by the vector network analyzer, network parameters of the in-array unit in the ith row and the jth column and the waveguide probe structure based on the relationship between the incident microwave and the reflected microwave through the waveguide probe structure through analysis, to determine a first reference S parameter matrix; where 0<i≤M, 0<j≤N, and i and j are positive integers;

placing the waveguide probe structure above a reflective component, and obtaining, by the vector network analyzer, network parameters of the reflective component and the waveguide probe structure on the basis of the relationship between the incident microwave and the reflected microwave through analysis, to determine a second reference S parameter matrix; and

obtaining, by the controller, a normalized reference S parameter matrix based on the first reference S parameter matrix and the second reference S parameter matrix, processing the normalized reference S parameter matrix, and determining the correspondence response curve of the test voltages versus the reference phases of the in-array unit in the ith row and the jth column and the correspondence response curve of the test voltages versus the reference amplitudes of the in-array unit in the ith row and the jth column.

12 . The calibration method for an antenna array of claim 8 , wherein the reflective component is made of copper or aluminum.

13 . The calibration device of claim 7 , wherein the waveguide coaxial converter comprises a second straight waveguide, a first feeding port, a second feeding port, and an isolation component; and

feeding directions of the first feeding port and the second feeding port are orthogonal to each other, the second straight waveguide comprises a third waveguide cavity, and the first feeding port, the second feeding port and the isolation component are all mounted on a side wall of the second straight waveguide and all extend into the third waveguide cavity, and the isolation component is between the first feeding port and the second feeding port and parallel to one of the first feeding port and the second feeding port.

14 . The calibration device of claim 13 , further comprising a first fixing component mounted on the side wall of the second straight waveguide and comprising a plurality of mounting holes therein.

15 . The calibration device of claim 14 , wherein the first fixing component comprises a flange.

16 . The calibration device of claim 7 , wherein the waveguide coaxial converter is fixedly connected to the tapered waveguide through a second fixing component.

17 . The calibration device of claim 16 , wherein the second fixing component comprises a flange.