Test load board

1 . A test load board comprising:

a PCB (printed circuit board) with pads for a probe of a tester;

a contactor that includes contact points for connecting leads of a DUT (device under test); and

an RFID (radio frequency identification) tag affixed to the PCB, wherein the RFID tag is loaded with a unique identifier (ID) of the test load board.

2 . The test load board of claim 1 , wherein the RFID tag wirelessly transmits the unique ID of the test load board in response to a query from an RFID reader.

3 . The test load board of claim 1 , wherein the RFID tag is further loaded with a revision number and a manufacturing code for the test load board.

4 . The test load board of claim 3 , wherein the manufacturing code uniquely identifies a manufacturer of the test load board.

5 . The test load board of claim 4 , further comprising:

an antenna coupled to the RFID tag, wherein the antenna is shaped to circumscribe the contactor.

6 . The test load board of claim 4 , further comprising:

a wall circumscribing the contactor; and

an antenna coupled to the RFID tag, wherein the antenna is shaped to partially circumscribe the wall.

7 . The test load board of claim 6 , further comprising:

a platform for intermittent placement of an RFID reader.

8 . The test load board of claim 7 , wherein the platform is positioned to bring the RFID reader in wireless communicative proximity to the antenna.

9 . The test load board of claim 1 , wherein the DUT is a plurality of DUTs, and the contactor includes sockets with contact points for the plurality of DUTs.

10 . A non-transitory machine-readable medium having machine-readable instructions for a test load board manager causing a processor core to execute operations, the operations comprising:

providing a query for a unique ID (identifier) for a test load board to an RFID (radio frequency identifier) reader, wherein the RFID reader generates a wireless signal to query an RFID tag on the test load board responsive to receiving the query;

receiving the unique ID for the test load board in response to the providing; and

querying a database for a record of the test load board based on the unique ID of the test load board.

11 . The non-transitory machine-readable medium of claim 10 , wherein the test load board is a given test load board the operations for the test load board manager further comprising:

determining a manufacture for the given test load board; and

analyzing test results for a set of test load boards from the manufacturer and the given test load board.

12 . The non-transitory machine-readable medium of claim 11 , the operations of the test load board manager further comprising:

identifying a defective test load board based on the analyzing.

13 . A method for testing integrated circuit (IC) packages, the method comprising:

scanning, with a RFID (radio frequency identification) reader, an RFID tag mounted on a test load board with a PCB (printed circuit board) with pads for a probe of a tester and a contactor that includes contact points for connecting a leads of a DUT (device under test);

determining, with test load board manager operating on a computing platform, a unique ID (identifier) of the test load board based on the scanning;

inserting, by a handler, an IC (integrated circuit) package into the contactor; and

testing, by a tester, the inserted IC package.

14 . The method of claim 13 , wherein the IC package is a first IC package, the method further comprising:

removing, by the handler, the first IC package from the contactor;

inserting, by the handler, a second IC package in the contactor; and

testing, by the tester, the second IC package inserted in the contactor.

15 . A method for testing integrated circuit (IC) packages, the method comprising:

scanning, with a RFID (radio frequency identification) reader, an RFID tag mounted on a test load board with a PCB (printed circuit board) with pads for a probe of a tester and a contactor that includes contact points for connecting a leads of a DUT (device under test);

determining, with test load board manager operating on a computing platform, a unique ID (identifier) of the test load board based on the scanning;

inserting, by a handler, a first IC (integrated circuit) package in the contactor;

testing, by a tester, the first inserted IC package;

adding, by the test load board manager, data characterizing the unique ID of the load test board to a lot file for testing a lot of IC packages that includes the IC package;

providing, by the test load board manager, the lot file to the tester, wherein the testing is executed in response to the providing;

removing, by the handler, the first IC package from the contactor;

inserting, by the handler, a second IC package in the contactor; and

testing, by the tester, the second IC package inserted in the contactor.

16 . The method of claim 15 , further comprising:

writing, by the tester, results of the testing of the IC package.

17 . The method of claim 13 , wherein the DUT is a subset of DUTs of a lot of DUTs, and contactor of the load test board includes sockets for the subset of the DUTs.

18 . The method of claim 13 , wherein the test load board further comprising:

a wall circumscribing the contactor; and

an antenna coupled to the RFID tag, wherein the antenna is shaped to partially circumscribe the wall.

19 . The method of claim 18 , wherein the test load board further comprises a platform for the RFID reader, wherein the platform is positioned to bring the RFID reader in wireless communicative proximity to the antenna.

20 . The method of claim 13 , wherein the test load board further comprises an antenna coupled to the RFID tag, wherein the antenna is shaped to circumscribe the contactor.