IP Library Granted Patent US 12704792
Granted Patent B2
US 12704792 · App. 18/785,769 · Granted Aug 11, 2026

Mitigating long-term energy decay of laser devices

Inventors: Chih-Ping Yen (Hsinchu, TW); Yen-Shuo Su (Hsinchu City, TW); Jui-Pin Wu (Hsinchu City, TW); Chun-Lin Chang (Zhubei City, TW); Han-Lung Chang (Kaohsiung City, TW); Heng-Hsin Liu (New Taipei City, TW)
Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
G03F7/70925G03F7/70025G03F7/70033G03F7/70916G03F7/70975
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Quick Facts
Patent No.
US 12704792
App. No.
18/785,769
Granted
Aug 11, 2026
Kind
B2
Abstract

An apparatus for manufacturing semiconductors includes a power amplifier to power a laser, a catalyst disposed in the power amplifier, an inlet port, and an exhaust port. The inlet port introduces a mixing gas to an interior of the power amplifier during a cleaning operation so that the mixing gas contacts a surface of the catalyst having a build-up thereon. The mixing gas reacts with and removes the build-up by generating gaseous by-products. The exhaust port removes the gaseous by-products from the power amplifier.

Claims (30)

1 . An apparatus for processing a semiconductor device, comprising:

a power amplifier having a catalyst disposed in the power amplifier;

an inlet configured to supply a gas to the power amplifier during a cleaning operation so that the gas contacts a surface of the catalyst having a build-up thereon,

whereby the gas reacts with and removes the build-up by generating gaseous by-products; and

an exhaust configured to remove the gaseous by-products from the power amplifier.

2 . The apparatus of claim 1 , where the power amplifier is for a laser generator.

3 . The apparatus of claim 1 , wherein the catalyst comprises a gold surface.

4 . The apparatus of claim 1 , further comprising an inlet port coupled to a supply for introducing the gas to an interior of the power amplifier.

5 . The apparatus of claim 1 , wherein the power amplifier is configured to power a CO 2 gas laser.

6 . The apparatus of claim 1 , further comprising circuitry configured to control the cleaning operation, wherein the power amplifier comprises a plurality of power amplifiers arranged in sequential stages.

7 . The apparatus of claim 6 , wherein the circuitry is configured to introduce the gas to each power amplifier separately.

8 . The apparatus of claim 6 , wherein the circuitry is configured to introduce the gas to each power amplifier sequentially.

9 . The apparatus of claim 6 , wherein the circuitry is configured to introduce the gas to each power amplifier at substantially the same time.

10 . The apparatus of claim 1 , wherein the power amplifier has a separate dedicated inlet and exhaust.

11 . A method comprising:

supplying a mixing gas to an interior of a power amplifier for a laser, the power amplifier having a catalyst;

reacting the mixing gas with contaminants present on a surface of the catalyst to produce gaseous by-products; and

evacuating the gaseous by-products from the power amplifier.

12 . The method of claim 11 , further comprising providing a filter having a water supply for receiving the gaseous by-products from an exhaust port of the power amplifier, whereby the water supply removes the mixing gas.

13 . The method of claim 11 , wherein the mixing gas is introduced to the power amplifier for at least one hour after every seventh day of operation of the laser.

14 . The method of claim 11 , wherein the surface of the catalyst comprises a layer of gold.

15 . The method of claim 11 , wherein the mixing gas comprises a hydrogen-doped argon gas.

16 . The method of claim 11 , wherein the mixing gas comprises hydrogen (H 2 ), the contaminants comprise silicon dioxide (SiO 2 ) and a reaction of the mixing gas and the contaminants proceeds according to:

17 . A method for processing a power amplifier of a laser, comprising:

supplying a gas into the power amplifier during processing of the power amplifier, the power amplifier having a catalyst;

generating gaseous by-products by reaction of the gas with contamination build-up on a surface of the catalyst; and

removing the gas and the gaseous by-products from the power amplifier after processing the power amplifier.

18 . The method of claim 17 , further comprising compensating for a power loss by boosting a power of the power amplifier to re-establish a full laser power.

19 . The method of claim 17 , wherein the gas comprises a hydrogen-doped argon gas.

20 . The method of claim 19 , wherein the gas comprises X weight percent argon and 100-X weight percent of hydrogen (H 2 ), where X is a number that is greater than one and less than 100.